These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

104 related articles for article (PubMed ID: 1472754)

  • 1. InP sample preparation for the TEM by photochemical etching, ion milling, and chemical thinning.
    Lowes TD; Cassidy DT
    Microsc Res Tech; 1992 Nov; 23(3):252-9. PubMed ID: 1472754
    [TBL] [Abstract][Full Text] [Related]  

  • 2. A technique for the preparation of cross-sectional TEM samples of ZnSe/GaAs heterostructures which eliminates process-induced defects.
    Yu JE; Jones KS; Park RM
    J Electron Microsc Tech; 1991 Jul; 18(3):315-24. PubMed ID: 1880604
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Novel method for the plan-view TEM preparation of thin samples on brittle substrates by mechanical and ion beam thinning.
    Sáfrán G; Grenet T
    Microsc Res Tech; 2002 Feb; 56(4):308-14. PubMed ID: 11877808
    [TBL] [Abstract][Full Text] [Related]  

  • 4. XTEM sample preparation technique for n-type compound semiconductors using photochemical etching.
    Tanaka S; Fujii H; Hibino M
    Microsc Res Tech; 1996 Nov; 35(4):363-4. PubMed ID: 8987033
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Improved sample preparation for cross-sectional transmission electron microscopy of layered structures using rocking-angle ion-milling techniques.
    Lee JS; Jeong YW; Kim ST
    Microsc Res Tech; 1996 Apr; 33(6):490-5. PubMed ID: 8800754
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Preparation of cross-sectional TEM samples for low-angle ion milling.
    McCaffrey JP; Barna A
    Microsc Res Tech; 1997 Mar; 36(5):362-7. PubMed ID: 9140935
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Influence of material properties on TEM specimen preparation of thin films.
    Madsen LD; Weaver L; Jacobsen SN
    Microsc Res Tech; 1997 Mar; 36(5):354-61. PubMed ID: 9140934
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Selective etching of AlAs for preparation of III-V semiconductor thin foils.
    Breen KR; Wilson RA; McClintock JA; Ahearn JS
    Microsc Res Tech; 1993 Jul; 25(4):291-6. PubMed ID: 8358079
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Artifacts introduced by ion milling in Al-Li-Cu alloys.
    Singh AK; Imam MA; Sadananda K
    J Electron Microsc Tech; 1988 Apr; 8(4):355-61. PubMed ID: 3199219
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Preparation of cross-sectional transmission electron microscopy samples by electron beam lithography and reactive ion etching.
    Wetzel JT
    J Electron Microsc Tech; 1989 Jan; 11(1):62-9. PubMed ID: 2915262
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Plan view TEM sample preparation for non-continuous and delaminating thin films.
    Weaver L
    Microsc Res Tech; 1997 Mar; 36(5):378-9. PubMed ID: 9140938
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Imaging thin films of nanoporous low-k dielectrics: comparison between ultramicrotomy and focused ion beam preparations for transmission electron microscopy.
    Thompson LE; Rice PM; Delenia E; Lee VY; Brock PJ; Magbitang TP; Dubois G; Volksen W; Miller RD; Kim HC
    Microsc Microanal; 2006 Apr; 12(2):156-9. PubMed ID: 17481352
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Improved TEM samples of semiconductors prepared by a small-angle cleavage technique.
    McCaffrey JP
    Microsc Res Tech; 1993 Feb; 24(2):180-4. PubMed ID: 8457730
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Large-area plan-view sample preparation for GaAs-based systems grown by molecular beam epitaxy.
    Howard DJ; Paine DC; Sacks RN
    J Electron Microsc Tech; 1991 Jun; 18(2):117-20. PubMed ID: 1885995
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Simple method for the preparation of InP based samples for TEM investigation.
    Barna A; Pécz B
    J Electron Microsc Tech; 1991 Jul; 18(3):325-8. PubMed ID: 1880605
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Preparation of TEM foils from Nb-10 a/o Si.
    Cockeram B; Jackson AG; Omlor RE; Srinivasan R; Weiss I
    Microsc Res Tech; 1992 Aug; 22(3):298-300. PubMed ID: 1504356
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Preparation of (InGa)As/GaAs multilayered materials for TEM by one side non-rotation ion beam thinning.
    Yao JY; Dunlop GL
    J Electron Microsc Tech; 1991 Sep; 19(1):90-8. PubMed ID: 1960573
    [TBL] [Abstract][Full Text] [Related]  

  • 18. A variation of transmission electron microscope sample preparation for VLSI analysis.
    Madden MC; Crafard P
    J Electron Microsc Tech; 1989 Feb; 11(2):161-6. PubMed ID: 2709134
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Applications of the FIB lift-out technique for TEM specimen preparation.
    Giannuzzi LA; Drown JL; Brown SR; Irwin RB; Stevie FA
    Microsc Res Tech; 1998 May; 41(4):285-90. PubMed ID: 9633946
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Cross-sectional sample preparation by focused ion beam: a review of ion-sample interaction.
    Ishitani T; Yaguchi T
    Microsc Res Tech; 1996 Nov; 35(4):320-33. PubMed ID: 8987026
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.