These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

160 related articles for article (PubMed ID: 12857147)

  • 1. Seeing the atomic orbital: first-principles study of the effect of tip termination on atomic force microscopy.
    Huang M; Cuma M; Liu F
    Phys Rev Lett; 2003 Jun; 90(25 Pt 1):256101. PubMed ID: 12857147
    [TBL] [Abstract][Full Text] [Related]  

  • 2. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study.
    Campbellová A; Ondráček M; Pou P; Pérez R; Klapetek P; Jelínek P
    Nanotechnology; 2011 Jul; 22(29):295710. PubMed ID: 21685559
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Structure and stability of semiconductor tip apexes for atomic force microscopy.
    Pou P; Ghasemi SA; Jelinek P; Lenosky T; Goedecker S; Perez R
    Nanotechnology; 2009 Jul; 20(26):264015. PubMed ID: 19509446
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Force-Driven Single-Atom Manipulation on a Low-Reactive Si Surface for Tip Sharpening.
    Berger J; Spadafora EJ; Mutombo P; Jelínek P; Švec M
    Small; 2015 Aug; 11(30):3686-93. PubMed ID: 25940994
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Prospects for resolving chemical structure by atomic force microscopy: a first-principles study.
    Guo CS; Van Hove MA; Zhang RQ; Minot C
    Langmuir; 2010 Nov; 26(21):16271-7. PubMed ID: 20973578
    [TBL] [Abstract][Full Text] [Related]  

  • 6. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface.
    Naitoh Y; Kinoshita Y; Jun Li Y; Kageshima M; Sugawara Y
    Nanotechnology; 2009 Jul; 20(26):264011. PubMed ID: 19509444
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Atomic-scale sharpening of silicon tips in noncontact atomic force microscopy.
    Caciuc V; Hölscher H; Blügel S; Fuchs H
    Phys Rev Lett; 2006 Jan; 96(1):016101. PubMed ID: 16486478
    [TBL] [Abstract][Full Text] [Related]  

  • 8. First principles studies of an Si tip on an Si(100)2 × 1 reconstructed surface.
    Ly DQ; Paramonov L; Makatsoris C
    J Phys Condens Matter; 2009 May; 21(18):185006. PubMed ID: 21825452
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Atomic White-Out: Enabling Atomic Circuitry through Mechanically Induced Bonding of Single Hydrogen Atoms to a Silicon Surface.
    Huff TR; Labidi H; Rashidi M; Koleini M; Achal R; Salomons MH; Wolkow RA
    ACS Nano; 2017 Sep; 11(9):8636-8642. PubMed ID: 28719182
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Role of tip chemical reactivity on atom manipulation process in dynamic force microscopy.
    Sugimoto Y; Yurtsever A; Abe M; Morita S; Ondráček M; Pou P; Pérez R; Jelínek P
    ACS Nano; 2013 Aug; 7(8):7370-6. PubMed ID: 23906095
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.
    Giessibl FJ; Hembacher S; Bielefeldt H; Mannhart J
    Science; 2000 Jul; 289(5478):422-426. PubMed ID: 10903196
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope.
    Morita S; Sugimoto Y; Oyabu N; Nishi R; Custance O; Sugawara Y; Abe M
    J Electron Microsc (Tokyo); 2004; 53(2):163-8. PubMed ID: 15180212
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.
    Sweetman A; Jarvis S; Danza R; Moriarty P
    Beilstein J Nanotechnol; 2012; 3():25-32. PubMed ID: 22428093
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Role of tip apices in scanning force spectroscopy on alkali halides at room temperature-chemical nature of the tip apex and atomic-scale deformations.
    Wagner P; Foster A; Yi I; Abe M; Sugimoto Y; Hoffmann-Vogel R
    Nanotechnology; 2021 Jan; 32(3):035706. PubMed ID: 33052141
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Interaction of silicon dangling bonds with insulating surfaces.
    Foster AS; Gal AY; Gale JD; Lee YJ; Nieminen RM; Shluger AL
    Phys Rev Lett; 2004 Jan; 92(3):036101. PubMed ID: 14753889
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Tip-induced reduction of the resonant tunneling current on semiconductor surfaces.
    Jelínek P; Svec M; Pou P; Perez R; Cháb V
    Phys Rev Lett; 2008 Oct; 101(17):176101. PubMed ID: 18999766
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Complex patterning by vertical interchange atom manipulation using atomic force microscopy.
    Sugimoto Y; Pou P; Custance O; Jelinek P; Abe M; Perez R; Morita S
    Science; 2008 Oct; 322(5900):413-7. PubMed ID: 18927388
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Reversal of atomic contrast in scanning probe microscopy on (111) metal surfaces.
    Ondráček M; González C; Jelínek P
    J Phys Condens Matter; 2012 Feb; 24(8):084003. PubMed ID: 22310019
    [TBL] [Abstract][Full Text] [Related]  

  • 19. The chemical structure of a molecule resolved by atomic force microscopy.
    Gross L; Mohn F; Moll N; Liljeroth P; Meyer G
    Science; 2009 Aug; 325(5944):1110-4. PubMed ID: 19713523
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Chemical Identification of the Foremost Tip Atom in Atomic Force Microscopy.
    Onoda J; Miyazaki H; Sugimoto Y
    Nano Lett; 2020 Mar; 20(3):2000-2004. PubMed ID: 32031816
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.