201 related articles for article (PubMed ID: 15306080)
1. Physical limits on atomic resolution.
Van Dyck D; Van Aert S; den Dekker AJ
Microsc Microanal; 2004 Feb; 10(1):153-7. PubMed ID: 15306080
[TBL] [Abstract][Full Text] [Related]
2. Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopy.
Lentzen M
Microsc Microanal; 2008 Feb; 14(1):16-26. PubMed ID: 18096097
[TBL] [Abstract][Full Text] [Related]
3. Depth-dependent imaging of individual dopant atoms in silicon.
Voyles PM; Muller DA; Kirkland EJ
Microsc Microanal; 2004 Apr; 10(2):291-300. PubMed ID: 15306055
[TBL] [Abstract][Full Text] [Related]
4. Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction.
Lentzen M
Microsc Microanal; 2006 Jun; 12(3):191-205. PubMed ID: 17481356
[TBL] [Abstract][Full Text] [Related]
5. Seeing atoms with aberration-corrected sub-Angström electron microscopy.
O'Keefe MA
Ultramicroscopy; 2008 Feb; 108(3):196-209. PubMed ID: 18054170
[TBL] [Abstract][Full Text] [Related]
6. Study of amorphous alloy structures with medium range atomic ordering.
Hirotsu Y; Ohkubo T; Matsushita M
Microsc Res Tech; 1998 Feb; 40(4):284-312. PubMed ID: 9523762
[TBL] [Abstract][Full Text] [Related]
7. Direct sub-angstrom imaging of a crystal lattice.
Nellist PD; Chisholm MF; Dellby N; Krivanek OL; Murfitt MF; Szilagyi ZS; Lupini AR; Borisevich A; Sides WH; Pennycook SJ
Science; 2004 Sep; 305(5691):1741. PubMed ID: 15375260
[TBL] [Abstract][Full Text] [Related]
8. Tilt-series and electron microscope alignment for the correction of the non-perpendicularity of beam and tilt-axis.
Díez DC; Seybert A; Frangakis AS
J Struct Biol; 2006 May; 154(2):195-205. PubMed ID: 16503168
[TBL] [Abstract][Full Text] [Related]
9. Optimized HREM imaging of objects supported by amorphous substrates using spherical aberration adjustment.
Allsop NA; Dobson PJ; Hutchison JL
J Microsc; 2006 Jul; 223(Pt 1):1-8. PubMed ID: 16872425
[TBL] [Abstract][Full Text] [Related]
10. Sub-ångstrom resolution using aberration corrected electron optics.
Batson PE; Dellby N; Krivanek OL
Nature; 2002 Aug; 418(6898):617-20. PubMed ID: 12167855
[TBL] [Abstract][Full Text] [Related]
11. Breaking the spherical and chromatic aberration barrier in transmission electron microscopy.
Freitag B; Kujawa S; Mul PM; Ringnalda J; Tiemeijer PC
Ultramicroscopy; 2005 Feb; 102(3):209-14. PubMed ID: 15639351
[TBL] [Abstract][Full Text] [Related]
12. Topics in recent studies with high-voltage electron microscopes.
Mori H
J Electron Microsc (Tokyo); 2011; 60 Suppl 1():S189-97. PubMed ID: 21844589
[TBL] [Abstract][Full Text] [Related]
13. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
Van Dyck D; Van Aert S; den Dekker AJ; van den Bos A
Ultramicroscopy; 2003 Dec; 98(1):27-42. PubMed ID: 14609640
[TBL] [Abstract][Full Text] [Related]
14. Future trends in aberration-corrected electron microscopy.
Rose HH
Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3809-23. PubMed ID: 19687067
[TBL] [Abstract][Full Text] [Related]
15. High-resolution transmission electron microscopy using negative spherical aberration.
Jia CL; Lentzen M; Urban K
Microsc Microanal; 2004 Apr; 10(2):174-84. PubMed ID: 15306044
[TBL] [Abstract][Full Text] [Related]
16. Linear versus non-linear structural information limit in high-resolution transmission electron microscopy.
Van Aert S; Chen JH; Van Dyck D
Ultramicroscopy; 2010 Oct; 110(11):1404-10. PubMed ID: 20655146
[TBL] [Abstract][Full Text] [Related]
17. Automated most-probable loss tomography of thick selectively stained biological specimens with quantitative measurement of resolution improvement.
Bouwer JC; Mackey MR; Lawrence A; Deerinck TJ; Jones YZ; Terada M; Martone ME; Peltier S; Ellisman MH
J Struct Biol; 2004 Dec; 148(3):297-306. PubMed ID: 15522778
[TBL] [Abstract][Full Text] [Related]
18. Atomic structure of Beta-tantalum nanocrystallites.
Tillmann K; Thust A; Gerber A; Weides MP; Urban K
Microsc Microanal; 2005 Dec; 11(6):534-44. PubMed ID: 17481332
[TBL] [Abstract][Full Text] [Related]
19. Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEM.
Linck M
Ultramicroscopy; 2013 Jan; 124():77-87. PubMed ID: 23142748
[TBL] [Abstract][Full Text] [Related]
20. Current and future aberration correctors for the improvement of resolution in electron microscopy.
Haider M; Hartel P; Müller H; Uhlemann S; Zach J
Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3665-82. PubMed ID: 19687059
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]