These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

249 related articles for article (PubMed ID: 15149717)

  • 41. Morphological, nanomechanical and cellular structural characterization of human hair and conditioner distribution using torsional resonance mode with an atomic force microscope.
    Chen N; Bhushan B
    J Microsc; 2005 Nov; 220(Pt 2):96-112. PubMed ID: 16313489
    [TBL] [Abstract][Full Text] [Related]  

  • 42. Topographic, electrochemical, and optical images captured using standing approach mode scanning electrochemical/optical microscopy.
    Takahashi Y; Hirano Y; Yasukawa T; Shiku H; Yamada H; Matsue T
    Langmuir; 2006 Dec; 22(25):10299-306. PubMed ID: 17128996
    [TBL] [Abstract][Full Text] [Related]  

  • 43. Implementation of a short-tip tapping-mode tuning fork near-field scanning optical microscope.
    Lu NH; Huang CW; Chen CY; Yu CF; Kao TS; Fu YH; Tsai DP
    J Microsc; 2003 Mar; 209(Pt 3):205-8. PubMed ID: 12641763
    [TBL] [Abstract][Full Text] [Related]  

  • 44. Shear force control for a terahertz near field microscope.
    Buersgens F; Acuna G; Lang CH; Potrebic SI; Manus S; Kersting R
    Rev Sci Instrum; 2007 Nov; 78(11):113701. PubMed ID: 18052474
    [TBL] [Abstract][Full Text] [Related]  

  • 45. SNOM on cell thin sections: observation of Jurkat and MDAMB453 cells.
    Zweyer M; Troian B; Spreafico V; Prato S
    J Microsc; 2008 Mar; 229(Pt 3):440-6. PubMed ID: 18331492
    [TBL] [Abstract][Full Text] [Related]  

  • 46. Fibre-top atomic force microscope probe with optical near-field detection capabilities.
    Tiribilli B; Margheri G; Baschieri P; Menozzi C; Chavan D; Iannuzzi D
    J Microsc; 2011 Apr; 242(1):10-4. PubMed ID: 21155996
    [TBL] [Abstract][Full Text] [Related]  

  • 47. Coupled lateral bending-torsional vibration sensitivity of atomic force microscope cantilever.
    Lee HL; Chang WJ
    Ultramicroscopy; 2008 Jul; 108(8):707-11. PubMed ID: 18054438
    [TBL] [Abstract][Full Text] [Related]  

  • 48. Oscillation-induced static deflection in scanning force microscopy.
    Heim LO; Johannsmann D
    Rev Sci Instrum; 2007 Jan; 78(1):013902. PubMed ID: 17503928
    [TBL] [Abstract][Full Text] [Related]  

  • 49. Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope.
    Lai K; Kundhikanjana W; Kelly M; Shen ZX
    Rev Sci Instrum; 2008 Jun; 79(6):063703. PubMed ID: 18601409
    [TBL] [Abstract][Full Text] [Related]  

  • 50. Direct measurement of tapping force with a cantilever deflection force sensor.
    Su C; Huang L; Kjoller K
    Ultramicroscopy; 2004 Aug; 100(3-4):233-9. PubMed ID: 15231315
    [TBL] [Abstract][Full Text] [Related]  

  • 51. Study of the sensitivity of the first four flexural modes of an AFM cantilever with a sidewall probe.
    Chang WJ; Lee HL; Chen TY
    Ultramicroscopy; 2008 Jun; 108(7):619-24. PubMed ID: 18037563
    [TBL] [Abstract][Full Text] [Related]  

  • 52. A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging.
    Wu Y; Shi J; Su C; Zou Q
    Rev Sci Instrum; 2009 Apr; 80(4):043709. PubMed ID: 19405668
    [TBL] [Abstract][Full Text] [Related]  

  • 53. Complex dynamics of carbon nanotube probe tips.
    Lee SI; Howell SW; Raman A; Reifenberger R; Nguyen CV; Meyyappan M
    Ultramicroscopy; 2005 May; 103(2):95-102. PubMed ID: 15774270
    [TBL] [Abstract][Full Text] [Related]  

  • 54. Sensitivity maximized near-field scanning optical microscope with dithering sample stage.
    Park KD; Lee SG; Heo C; Lee YH; Jeong MS
    Rev Sci Instrum; 2012 Sep; 83(9):093710. PubMed ID: 23020386
    [TBL] [Abstract][Full Text] [Related]  

  • 55. Contrast and resolution enhancement of a near-field optical microscope by using a modulation technique.
    Flaxer E; Palachi E
    Ultramicroscopy; 2005 Jan; 102(2):141-9. PubMed ID: 15590137
    [TBL] [Abstract][Full Text] [Related]  

  • 56. Mechanical and electrical properties of CdTe tetrapods studied by atomic force microscopy.
    Fang L; Park JY; Cui Y; Alivisatos P; Shcrier J; Lee B; Wang LW; Salmeron M
    J Chem Phys; 2007 Nov; 127(18):184704. PubMed ID: 18020655
    [TBL] [Abstract][Full Text] [Related]  

  • 57. Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode.
    Biczysko P; Dzierka A; Jóźwiak G; Rudek M; Gotszalk T; Janus P; Grabiec P; Rangelow IW
    Ultramicroscopy; 2018 Jan; 184(Pt A):199-208. PubMed ID: 28950210
    [TBL] [Abstract][Full Text] [Related]  

  • 58. High-resolution apertureless near-field optical imaging using gold nanosphere probes.
    Kim ZH; Leone SR
    J Phys Chem B; 2006 Oct; 110(40):19804-9. PubMed ID: 17020365
    [TBL] [Abstract][Full Text] [Related]  

  • 59. Immobilized diaphorase surfaces observed by scanning electrochemical microscope with shear force based tip-substrate positioning.
    Yamada H; Fukumoto H; Yokoyama T; Koike T
    Anal Chem; 2005 Mar; 77(6):1785-90. PubMed ID: 15762586
    [TBL] [Abstract][Full Text] [Related]  

  • 60. Manipulation, dissection, and lithography using modified tapping mode atomic force microscope.
    Liu Z; Li Z; Wei G; Song Y; Wang L; Sun L
    Microsc Res Tech; 2006 Dec; 69(12):998-1004. PubMed ID: 16981196
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 13.