These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

151 related articles for article (PubMed ID: 1481280)

  • 21. Measuring and correcting aberrations of a cathode objective lens.
    Tromp RM
    Ultramicroscopy; 2011 Mar; 111(4):273-81. PubMed ID: 21353153
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Design for an aberration corrected scanning electron microscope using miniature electron mirrors.
    Dohi H; Kruit P
    Ultramicroscopy; 2018 Jun; 189():1-23. PubMed ID: 29574382
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Flat electron mirror.
    Krielaart MAR; Kruit P
    Ultramicroscopy; 2021 Jan; 220():113157. PubMed ID: 33160188
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Elemental imaging and resolution in energy-filtered conventional electron microscopy.
    Shuman H; Chang CF; Somlyo AP
    Ultramicroscopy; 1986; 19(2):121-33. PubMed ID: 3739050
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Design and performance of a high-resolution photoelectron microscope.
    Rempfer GF; Skoczylas WP; Griffith OH
    Ultramicroscopy; 1991 May; 36(1-3):196-221. PubMed ID: 1882484
    [TBL] [Abstract][Full Text] [Related]  

  • 26. eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument.
    Geelen D; Thete A; Schaff O; Kaiser A; van der Molen SJ; Tromp R
    Ultramicroscopy; 2015 Dec; 159 Pt 3():482-7. PubMed ID: 26165485
    [TBL] [Abstract][Full Text] [Related]  

  • 27. A novel electron mirror pulse compressor.
    Mankos M; Shadman K; Siwick BJ
    Ultramicroscopy; 2017 Dec; 183():77-83. PubMed ID: 28506559
    [TBL] [Abstract][Full Text] [Related]  

  • 28. A novel in-lens detector for electrostatic scanning LEEM mini-column.
    Frank L; Mullerova I; el Gomati MM
    Ultramicroscopy; 2000 Mar; 81(2):99-110. PubMed ID: 10998794
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Comparing Fourier optics and contrast transfer function modeling of image formation in low energy electron microscopy.
    Yu KM; Locatelli A; Altman MS
    Ultramicroscopy; 2017 Dec; 183():109-116. PubMed ID: 28366353
    [TBL] [Abstract][Full Text] [Related]  

  • 30. The objective lens of the electron microscope with correction of spherical and axial chromatic aberrations.
    Bimurzaev SB; Aldiyarov NU; Yakushev EM
    Microscopy (Oxf); 2017 Oct; 66(5):356-365. PubMed ID: 29016920
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Breaking the spherical and chromatic aberration barrier in transmission electron microscopy.
    Freitag B; Kujawa S; Mul PM; Ringnalda J; Tiemeijer PC
    Ultramicroscopy; 2005 Feb; 102(3):209-14. PubMed ID: 15639351
    [TBL] [Abstract][Full Text] [Related]  

  • 32. 4D electron microscopy: principles and applications.
    Flannigan DJ; Zewail AH
    Acc Chem Res; 2012 Oct; 45(10):1828-39. PubMed ID: 22967215
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Choice of operating voltage for a transmission electron microscope.
    Egerton RF
    Ultramicroscopy; 2014 Oct; 145():85-93. PubMed ID: 24679438
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Double aberration correction in a low-energy electron microscope.
    Schmidt T; Marchetto H; Lévesque PL; Groh U; Maier F; Preikszas D; Hartel P; Spehr R; Lilienkamp G; Engel W; Fink R; Bauer E; Rose H; Umbach E; Freund HJ
    Ultramicroscopy; 2010 Oct; 110(11):1358-61. PubMed ID: 20692099
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Conditions for electron tomographic data acquisition.
    Fan GY; Young SJ; Miller P; Ellisman MH
    J Electron Microsc (Tokyo); 1995 Feb; 44(1):15-21. PubMed ID: 7751829
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Fourier optics of image formation in aberration-corrected LEEM.
    Yu KM; Lau KLW; Altman MS
    Ultramicroscopy; 2019 May; 200():160-168. PubMed ID: 30925261
    [TBL] [Abstract][Full Text] [Related]  

  • 37. First experimental proof for aberration correction in XPEEM: resolution, transmission enhancement, and limitation by space charge effects.
    Schmidt T; Sala A; Marchetto H; Umbach E; Freund HJ
    Ultramicroscopy; 2013 Mar; 126():23-32. PubMed ID: 23376403
    [TBL] [Abstract][Full Text] [Related]  

  • 38. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.
    Sawada H; Tanishiro Y; Ohashi N; Tomita T; Hosokawa F; Kaneyama T; Kondo Y; Takayanagi K
    J Electron Microsc (Tokyo); 2009 Dec; 58(6):357-61. PubMed ID: 19546144
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction.
    Zheng CL; Etheridge J
    Ultramicroscopy; 2013 Feb; 125():49-58. PubMed ID: 23274685
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Aberrations in asymmetrical electron lenses.
    Fitzgerald JP; Word RC; Könenkamp R
    Ultramicroscopy; 2012 Aug; 119():40-4. PubMed ID: 22206603
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 8.