248 related articles for article (PubMed ID: 12871794)
1. Artifacts in aberration-corrected ADF-STEM imaging.
Yu Z; Batson PE; Silcox J
Ultramicroscopy; 2003 Sep; 96(3-4):275-84. PubMed ID: 12871794
[TBL] [Abstract][Full Text] [Related]
2. Effects of tilt on high-resolution ADF-STEM imaging.
Maccagnano-Zacher SE; Mkhoyan KA; Kirkland EJ; Silcox J
Ultramicroscopy; 2008 Jul; 108(8):718-26. PubMed ID: 18160220
[TBL] [Abstract][Full Text] [Related]
3. Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun.
Kim S; Oshima Y; Sawada H; Kaneyama T; Kondo Y; Takeguchi M; Nakayama Y; Tanishiro Y; Takayanagi K
J Electron Microsc (Tokyo); 2011; 60(2):109-16. PubMed ID: 21247969
[TBL] [Abstract][Full Text] [Related]
4. Effects of small specimen tilt and probe convergence angle on ADF-STEM image contrast of Si(0.8)Ge(0.2) epitaxial strained layers on (100) Si.
Wu X; Robertson MD; Kawasaki M; Baribeau JM
Ultramicroscopy; 2012 Mar; 114():46-55. PubMed ID: 22356788
[TBL] [Abstract][Full Text] [Related]
5. Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces.
Yu Z; Muller DA; Silcox J
Ultramicroscopy; 2008 Apr; 108(5):494-501. PubMed ID: 17920197
[TBL] [Abstract][Full Text] [Related]
6. First observation of In(x)Ga(1-x)As quantum dots in GaP by spherical-aberration-corrected HRTEM in comparison with ADF-STEM and conventional HRTEM.
Tanaka N; Yamasaki J; Fuchi S; Takeda Y
Microsc Microanal; 2004 Feb; 10(1):139-45. PubMed ID: 15306078
[TBL] [Abstract][Full Text] [Related]
7. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
Morgan DG; Ramasse QM; Browning ND
J Electron Microsc (Tokyo); 2009 Jun; 58(3):223-44. PubMed ID: 19297343
[TBL] [Abstract][Full Text] [Related]
8. Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.
Inada H; Wu L; Wall J; Su D; Zhu Y
J Electron Microsc (Tokyo); 2009 Jun; 58(3):111-22. PubMed ID: 19254916
[TBL] [Abstract][Full Text] [Related]
9. Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM.
Xin HL; Muller DA
J Electron Microsc (Tokyo); 2009 Jun; 58(3):157-65. PubMed ID: 19164489
[TBL] [Abstract][Full Text] [Related]
10. Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.
Inada H; Su D; Egerton RF; Konno M; Wu L; Ciston J; Wall J; Zhu Y
Ultramicroscopy; 2011 Jun; 111(7):865-76. PubMed ID: 21185651
[TBL] [Abstract][Full Text] [Related]
11. Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy.
Kimoto K; Asaka T; Yu X; Nagai T; Matsui Y; Ishizuka K
Ultramicroscopy; 2010 Jun; 110(7):778-82. PubMed ID: 20199847
[TBL] [Abstract][Full Text] [Related]
12. Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images.
Kuramochi K; Yamazaki T; Kotaka Y; Ohtsuka M; Hashimoto I; Watanabe K
Ultramicroscopy; 2009 Dec; 110(1):36-42. PubMed ID: 19818560
[TBL] [Abstract][Full Text] [Related]
13. Effects of amorphous layers on ADF-STEM imaging.
Mkhoyan KA; Maccagnano-Zacher SE; Kirkland EJ; Silcox J
Ultramicroscopy; 2008 Jul; 108(8):791-803. PubMed ID: 18374489
[TBL] [Abstract][Full Text] [Related]
14. Simulation study of aberration-corrected high-resolution transmission electron microscopy imaging of few-layer-graphene stacking.
Nelson F; Diebold AC; Hull R
Microsc Microanal; 2010 Apr; 16(2):194-9. PubMed ID: 20100382
[TBL] [Abstract][Full Text] [Related]
15. Imaging individual atoms inside crystals with ADF-STEM.
Voyles PM; Grazul JL; Muller DA
Ultramicroscopy; 2003 Sep; 96(3-4):251-73. PubMed ID: 12871793
[TBL] [Abstract][Full Text] [Related]
16. Thin dielectric film thickness determination by advanced transmission electron microscopy.
Diebold AC; Foran B; Kisielowski C; Muller DA; Pennycook SJ; Principe E; Stemmer S
Microsc Microanal; 2003 Dec; 9(6):493-508. PubMed ID: 14750984
[TBL] [Abstract][Full Text] [Related]
17. Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS.
Klie RF; Johnson C; Zhu Y
Microsc Microanal; 2008 Feb; 14(1):104-12. PubMed ID: 18171499
[TBL] [Abstract][Full Text] [Related]
18. Image simulation for atomic resolution secondary electron image.
Wu L; Egerton RF; Zhu Y
Ultramicroscopy; 2012 Dec; 123():66-73. PubMed ID: 22940532
[TBL] [Abstract][Full Text] [Related]
19. The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois.
Wen J; Mabon J; Lei C; Burdin S; Sammann E; Petrov I; Shah AB; Chobpattana V; Zhang J; Ran K; Zuo JM; Mishina S; Aoki T
Microsc Microanal; 2010 Apr; 16(2):183-93. PubMed ID: 20187990
[TBL] [Abstract][Full Text] [Related]
20. Three-dimensional imaging in aberration-corrected electron microscopes.
Xin HL; Muller DA
Microsc Microanal; 2010 Aug; 16(4):445-55. PubMed ID: 20566002
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]