189 related articles for article (PubMed ID: 11298864)
1. High-resolution constant-height imaging with apertured silicon cantilever probes.
Dziomba T; Danzebrink HU; Lehrer C; Frey L; Sulzbach T; Ohlsson O
J Microsc; 2001 Apr; 202(Pt 1):22-7. PubMed ID: 11298864
[TBL] [Abstract][Full Text] [Related]
2. Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy.
Schürmann G; Noell W; Staufer U; de Rooij NF; Eckert R; Freyland JM; Heinzelmann H
Appl Opt; 2001 Oct; 40(28):5040-5. PubMed ID: 18364783
[TBL] [Abstract][Full Text] [Related]
3. Focussed ion beam machined cantilever aperture probes for near-field optical imaging.
Jin EX; Xu X
J Microsc; 2008 Mar; 229(Pt 3):503-11. PubMed ID: 18331502
[TBL] [Abstract][Full Text] [Related]
4. Nano-slit probes for near-field optical microscopy fabricated by focused ion beams.
Danzebrink HU; Dziomba T; Sulzbach T; Ohlsson O; Lehrer C; Frey L
J Microsc; 1999; 194(Pt 2-3):335-9. PubMed ID: 11388262
[TBL] [Abstract][Full Text] [Related]
5. High-speed near-field fluorescence microscopy combined with high-speed atomic force microscopy for biological studies.
Umakoshi T; Fukuda S; Iino R; Uchihashi T; Ando T
Biochim Biophys Acta Gen Subj; 2020 Feb; 1864(2):129325. PubMed ID: 30890438
[TBL] [Abstract][Full Text] [Related]
6. Microfabricated silicon dioxide cantilever with subwavelength aperture.
Mitsuoka Y; Niwa T; Ichihara S; Kato K; Muramatsu H; Nakajima K; Shikida M; Sato K
J Microsc; 2001 Apr; 202(Pt 1):12-5. PubMed ID: 11298862
[TBL] [Abstract][Full Text] [Related]
7. High resolution capabilities of all-silica cantilevered probes for near-field optical microscopy.
Descrovi E; Aeschimann L; Soboleva I; De Angelis F; Giorgis F; Di Fabrizio E
J Nanosci Nanotechnol; 2009 Nov; 9(11):6460-4. PubMed ID: 19908549
[TBL] [Abstract][Full Text] [Related]
8. Fabrication of near-field optical apertures in aluminium by a highly selective corrosion process in the evanescent field.
Haefliger D; Stemmer A
J Microsc; 2003 Mar; 209(Pt 3):150-4. PubMed ID: 12641753
[TBL] [Abstract][Full Text] [Related]
9. Novel technology for controlled fabrication of aperture cantilever sensors for scanning near-field optical microscopy.
Kolomiytsev AS; Kotosonova AV; Il'in OI; Saenko AV; Shelaev AV; Baryshev AV
Micron; 2024 Apr; 179():103610. PubMed ID: 38367292
[TBL] [Abstract][Full Text] [Related]
10. Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration.
Slattery AD; Blanch AJ; Quinton JS; Gibson CT
Ultramicroscopy; 2013 Aug; 131():46-55. PubMed ID: 23685172
[TBL] [Abstract][Full Text] [Related]
11. Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever.
Muramatsu H; Egawa A; Homma K; Kim JM; Takahashi H; Shirakawabe Y; Shimizu N
J Microsc; 2001 Apr; 202(Pt 1):154-61. PubMed ID: 11298886
[TBL] [Abstract][Full Text] [Related]
12. Resolution enhancing using cantilevered tip-on-aperture silicon probe in scanning near-field optical microscopy.
Chang WS; Bauerdick S; Jeong MS
Ultramicroscopy; 2008 Sep; 108(10):1070-5. PubMed ID: 18579310
[TBL] [Abstract][Full Text] [Related]
13. A platform for time-resolved scanning Kerr microscopy in the near-field.
Keatley PS; Loughran THJ; Hendry E; Barnes WL; Hicken RJ; Childress JR; Katine JA
Rev Sci Instrum; 2017 Dec; 88(12):123708. PubMed ID: 29289235
[TBL] [Abstract][Full Text] [Related]
14. Near-zero contact force atomic force microscopy investigations using active electromagnetic cantilevers.
Świadkowski B; Majstrzyk W; Kunicki P; Sierakowski A; Gotszalk T
Nanotechnology; 2020 Jul; 31(42):. PubMed ID: 32599567
[TBL] [Abstract][Full Text] [Related]
15. Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers.
Slattery AD; Blanch AJ; Quinton JS; Gibson CT
Nanotechnology; 2013 Jan; 24(1):015710. PubMed ID: 23220746
[TBL] [Abstract][Full Text] [Related]
16. Microfabrication of a combined AFM-SNOM sensor.
Schurmann G; Noell W; Staufer U; de Rooij NF
Ultramicroscopy; 2000 Feb; 82(1-4):33-8. PubMed ID: 10741649
[TBL] [Abstract][Full Text] [Related]
17. Atomic force microscope cantilever calibration using a focused ion beam.
Slattery AD; Quinton JS; Gibson CT
Nanotechnology; 2012 Jul; 23(28):285704. PubMed ID: 22728463
[TBL] [Abstract][Full Text] [Related]
18. Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode.
Biczysko P; Dzierka A; Jóźwiak G; Rudek M; Gotszalk T; Janus P; Grabiec P; Rangelow IW
Ultramicroscopy; 2018 Jan; 184(Pt A):199-208. PubMed ID: 28950210
[TBL] [Abstract][Full Text] [Related]
19. A nanoplasmonic probe for near-field imaging.
Backs JA; Sederberg S; Elezzabi AY
Opt Express; 2011 Jun; 19(12):11280-9. PubMed ID: 21716358
[TBL] [Abstract][Full Text] [Related]
20. Apertureless scanning near-field optical microscopy of sparsely labeled tobacco mosaic viruses and the intermediate filament desmin.
Harder A; Dieding M; Walhorn V; Degenhard S; Brodehl A; Wege C; Milting H; Anselmetti D
Beilstein J Nanotechnol; 2013; 4():510-6. PubMed ID: 24062977
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
