247 related articles for article (PubMed ID: 15093939)
1. Role of surface amorphous film in high-resolution high-angle annular dark field STEM imaging.
Yamazaki T; Watanabe K; Nakanishi N; Hashimoto I
Ultramicroscopy; 2004 May; 99(2-3):125-35. PubMed ID: 15093939
[TBL] [Abstract][Full Text] [Related]
2. Effects of amorphous layers on ADF-STEM imaging.
Mkhoyan KA; Maccagnano-Zacher SE; Kirkland EJ; Silcox J
Ultramicroscopy; 2008 Jul; 108(8):791-803. PubMed ID: 18374489
[TBL] [Abstract][Full Text] [Related]
3. Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces.
Yu Z; Muller DA; Silcox J
Ultramicroscopy; 2008 Apr; 108(5):494-501. PubMed ID: 17920197
[TBL] [Abstract][Full Text] [Related]
4. Experimental quantification of annular dark-field images in scanning transmission electron microscopy.
Lebeau JM; Stemmer S
Ultramicroscopy; 2008 Nov; 108(12):1653-8. PubMed ID: 18707809
[TBL] [Abstract][Full Text] [Related]
5. High-angle annular dark field scanning transmission electron microscopy on carbon-based functional polymer systems.
Sourty E; van Bavel S; Lu K; Guerra R; Bar G; Loos J
Microsc Microanal; 2009 Jun; 15(3):251-8. PubMed ID: 19460182
[TBL] [Abstract][Full Text] [Related]
6. Contributions to the contrast in experimental high-angle annular dark-field images.
Klenov DO; Stemmer S
Ultramicroscopy; 2006; 106(10):889-901. PubMed ID: 16713091
[TBL] [Abstract][Full Text] [Related]
7. Bloch-wave-based STEM image simulation with layer-by-layer representation.
Morimura T; Hasaka M
Ultramicroscopy; 2009 Aug; 109(9):1203-9. PubMed ID: 19525067
[TBL] [Abstract][Full Text] [Related]
8. Thin dielectric film thickness determination by advanced transmission electron microscopy.
Diebold AC; Foran B; Kisielowski C; Muller DA; Pennycook SJ; Principe E; Stemmer S
Microsc Microanal; 2003 Dec; 9(6):493-508. PubMed ID: 14750984
[TBL] [Abstract][Full Text] [Related]
9. Composite structure of liquid crystal/polymer nanotubes revealed by high-angle annular dark-field scanning transmission electron microscopy.
Schaper AK; Kurata H; Yoshioka T; Tsuji M
Microsc Microanal; 2007 Oct; 13(5):336-41. PubMed ID: 17900383
[TBL] [Abstract][Full Text] [Related]
10. STEM image simulation by Bloch-wave method with layer-by-layer representation.
Morimura T
J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S23-8. PubMed ID: 20573745
[TBL] [Abstract][Full Text] [Related]
11. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.
Van Aert S; Verbeeck J; Erni R; Bals S; Luysberg M; Van Dyck D; Van Tendeloo G
Ultramicroscopy; 2009 Sep; 109(10):1236-44. PubMed ID: 19525069
[TBL] [Abstract][Full Text] [Related]
12. A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy.
Walther T
J Microsc; 2006 Feb; 221(Pt 2):137-44. PubMed ID: 16499552
[TBL] [Abstract][Full Text] [Related]
13. Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.
Watanabe K; Kikuchi Y; Yamazaki T; Asano E; Nakanishi N; Kotaka Y; Okunishi E; Hashimoto I
Acta Crystallogr A; 2004 Nov; 60(Pt 6):591-7. PubMed ID: 15507742
[TBL] [Abstract][Full Text] [Related]
14. Electron cryo-microscopy of biological specimens on conductive titanium-silicon metal glass films.
Rhinow D; Kühlbrandt W
Ultramicroscopy; 2008 Jun; 108(7):698-705. PubMed ID: 18164549
[TBL] [Abstract][Full Text] [Related]
15. Imaging of high-angle annular dark-field scanning transmission electron microscopy and observations of GaN-based violet laser diodes.
Shiojiri M; Saijo H
J Microsc; 2006 Sep; 223(Pt 3):172-8. PubMed ID: 17059523
[TBL] [Abstract][Full Text] [Related]
16. Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.
Sasaki T; Sawada H; Hosokawa F; Kohno Y; Tomita T; Kaneyama T; Kondo Y; Kimoto K; Sato Y; Suenaga K
J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S7-13. PubMed ID: 20581425
[TBL] [Abstract][Full Text] [Related]
17. Effects of tilt on high-resolution ADF-STEM imaging.
Maccagnano-Zacher SE; Mkhoyan KA; Kirkland EJ; Silcox J
Ultramicroscopy; 2008 Jul; 108(8):718-26. PubMed ID: 18160220
[TBL] [Abstract][Full Text] [Related]
18. Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.
Rosenauer A; Gries K; Müller K; Pretorius A; Schowalter M; Avramescu A; Engl K; Lutgen S
Ultramicroscopy; 2009 Aug; 109(9):1171-82. PubMed ID: 19497670
[TBL] [Abstract][Full Text] [Related]
19. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
Morgan DG; Ramasse QM; Browning ND
J Electron Microsc (Tokyo); 2009 Jun; 58(3):223-44. PubMed ID: 19297343
[TBL] [Abstract][Full Text] [Related]
20. HRTEM studies of amorphous ZrNiTiCu nanocrystalline composites.
Dutkiewicz J; Lityńska-Dobrzyńska L; Kovacova A; Molnarova M; Rogal L; Maziarz W
J Microsc; 2010 Mar; 237(3):237-41. PubMed ID: 20500372
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
