These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
129 related articles for article (PubMed ID: 10320536)
21. Quantitative agreement between dynamical rocking curves in ultrafast electron diffraction for x-ray lasers. Malin LE; Graves WS; Holl M; Spence JCH; Nanni EA; Li RK; Shen X; Weathersby S Ultramicroscopy; 2021 Apr; 223():113211. PubMed ID: 33582644 [TBL] [Abstract][Full Text] [Related]
22. Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography. Béché A; Rouvière JL; Barnes JP; Cooper D Ultramicroscopy; 2013 Aug; 131():10-23. PubMed ID: 23673283 [TBL] [Abstract][Full Text] [Related]
23. Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy. Hovden R; Liu P; Schnitzer N; Tsen AW; Liu Y; Lu W; Sun Y; Kourkoutis LF Microsc Microanal; 2018 Aug; 24(4):387-395. PubMed ID: 30175707 [TBL] [Abstract][Full Text] [Related]
24. Lattice parameter determination of a composition controlled Si1-x Gex layer on a Si (001) substrate using convergent-beam electron diffraction. Akaogi T; Tsuda K; Terauchi M; Tanaka M J Electron Microsc (Tokyo); 2004; 53(6):593-600. PubMed ID: 15582972 [TBL] [Abstract][Full Text] [Related]
25. New approach for the dynamical simulation of CBED patterns in heavily strained specimens. Houdellier F; Altibelli A; Roucau C; Casanove MJ Ultramicroscopy; 2008 Apr; 108(5):426-32. PubMed ID: 17624670 [TBL] [Abstract][Full Text] [Related]
27. Quantitative and easy estimation of a crystal bending effect using low-order CBED patterns. Yamazaki T; Kashiwagi A; Kuramochi K; Ohtsuka M; Hashimoto I; Watanabe K J Electron Microsc (Tokyo); 2008 Dec; 57(6):181-7. PubMed ID: 18849570 [TBL] [Abstract][Full Text] [Related]
28. Strain distribution in Si capping layers on SiGe islands: influence of cap thickness and footprint in reciprocal space. Hrauda N; Zhang JJ; Süess MJ; Wintersberger E; Holý V; Stangl J; Deiter C; Seeck OH; Bauer G Nanotechnology; 2012 Nov; 23(46):465705. PubMed ID: 23092941 [TBL] [Abstract][Full Text] [Related]
29. X-ray multislice computation using the Moodie-Wagenfeld equations: divergent-beam pattern simulation in three-beam and six-beam Laue cases. Goodman P; Liu L Acta Crystallogr A; 1999 Mar; 55(Pt 2 Pt 1):246-257. PubMed ID: 10927256 [TBL] [Abstract][Full Text] [Related]
30. Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction--the rhombohedral phase of LaCrO3. Tsuda K; Ogata Y; Takagi K; Hashimoto T; Tanaka M Acta Crystallogr A; 2002 Nov; 58(Pt 6):514-25. PubMed ID: 12388869 [TBL] [Abstract][Full Text] [Related]
31. Convergent-beam low energy electron diffraction (CBLEED) and the measurement of surface dipole layers. Spence JC; Poon HC; Saldin DK Microsc Microanal; 2004 Feb; 10(1):128-33. PubMed ID: 15306076 [TBL] [Abstract][Full Text] [Related]
32. Determination of the electrostatic potential and electron density of silicon using convergent-beam electron diffraction. Ogata Y; Tsuda K; Tanaka M Acta Crystallogr A; 2008 Sep; 64(Pt 5):587-97. PubMed ID: 18708722 [TBL] [Abstract][Full Text] [Related]
33. Towards a full retrieval of the deformation tensor F using convergent beam electron diffraction. Martin Y; Rouviere JL; Zuo JM; Favre-Nicolin V Ultramicroscopy; 2016 Jan; 160():64-73. PubMed ID: 26452193 [TBL] [Abstract][Full Text] [Related]
34. Phase retrieval of electron rocking curves using total variation and total squared variation regularizations. Shichi A; Ishizuka H; Saitoh K Microscopy (Oxf); 2024 Jun; 73(3):262-274. PubMed ID: 37793048 [TBL] [Abstract][Full Text] [Related]
35. Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction. Jackson BE; Christensen JJ; Singh S; De Graef M; Fullwood DT; Homer ER; Wagoner RH Microsc Microanal; 2016 Aug; 22(4):789-802. PubMed ID: 27509538 [TBL] [Abstract][Full Text] [Related]
36. Burgers Vector Analysis of Vertical Dislocations in Ge Crystals by Large-Angle Convergent Beam Electron Diffraction. Groiss H; Glaser M; Marzegalli A; Isa F; Isella G; Miglio L; Schäffler F Microsc Microanal; 2015 Jun; 21(3):637-45. PubMed ID: 25939606 [TBL] [Abstract][Full Text] [Related]
38. Charge density determination in icosahedral AlPdMn quasicrystal using quantitative convergent beam electron diffraction. Yu F; Zou H; Wang J; Wang R Micron; 2004; 35(6):411-8. PubMed ID: 15120124 [TBL] [Abstract][Full Text] [Related]
39. CBED and LACBED: characterization of antiphase boundaries. Morniroli JP; Nó ML; Rodríguez PP; San Juan J; Jezierska E; Michel N; Poulat S; Priester L Ultramicroscopy; 2003 Dec; 98(1):9-26. PubMed ID: 14609639 [TBL] [Abstract][Full Text] [Related]
40. Convergent-beam electron diffraction. Tanaka M; Tsuda K J Electron Microsc (Tokyo); 2011; 60 Suppl 1():S245-67. PubMed ID: 21844594 [TBL] [Abstract][Full Text] [Related] [Previous] [Next] [New Search]