These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

142 related articles for article (PubMed ID: 15536981)

  • 1. Mechanical scanning of the specimen in the scanning electron microscope.
    Oho E; Miyamoto M
    Scanning; 2004; 26(5):250-5. PubMed ID: 15536981
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Practical SEM system based on the montage technique applicable to ultralow-magnification observation, while maintaining original functions.
    Oho E; Okugawa K; Kawamata S
    J Electron Microsc (Tokyo); 2000; 49(1):135-41. PubMed ID: 10791429
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns.
    Goehner RP; Michael JR
    J Res Natl Inst Stand Technol; 1996; 101(3):301-308. PubMed ID: 27805167
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Special raster scanning for reduction of charging effects in scanning electron microscopy.
    Suzuki K; Oho E
    Scanning; 2014; 36(3):327-33. PubMed ID: 23897699
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Qualitative and quantitative interpretation of SEM image using digital image processing.
    Saladra D; Kopernik M
    J Microsc; 2016 Oct; 264(1):102-24. PubMed ID: 27302280
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Corrections of magnification and focusing in a cathode lens-equipped scanning electron microscope.
    Zobacová J; Zobac M; Oral M; Müllerová I; Frank L
    Scanning; 2006; 28(3):155-63. PubMed ID: 16878787
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Changes in particle area measurements due to SEM accelerating voltage and magnification.
    Yañez MJ; Barbosa SE
    Microsc Res Tech; 2003 Aug; 61(5):463-8. PubMed ID: 12845573
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Lagrange time delay estimation for scanning electron microscope image magnification.
    Sim KS; Thong LW; Ting HY; Tso CP
    J Microsc; 2010 Feb; 237(2):111-8. PubMed ID: 20096041
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Analytical scanning electron microscopy for solid surface.
    Ichinokawa T
    J Electron Microsc Tech; 1989 Jul; 12(3):219-27. PubMed ID: 2795228
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Feature evaluation of complex hysteresis smoothing and its practical applications to noisy SEM images.
    Suzuki K; Oho E
    Scanning; 2013; 35(5):292-301. PubMed ID: 23184364
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Histochemistry of food tissue by colour scanning electron microscopy.
    Yamada M; Nishimura M; Suzuki T; Kawamata S; Oho E; Kimura T
    J Electron Microsc (Tokyo); 2000; 49(3):503-7. PubMed ID: 11108041
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Separation of image-distortion sources and magnetic-field measurement in scanning electron microscope (SEM).
    Płuska M; Czerwinski A; Ratajczak J; Katcki J; Oskwarek L; Rak R
    Micron; 2009 Jan; 40(1):46-50. PubMed ID: 18321720
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Combination of microscopic techniques reveals a comprehensive visual impression of biofilm structure and composition.
    Alhede M; Qvortrup K; Liebrechts R; Høiby N; Givskov M; Bjarnsholt T
    FEMS Immunol Med Microbiol; 2012 Jul; 65(2):335-42. PubMed ID: 22429654
    [TBL] [Abstract][Full Text] [Related]  

  • 14. On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.
    Sun C; Müller E; Meffert M; Gerthsen D
    Microsc Microanal; 2018 Apr; 24(2):99-106. PubMed ID: 29589573
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Using digital anaglyphy to improve the relief effect of SEM micrographs of bloodstains.
    Hortolà P
    Micron; 2009 Apr; 40(3):409-12. PubMed ID: 19038551
    [TBL] [Abstract][Full Text] [Related]  

  • 16. In situ tensile testing of individual Co nanowires inside a scanning electron microscope.
    Zhang D; Breguet JM; Clavel R; Phillippe L; Utke I; Michler J
    Nanotechnology; 2009 Sep; 20(36):365706. PubMed ID: 19687546
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Specimen plane orientation determination for analysis based on scanning electron microscope: Comparing top-down and side-view approaches.
    Li C; Craig J; Dubovi J
    Microsc Res Tech; 2023 Dec; 86(12):1681-1690. PubMed ID: 37624068
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Natural color scanning electron microscopy based on the frequency characteristics of the human visual system.
    Oho E; Watanabe M
    Scanning; 2001; 23(1):24-31. PubMed ID: 11272333
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Scanning electron microscope observation of dislocations in semiconductor and metal materials.
    Kuwano N; Itakura M; Nagatomo Y; Tachibana S
    J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S175-81. PubMed ID: 20595187
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Multi-scale characterization by FIB-SEM/TEM/3DAP.
    Ohkubo T; Sepehri-Amin H; Sasaki TT; Hono K
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i6-i7. PubMed ID: 25359845
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.