These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
7. Interfacial atomic structure analysis at sub-angstrom resolution using aberration-corrected STEM. Hsiao CN; Kuo SY; Lai FI; Chen WC Nanoscale Res Lett; 2014; 9(1):578. PubMed ID: 25426003 [TBL] [Abstract][Full Text] [Related]
8. Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy. Hernández-Maldonado D; Herrera M; Alonso-González P; González Y; González L; Gazquez J; Varela M; Pennycook SJ; Guerrero-Lebrero Mde L; Pizarro J; Galindo PL; Molina SI Microsc Microanal; 2011 Aug; 17(4):578-81. PubMed ID: 21615979 [TBL] [Abstract][Full Text] [Related]
9. Image simulation for atomic resolution secondary electron image. Wu L; Egerton RF; Zhu Y Ultramicroscopy; 2012 Dec; 123():66-73. PubMed ID: 22940532 [TBL] [Abstract][Full Text] [Related]
10. Aberration-corrected STEM/TEM imaging at 15kV. Sasaki T; Sawada H; Hosokawa F; Sato Y; Suenaga K Ultramicroscopy; 2014 Oct; 145():50-5. PubMed ID: 24842229 [TBL] [Abstract][Full Text] [Related]
11. Electron microscopy study of gold nanoparticles deposited on transition metal oxides. Akita T; Kohyama M; Haruta M Acc Chem Res; 2013 Aug; 46(8):1773-82. PubMed ID: 23777292 [TBL] [Abstract][Full Text] [Related]
12. Direct observation of a stacking fault in Si(1 - x)Ge(x) semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM. Yamasaki J; Kawai T; Tanaka N J Electron Microsc (Tokyo); 2004; 53(2):129-35. PubMed ID: 15180207 [TBL] [Abstract][Full Text] [Related]
13. Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images. Kuramochi K; Yamazaki T; Kotaka Y; Ohtsuka M; Hashimoto I; Watanabe K Ultramicroscopy; 2009 Dec; 110(1):36-42. PubMed ID: 19818560 [TBL] [Abstract][Full Text] [Related]
14. A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy. Walther T J Microsc; 2006 Feb; 221(Pt 2):137-44. PubMed ID: 16499552 [TBL] [Abstract][Full Text] [Related]
15. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy. Van Aert S; Verbeeck J; Erni R; Bals S; Luysberg M; Van Dyck D; Van Tendeloo G Ultramicroscopy; 2009 Sep; 109(10):1236-44. PubMed ID: 19525069 [TBL] [Abstract][Full Text] [Related]
16. 3D reconstruction of atomic structures from high angle annular dark field (HAADF) STEM images and its application on zeolite silicalite-1. Willhammar T; Mayoral A; Zou X Dalton Trans; 2014 Oct; 43(37):14158-63. PubMed ID: 25137058 [TBL] [Abstract][Full Text] [Related]
17. Imaging of light and heavy atomic columns by spherical aberration corrected middle-angle bright-field STEM. Ohtsuka M; Yamazaki T; Kotaka Y; Hashimoto I; Watanabe K Ultramicroscopy; 2012 Sep; 120():48-55. PubMed ID: 22796559 [TBL] [Abstract][Full Text] [Related]
18. Fine structural features of nanoscale zero-valent iron characterized by spherical aberration corrected scanning transmission electron microscopy (Cs-STEM). Liu A; Zhang WX Analyst; 2014 Sep; 139(18):4512-8. PubMed ID: 25050411 [TBL] [Abstract][Full Text] [Related]
19. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. Sawada H; Tanishiro Y; Ohashi N; Tomita T; Hosokawa F; Kaneyama T; Kondo Y; Takayanagi K J Electron Microsc (Tokyo); 2009 Dec; 58(6):357-61. PubMed ID: 19546144 [TBL] [Abstract][Full Text] [Related]
20. Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun. Kim S; Oshima Y; Sawada H; Kaneyama T; Kondo Y; Takeguchi M; Nakayama Y; Tanishiro Y; Takayanagi K J Electron Microsc (Tokyo); 2011; 60(2):109-16. PubMed ID: 21247969 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]