These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

172 related articles for article (PubMed ID: 11246400)

  • 1. Advances in Atom Probe Specimen Fabrication from Planar Multilayer Thin Film Structures.
    Larson DJ; Wissman BD; Martens RL; Viellieux RJ; Kelly TF; Gribb TT; Erskine HF; Tabat N
    Microsc Microanal; 2001 Jan; 7(1):24-31. PubMed ID: 11246400
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Some aspects of atom probe specimen preparation and analysis of thin film materials.
    Thompson GB; Miller MK; Fraser HL
    Ultramicroscopy; 2004 Jul; 100(1-2):25-34. PubMed ID: 15219690
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders.
    Choi PP; Al-Kassab T; Kwon YS; Kim JS; Kirchheim R
    Microsc Microanal; 2007 Oct; 13(5):347-53. PubMed ID: 17900385
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Dynamic sequential layer-by-layer deposition method for fast and region-selective multilayer thin film fabrication.
    Kim HJ; Lee K; Kumar S; Kim J
    Langmuir; 2005 Aug; 21(18):8532-8. PubMed ID: 16114968
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Three-dimensional atom probe tomography of oxide, anion, and alkanethiolate coatings on gold.
    Zhang Y; Hillier AC
    Anal Chem; 2010 Jul; 82(14):6139-47. PubMed ID: 20575560
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling.
    Eberg E; Monsen AF; Tybell T; van Helvoort AT; Holmestad R
    J Electron Microsc (Tokyo); 2008 Dec; 57(6):175-9. PubMed ID: 18815212
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Laser assisted atom probe analysis of thin film on insulating substrate.
    Kodzuka M; Ohkubo T; Hono K
    Ultramicroscopy; 2011 May; 111(6):557-61. PubMed ID: 21172729
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Atom probe specimen preparation with a dual beam SEM/FIB miller.
    Miller MK; Russell KF
    Ultramicroscopy; 2007 Sep; 107(9):761-6. PubMed ID: 17403581
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Three-dimensional atom probe analysis of heavily drawn steel wires by probing perpendicular to the pearlitic lamellae.
    Takahashi J; Tarui T; Kawakami K
    Ultramicroscopy; 2009 Jan; 109(2):193-9. PubMed ID: 19070959
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary.
    Pérez-Willard F; Wolde-Giorgis D; Al-Kassab T; López GA; Mittemeijer EJ; Kirchheim R; Gerthsen D
    Micron; 2008; 39(1):45-52. PubMed ID: 17331735
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique.
    Choi PP; Kwon YS; Kim JS; Al-Kassab T
    J Electron Microsc (Tokyo); 2007 Apr; 56(2):43-9. PubMed ID: 17928320
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Fabrication of complex metallic nanostructures by nanoskiving.
    Xu Q; Rioux RM; Whitesides GM
    ACS Nano; 2007 Oct; 1(3):215-27. PubMed ID: 19206652
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Development of atom probe specimen preparation techniques for specific regions in steel materials.
    Takahashi J; Kawakami K; Yamaguchi Y; Sugiyama M
    Ultramicroscopy; 2007 Sep; 107(9):744-9. PubMed ID: 17391850
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Cross-sectional transmission electron microscopy of X-ray multilayer thin film structures.
    Nguyen TD; Gronsky R; Kortright JB
    J Electron Microsc Tech; 1991 Dec; 19(4):473-85. PubMed ID: 1797992
    [TBL] [Abstract][Full Text] [Related]  

  • 15. The advanced ion-milling method for preparation of thin film using ion slicer: application to a sample recovered from diamond-anvil cell.
    Tateno S; Sinmyo R; Hirose K; Nishioka H
    Rev Sci Instrum; 2009 Jan; 80(1):013901. PubMed ID: 19191441
    [TBL] [Abstract][Full Text] [Related]  

  • 16. A high-throughput approach for cross-sectional transmission electron microscopy sample preparation of thin films.
    Yao B; Coffey KR
    J Electron Microsc (Tokyo); 2008 Dec; 57(6):189-94. PubMed ID: 18984643
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Invited review article: Atom probe tomography.
    Kelly TF; Miller MK
    Rev Sci Instrum; 2007 Mar; 78(3):031101. PubMed ID: 17411171
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Multilayer nanostructured porphyrin arrays constructed by layer-by-layer self-assembly.
    Smith AR; Ruggles JL; Yu A; Gentle IR
    Langmuir; 2009 Sep; 25(17):9873-8. PubMed ID: 19572527
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Layer-by-layer deposition of polyelectrolyte-polyelectrolyte complexes for multilayer film fabrication.
    Guo Y; Geng W; Sun J
    Langmuir; 2009 Jan; 25(2):1004-10. PubMed ID: 19105738
    [TBL] [Abstract][Full Text] [Related]  

  • 20. In situ site-specific specimen preparation for atom probe tomography.
    Thompson K; Lawrence D; Larson DJ; Olson JD; Kelly TF; Gorman B
    Ultramicroscopy; 2007; 107(2-3):131-9. PubMed ID: 16938398
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 9.