136 related articles for article (PubMed ID: 10741649)
1. Microfabrication of a combined AFM-SNOM sensor.
Schurmann G; Noell W; Staufer U; de Rooij NF
Ultramicroscopy; 2000 Feb; 82(1-4):33-8. PubMed ID: 10741649
[TBL] [Abstract][Full Text] [Related]
2. Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever.
Muramatsu H; Egawa A; Homma K; Kim JM; Takahashi H; Shirakawabe Y; Shimizu N
J Microsc; 2001 Apr; 202(Pt 1):154-61. PubMed ID: 11298886
[TBL] [Abstract][Full Text] [Related]
3. Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy.
Schürmann G; Noell W; Staufer U; de Rooij NF; Eckert R; Freyland JM; Heinzelmann H
Appl Opt; 2001 Oct; 40(28):5040-5. PubMed ID: 18364783
[TBL] [Abstract][Full Text] [Related]
4. High-speed near-field fluorescence microscopy combined with high-speed atomic force microscopy for biological studies.
Umakoshi T; Fukuda S; Iino R; Uchihashi T; Ando T
Biochim Biophys Acta Gen Subj; 2020 Feb; 1864(2):129325. PubMed ID: 30890438
[TBL] [Abstract][Full Text] [Related]
5. Focussed ion beam machined cantilever aperture probes for near-field optical imaging.
Jin EX; Xu X
J Microsc; 2008 Mar; 229(Pt 3):503-11. PubMed ID: 18331502
[TBL] [Abstract][Full Text] [Related]
6. Fluorescence imaging and spectroscopy of biomaterials in air and liquid by scanning near-field optical/atomic force microscopy.
Muramatsu H; Chiba N; Nakajima K; Ataka T; Fujihira M; Hitomi J; Ushiki T
Scanning Microsc; 1996; 10(4):975-82. PubMed ID: 9854850
[TBL] [Abstract][Full Text] [Related]
7. High-resolution constant-height imaging with apertured silicon cantilever probes.
Dziomba T; Danzebrink HU; Lehrer C; Frey L; Sulzbach T; Ohlsson O
J Microsc; 2001 Apr; 202(Pt 1):22-7. PubMed ID: 11298864
[TBL] [Abstract][Full Text] [Related]
8. Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition.
Kinoshita Y; Naitoh Y; Li YJ; Sugawara Y
Rev Sci Instrum; 2011 Nov; 82(11):113707. PubMed ID: 22128984
[TBL] [Abstract][Full Text] [Related]
9. Resolution enhancing using cantilevered tip-on-aperture silicon probe in scanning near-field optical microscopy.
Chang WS; Bauerdick S; Jeong MS
Ultramicroscopy; 2008 Sep; 108(10):1070-5. PubMed ID: 18579310
[TBL] [Abstract][Full Text] [Related]
10. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.
Naitoh Y; Kinoshita Y; Jun Li Y; Kageshima M; Sugawara Y
Nanotechnology; 2009 Jul; 20(26):264011. PubMed ID: 19509444
[TBL] [Abstract][Full Text] [Related]
11. Novel technology for controlled fabrication of aperture cantilever sensors for scanning near-field optical microscopy.
Kolomiytsev AS; Kotosonova AV; Il'in OI; Saenko AV; Shelaev AV; Baryshev AV
Micron; 2024 Apr; 179():103610. PubMed ID: 38367292
[TBL] [Abstract][Full Text] [Related]
12. Optical microcantilever consisting of channel waveguide for scanning near-field optical microscopy controlled by atomic force.
Niwa T; Mitsuoka Y; Kato K; Ichihara S; Chiba N; Shin-Ogi M; Nakajima K; Muramatsu H; Sakuhara T
J Microsc; 1999; 194(Pt 2-3):388-92. PubMed ID: 11388273
[TBL] [Abstract][Full Text] [Related]
13. Optical imaging beyond the diffraction limit by SNEM: effects of AFM tip modifications with thiol monolayers on imaging quality.
Cumurcu A; Diaz J; Lindsay ID; de Beer S; Duvigneau J; Schön P; Julius Vancso G
Ultramicroscopy; 2015 Mar; 150():79-87. PubMed ID: 25544678
[TBL] [Abstract][Full Text] [Related]
14. Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis.
van Hoorn CH; Chavan DC; Tiribilli B; Margheri G; Mank AJ; Ariese F; Iannuzzi D
Opt Lett; 2014 Aug; 39(16):4800-3. PubMed ID: 25121878
[TBL] [Abstract][Full Text] [Related]
15. Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.
Sweetman A; Jarvis S; Danza R; Moriarty P
Beilstein J Nanotechnol; 2012; 3():25-32. PubMed ID: 22428093
[TBL] [Abstract][Full Text] [Related]
16. Microfabricated silicon dioxide cantilever with subwavelength aperture.
Mitsuoka Y; Niwa T; Ichihara S; Kato K; Muramatsu H; Nakajima K; Shikida M; Sato K
J Microsc; 2001 Apr; 202(Pt 1):12-5. PubMed ID: 11298862
[TBL] [Abstract][Full Text] [Related]
17. Reciprocity theory of apertureless scanning near-field optical microscopy with point-dipole probes.
Esslinger M; Vogelgesang R
ACS Nano; 2012 Sep; 6(9):8173-82. PubMed ID: 22897563
[TBL] [Abstract][Full Text] [Related]
18. Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrology.
Khajavi S; Shaterzadeh-Yazdi Z; Eghrari A; Neshat M
Ultramicroscopy; 2024 Jan; 255():113863. PubMed ID: 37837794
[TBL] [Abstract][Full Text] [Related]
19. The qPlus sensor, a powerful core for the atomic force microscope.
Giessibl FJ
Rev Sci Instrum; 2019 Jan; 90(1):011101. PubMed ID: 30709191
[TBL] [Abstract][Full Text] [Related]
20. Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode.
Wang H; Wang L; Jakob DS; Xu XG
Nat Commun; 2018 May; 9(1):2005. PubMed ID: 29784951
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
