These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

174 related articles for article (PubMed ID: 12868847)

  • 41. [Development of soft X-ray multilayer mirror at 23.4 nm].
    Liu Z; Li X; Ma YY; Chen B; Cao JL
    Guang Pu Xue Yu Guang Pu Fen Xi; 2011 Apr; 31(4):1138-41. PubMed ID: 21714278
    [TBL] [Abstract][Full Text] [Related]  

  • 42. Fabrication of Mo/Al multilayer films for a wavelength of 18.5 nm.
    Nii H; Niibe M; Kinoshita H; Sugie Y
    J Synchrotron Radiat; 1998 May; 5(Pt 3):702-4. PubMed ID: 15263625
    [TBL] [Abstract][Full Text] [Related]  

  • 43. Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry.
    Koch P; Cole GD; Deutsch C; Follman D; Heu P; Kinley-Hanlon M; Kirchhoff R; Leavey S; Lehmann J; Oppermann P; Rai AK; Tornasi Z; Wöhler J; Wu DS; Zederbauer T; Lück H
    Opt Express; 2019 Dec; 27(25):36731-36740. PubMed ID: 31873446
    [TBL] [Abstract][Full Text] [Related]  

  • 44. Peak reflectivity measurements of W/C, Mo/Si, and Mo/B(4)C multilayer mirrors in the 8-190-A range using both Kalpha line and synchrotron radiation.
    Zwicker AP; Regan SP; Finkenthal M; Moos HW; Saloman EB; Watts R; Roberts JR
    Appl Opt; 1990 Sep; 29(25):3694-8. PubMed ID: 20567470
    [TBL] [Abstract][Full Text] [Related]  

  • 45. Damage threshold measurements on EUV optics using focused radiation from a table-top laser produced plasma source.
    Barkusky F; Bayer A; Döring S; Grossmann P; Mann K
    Opt Express; 2010 Mar; 18(5):4346-55. PubMed ID: 20389446
    [TBL] [Abstract][Full Text] [Related]  

  • 46. Wolter type I x-ray focusing mirror using multilayer coatings.
    Chon KS; Namba Y; Yoon KH
    Appl Opt; 2006 Jul; 45(19):4609-16. PubMed ID: 16799673
    [TBL] [Abstract][Full Text] [Related]  

  • 47. Structure and extreme ultraviolet performance of Si/C multilayers deposited under different working pressures.
    Yi Q; Huang Q; Wang X; Yang Y; Yang X; Zhang Z; Wang Z; Xu R; Peng T; Zhou H; Huo T
    Appl Opt; 2017 Feb; 56(4):C145-C150. PubMed ID: 28158061
    [TBL] [Abstract][Full Text] [Related]  

  • 48. EUV reflectance and scattering of Mo/Si multilayers on differently polished substrates.
    Schröder S; Feigl T; Duparré A; Tünnermann A
    Opt Express; 2007 Oct; 15(21):13997-4012. PubMed ID: 19550673
    [TBL] [Abstract][Full Text] [Related]  

  • 49. Reflection mask defect repair.
    Hawryluk AM; Stewart D
    Appl Opt; 1993 Dec; 32(34):7012-5. PubMed ID: 20856560
    [TBL] [Abstract][Full Text] [Related]  

  • 50. Nearly amorphous Mo-N gratings for ultimate resolution in extreme ultraviolet interference lithography.
    Wang L; Kirk E; Wäckerlin C; Schneider CW; Hojeij M; Gobrecht J; Ekinci Y
    Nanotechnology; 2014 Jun; 25(23):235305. PubMed ID: 24850475
    [TBL] [Abstract][Full Text] [Related]  

  • 51. Subwavelength single layer absorption resonance antireflection coatings.
    Huber SP; van de Kruijs RW; Yakshin AE; Zoethout E; Boller KJ; Bijkerk F
    Opt Express; 2014 Jan; 22(1):490-7. PubMed ID: 24515009
    [TBL] [Abstract][Full Text] [Related]  

  • 52. Soft X-ray multilayer beam splitters.
    Haga T; Tinone MC; Shimada M; Ohkubo T; Ozawa A
    J Synchrotron Radiat; 1998 May; 5(Pt 3):690-2. PubMed ID: 15263621
    [TBL] [Abstract][Full Text] [Related]  

  • 53. Carbon buffer layers for smoothing superpolished glass surfaces as substrates for molybdenum /silicon multilayer soft-x-ray mirrors.
    Stock HJ; Hamelmann F; Kleineberg U; Menke D; Schmiedeskamp B; Osterried K; Heidemann KF; Heinzmann U
    Appl Opt; 1997 Mar; 36(7):1650-4. PubMed ID: 18250849
    [TBL] [Abstract][Full Text] [Related]  

  • 54. Non-contact XUV metrology of Ru/B
    Ruiz-Lopez M; Dacasa H; Mahieu B; Lozano M; Li L; Zeitoun P; Bleiner D
    Appl Opt; 2018 Feb; 57(6):1315-1320. PubMed ID: 29469828
    [TBL] [Abstract][Full Text] [Related]  

  • 55. Broadband multilayer-coated normal incidence blazed grating with approximately 10% diffraction efficiency through the 13-16 nm wavelength region.
    Zhang L; Lin H; Jin C; Zhou H; Huo T
    Opt Lett; 2009 Mar; 34(6):818-20. PubMed ID: 19282943
    [TBL] [Abstract][Full Text] [Related]  

  • 56. Nonlinear continuum growth model of multiscale reliefs as applied to rigorous analysis of multilayer short-wave scattering intensity. I. Gratings.
    Goray L; Lubov M
    J Appl Crystallogr; 2013 Aug; 46(Pt 4):926-932. PubMed ID: 24046500
    [TBL] [Abstract][Full Text] [Related]  

  • 57. Low-stress and high-reflectance Mo/Si multilayers for extreme ultraviolet lithography by magnetron sputtering deposition with bias assistance.
    Yu B; Jin C; Yao S; Li C; Liu Y; Zhou F; Guo B; Wang H; Xie Y; Wang L
    Appl Opt; 2017 Sep; 56(26):7462-7468. PubMed ID: 29048070
    [TBL] [Abstract][Full Text] [Related]  

  • 58. Mo/Si multilayer-coated ruled blazed gratings for the soft-x-ray region.
    Kleineberg U; Osterried K; Stock HJ; Menke D; Schmiedeskamp B; Fuchs D; Müller P; Scholze F; Heidemann KF; Nelles B; Heinzmann U
    Appl Opt; 1995 Oct; 34(28):6506-12. PubMed ID: 21060502
    [TBL] [Abstract][Full Text] [Related]  

  • 59. Coatings for FEL optics: preparation and characterization of B
    Störmer M; Siewert F; Horstmann C; Buchheim J; Gwalt G
    J Synchrotron Radiat; 2018 Jan; 25(Pt 1):116-122. PubMed ID: 29271760
    [TBL] [Abstract][Full Text] [Related]  

  • 60. Capping layers for extreme-ultraviolet multilayer interference coatings.
    Singh M; Braat JJ
    Opt Lett; 2001 Mar; 26(5):259-61. PubMed ID: 18040294
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 9.