These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

121 related articles for article (PubMed ID: 1236023)

  • 1. A specimen preparation technique for transmission electron microscopy of surface layers.
    Hogmark S; Swahn H; Vingsbo O
    Ultramicroscopy; 1975 Dec; 1(2):113-20. PubMed ID: 1236023
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Applications of the FIB lift-out technique for TEM specimen preparation.
    Giannuzzi LA; Drown JL; Brown SR; Irwin RB; Stevie FA
    Microsc Res Tech; 1998 May; 41(4):285-90. PubMed ID: 9633946
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Preparation of TEM samples of ferritic alloys.
    Yao Z; Xu S; Jenkins ML; Kirk MA
    J Electron Microsc (Tokyo); 2008 Jun; 57(3):91-4. PubMed ID: 18316797
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Preparation of cross-section specimens for transmission electron microscopy from alpha-Al2O3/Ni solid state bonded bicrystal interfaces.
    Wan C; Dupeux M
    Microsc Res Tech; 1992 Nov; 23(3):248-51. PubMed ID: 1472753
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Artifacts introduced by ion milling in Al-Li-Cu alloys.
    Singh AK; Imam MA; Sadananda K
    J Electron Microsc Tech; 1988 Apr; 8(4):355-61. PubMed ID: 3199219
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Preparation of cross-sectional specimens of ceramic thermal barrier coatings for transmission electron microscopy.
    Unal O; Heuer AH; Mitchell TE
    J Electron Microsc Tech; 1990 Apr; 14(4):307-12. PubMed ID: 2332805
    [TBL] [Abstract][Full Text] [Related]  

  • 7. In situ lift-out dedicated techniques using FIB-SEM system for TEM specimen preparation.
    Tomus D; Ng HP
    Micron; 2013 Jan; 44():115-9. PubMed ID: 22664233
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Thin foil preparation of metal particles in brittle ceramic matrices.
    Yang CW; Williams DB; Goldstein JI
    Microsc Res Tech; 1996 Nov; 35(4):334-9. PubMed ID: 8987027
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Preparation of TEM foils from Nb-10 a/o Si.
    Cockeram B; Jackson AG; Omlor RE; Srinivasan R; Weiss I
    Microsc Res Tech; 1992 Aug; 22(3):298-300. PubMed ID: 1504356
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Preparation of micro-foils for TEM/STEM analysis from metallic powders.
    Dawson K; Tatlock GJ
    Micron; 2015 Jul; 74():54-8. PubMed ID: 25967375
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Specimen preparation of free-standing, thick-metal, multilayered films in cross section.
    Wall MA
    Microsc Res Tech; 1994 Feb; 27(3):262-7. PubMed ID: 8204914
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Cross-sectional transmission electron microscopy of X-ray multilayer thin film structures.
    Nguyen TD; Gronsky R; Kortright JB
    J Electron Microsc Tech; 1991 Dec; 19(4):473-85. PubMed ID: 1797992
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Electron microscope specimen preparation of rat liver chromatin by a modified Miller spreading technique.
    Labhart P; Koller T
    Eur J Cell Biol; 1981 Jun; 24(2):309-16. PubMed ID: 7285947
    [TBL] [Abstract][Full Text] [Related]  

  • 14. FIB and TEM observations of defects in hot-dip zinc coatings.
    Hong MH; Saka H
    J Electron Microsc (Tokyo); 2004; 53(5):545-52. PubMed ID: 15582963
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Preparation of (InGa)As/GaAs multilayered materials for TEM by one side non-rotation ion beam thinning.
    Yao JY; Dunlop GL
    J Electron Microsc Tech; 1991 Sep; 19(1):90-8. PubMed ID: 1960573
    [TBL] [Abstract][Full Text] [Related]  

  • 16. The application of scanning transmission electron microscopy (STEM) to the study of thin anodic films on nickel and nickel-molybdenum alloys.
    Moriya M; Ives MB
    J Microsc; 1984 Feb; 133(Pt 2):155-70. PubMed ID: 6708098
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Location specific in situ TEM straining specimens made using FIB.
    Field RD; Papin PA
    Ultramicroscopy; 2004 Dec; 102(1):23-6. PubMed ID: 15556697
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Evaluation of top, angle, and side cleaned FIB samples for TEM analysis.
    Montoya E; Bals S; Rossell MD; Schryvers D; Van Tendeloo G
    Microsc Res Tech; 2007 Dec; 70(12):1060-71. PubMed ID: 17722055
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics.
    Zinkle SJ; Haltom CP; Jenkins LC; DuBose CK
    J Electron Microsc Tech; 1991 Dec; 19(4):452-60. PubMed ID: 1797990
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling.
    Sasaki H; Matsuda T; Kato T; Muroga T; Iijima Y; Saitoh T; Iwase F; Yamada Y; Izumi T; Shiohara Y; Hirayama T
    J Electron Microsc (Tokyo); 2004; 53(5):497-500. PubMed ID: 15582954
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.