These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

214 related articles for article (PubMed ID: 15157189)

  • 1. FIB-induced damage in silicon.
    Rubanov S; Munroe PR
    J Microsc; 2004 Jun; 214(Pt 3):213-21. PubMed ID: 15157189
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Damage in III-V compounds during focused ion beam milling.
    Rubanov S; Munroe PR
    Microsc Microanal; 2005 Oct; 11(5):446-55. PubMed ID: 17481325
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction.
    Alexandre L; Rousseau K; Alfonso C; Saikaly W; Fares L; Grosjean C; Charaï A
    Micron; 2008; 39(3):294-301. PubMed ID: 17346978
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Combining Ar ion milling with FIB lift-out techniques to prepare high quality site-specific TEM samples.
    Huang Z
    J Microsc; 2004 Sep; 215(Pt 3):219-23. PubMed ID: 15312185
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors.
    Dunin-Borkowski RE; Newcomb SB; Kasama T; McCartney MR; Weyland M; Midgley PA
    Ultramicroscopy; 2005 Apr; 103(1):67-81. PubMed ID: 15777601
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Focused-ion-beam-inflicted surface amorphization and gallium implantation--new insights and removal by focused-electron-beam-induced etching.
    Roediger P; Wanzenboeck HD; Waid S; Hochleitner G; Bertagnolli E
    Nanotechnology; 2011 Jun; 22(23):235302. PubMed ID: 21474869
    [TBL] [Abstract][Full Text] [Related]  

  • 7. The application of FIB milling for specimen preparation from crystalline germanium.
    Rubanov S; Munroe PR
    Micron; 2004; 35(7):549-56. PubMed ID: 15219901
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devices.
    Twitchett AC; Dunin-Borkowski RE; Hallifax RJ; Broom RF; Midgley PA
    J Microsc; 2004 Jun; 214(Pt 3):287-96. PubMed ID: 15157196
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process.
    Urbánek M; Uhlír V; Bábor P; Kolíbalová E; Hrncír T; Spousta J; Sikola T
    Nanotechnology; 2010 Apr; 21(14):145304. PubMed ID: 20215654
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Off-axis electron holography of unbiased and reverse-biased focused ion beam milled Si p-n junctions.
    Twitchett AC; Dunin-Borkowski RE; Hallifax RJ; Broom RF; Midgley PA
    Microsc Microanal; 2005 Feb; 11(1):66-78. PubMed ID: 15683573
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling.
    Volkert CA; Busch S; Heiland B; Dehm G
    J Microsc; 2004 Jun; 214(Pt 3):208-12. PubMed ID: 15157188
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Selective etching of focused gallium ion beam implanted regions from silicon as a nanofabrication method.
    Han Z; Vehkamäki M; Mattinen M; Salmi E; Mizohata K; Leskelä M; Ritala M
    Nanotechnology; 2015 Jul; 26(26):265304. PubMed ID: 26062985
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Evaluation of top, angle, and side cleaned FIB samples for TEM analysis.
    Montoya E; Bals S; Rossell MD; Schryvers D; Van Tendeloo G
    Microsc Res Tech; 2007 Dec; 70(12):1060-71. PubMed ID: 17722055
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Surface damage induced by FIB milling and imaging of biological samples is controllable.
    Drobne D; Milani M; Leser V; Tatti F
    Microsc Res Tech; 2007 Oct; 70(10):895-903. PubMed ID: 17661360
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Beam damage suppression of low-kappa porous Si-O-C films by cryo-electron-energy loss spectroscopy (EELS).
    Otsuka Y; Shimizu Y; Tanaka I
    J Electron Microsc (Tokyo); 2009 Apr; 58(2):29-34. PubMed ID: 19218485
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Combining focused ion beam and atomic layer deposition in nanostructure fabrication.
    Han Z; Vehkamäki M; Leskelä M; Ritala M
    Nanotechnology; 2014 Mar; 25(11):115302. PubMed ID: 24556713
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Redeposition effects in transmission electron microscope specimens of FeAl-WC composites prepared using a focused ion beam.
    Cairney JM; Munroe PR
    Micron; 2003; 34(2):97-107. PubMed ID: 12801542
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Evaluation of neon focused ion beam milling for TEM sample preparation.
    Pekin TC; Allen FI; Minor AM
    J Microsc; 2016 Oct; 264(1):59-63. PubMed ID: 27172066
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Cross-sectional Specimen Preparation and Observation of a Plasma Sprayed Coating Using a Focused Ion Beam/Transmission Electron Microscopy System.
    Yaguchi T; Kamino T; Sasaki M; Barbezat G; Urao R
    Microsc Microanal; 2000 May; 6(3):218-223. PubMed ID: 10790490
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Ultra-fast vapour-liquid-solid synthesis of Si nanowires using ion-beam implanted gallium as catalyst.
    Hetzel M; Lugstein A; Zeiner C; Wójcik T; Pongratz P; Bertagnolli E
    Nanotechnology; 2011 Sep; 22(39):395601. PubMed ID: 21891844
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 11.