These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

167 related articles for article (PubMed ID: 10344771)

  • 1. Preparation for TEM of layered samples with fragile microstructure and weak layer interface.
    Westman AK; Wei LY; Barre F
    Microsc Res Tech; 1999 May; 45(3):198-202. PubMed ID: 10344771
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Improved sample preparation for cross-sectional transmission electron microscopy of layered structures using rocking-angle ion-milling techniques.
    Lee JS; Jeong YW; Kim ST
    Microsc Res Tech; 1996 Apr; 33(6):490-5. PubMed ID: 8800754
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Preparation of cross-sectional TEM samples for low-angle ion milling.
    McCaffrey JP; Barna A
    Microsc Res Tech; 1997 Mar; 36(5):362-7. PubMed ID: 9140935
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites.
    Gasser P; Klotz UE; Khalid FA; Beffort O
    Microsc Microanal; 2004 Apr; 10(2):311-6. PubMed ID: 15306057
    [TBL] [Abstract][Full Text] [Related]  

  • 5. A technique for the preparation of cross-sectional TEM samples of ZnSe/GaAs heterostructures which eliminates process-induced defects.
    Yu JE; Jones KS; Park RM
    J Electron Microsc Tech; 1991 Jul; 18(3):315-24. PubMed ID: 1880604
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Applications of the FIB lift-out technique for TEM specimen preparation.
    Giannuzzi LA; Drown JL; Brown SR; Irwin RB; Stevie FA
    Microsc Res Tech; 1998 May; 41(4):285-90. PubMed ID: 9633946
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling.
    Eberg E; Monsen AF; Tybell T; van Helvoort AT; Holmestad R
    J Electron Microsc (Tokyo); 2008 Dec; 57(6):175-9. PubMed ID: 18815212
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Novel method for the plan-view TEM preparation of thin samples on brittle substrates by mechanical and ion beam thinning.
    Sáfrán G; Grenet T
    Microsc Res Tech; 2002 Feb; 56(4):308-14. PubMed ID: 11877808
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Imaging thin films of nanoporous low-k dielectrics: comparison between ultramicrotomy and focused ion beam preparations for transmission electron microscopy.
    Thompson LE; Rice PM; Delenia E; Lee VY; Brock PJ; Magbitang TP; Dubois G; Volksen W; Miller RD; Kim HC
    Microsc Microanal; 2006 Apr; 12(2):156-9. PubMed ID: 17481352
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Preparation of cross-sectional transmission electron microscopy samples by electron beam lithography and reactive ion etching.
    Wetzel JT
    J Electron Microsc Tech; 1989 Jan; 11(1):62-9. PubMed ID: 2915262
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Preparation of TEM foils from Nb-10 a/o Si.
    Cockeram B; Jackson AG; Omlor RE; Srinivasan R; Weiss I
    Microsc Res Tech; 1992 Aug; 22(3):298-300. PubMed ID: 1504356
    [TBL] [Abstract][Full Text] [Related]  

  • 12. TEM sample preparation by FIB for carbon nanotube interconnects.
    Ke X; Bals S; Romo Negreira A; Hantschel T; Bender H; Van Tendeloo G
    Ultramicroscopy; 2009 Oct; 109(11):1353-9. PubMed ID: 19665846
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Large-area plan-view sample preparation for GaAs-based systems grown by molecular beam epitaxy.
    Howard DJ; Paine DC; Sacks RN
    J Electron Microsc Tech; 1991 Jun; 18(2):117-20. PubMed ID: 1885995
    [TBL] [Abstract][Full Text] [Related]  

  • 14. High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification.
    Yao B; Sun T; Warren A; Heinrich H; Barmak K; Coffey KR
    Micron; 2010 Apr; 41(3):177-82. PubMed ID: 20018512
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Selected area polishing for precision TEM sample preparation.
    Liu JB; Tracy BM; Gronsky R
    Microsc Res Tech; 1993 Oct; 26(2):162-6. PubMed ID: 8241552
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Microstructural studies of 35 degrees C copper Ni-Ti orthodontic wire and TEM confirmation of low-temperature martensite transformation.
    Brantley WA; Guo W; Clark WA; Iijima M
    Dent Mater; 2008 Feb; 24(2):204-10. PubMed ID: 17561249
    [TBL] [Abstract][Full Text] [Related]  

  • 17. The correlation between ion beam/material interactions and practical FIB specimen preparation.
    Prenitzer BI; Urbanik-Shannon CA; Giannuzzi LA; Brown SR; Irwin RB; Shofner TL; Stevie FA
    Microsc Microanal; 2003 Jun; 9(3):216-36. PubMed ID: 12807673
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Comparison of different sample preparation techniques in TEM observation of microstructure of INCONEL alloy 783 subjected to prolonged isothermal exposure.
    Ma L
    Micron; 2004; 35(4):273-9. PubMed ID: 15003614
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Preparation of cross-sectional specimens of ceramic thermal barrier coatings for transmission electron microscopy.
    Unal O; Heuer AH; Mitchell TE
    J Electron Microsc Tech; 1990 Apr; 14(4):307-12. PubMed ID: 2332805
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Technique for preparation and characterization in cross-section of oral titanium implant surfaces using focused ion beam and transmission electron microscopy.
    Jarmar T; Palmquist A; Brånemark R; Hermansson L; Engqvist H; Thomsen P
    J Biomed Mater Res A; 2008 Dec; 87(4):1003-9. PubMed ID: 18257067
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.