These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

132 related articles for article (PubMed ID: 15582952)

  • 21. Microstructural analysis of the deformation range under nano-indentation in beta-SiC.
    Kishimoto H; Park KH; Kondo S; Ozawa K; Kohyama A
    J Electron Microsc (Tokyo); 2004; 53(5):515-7. PubMed ID: 15582958
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV.
    Kamino T; Yaguchi T; Kuroda Y; Ohnishi T; Ishitani T; Miyahara Y; Horita Z
    J Electron Microsc (Tokyo); 2004; 53(5):459-63. PubMed ID: 15582947
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Off-axis electron holography of unbiased and reverse-biased focused ion beam milled Si p-n junctions.
    Twitchett AC; Dunin-Borkowski RE; Hallifax RJ; Broom RF; Midgley PA
    Microsc Microanal; 2005 Feb; 11(1):66-78. PubMed ID: 15683573
    [TBL] [Abstract][Full Text] [Related]  

  • 24. HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method.
    Tanaka M; Higashida K; Fukui T; Yokote T
    J Electron Microsc (Tokyo); 2004; 53(5):505-9. PubMed ID: 15582956
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Damage in III-V compounds during focused ion beam milling.
    Rubanov S; Munroe PR
    Microsc Microanal; 2005 Oct; 11(5):446-55. PubMed ID: 17481325
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling.
    Tanabe T
    J Electron Microsc (Tokyo); 2011; 60(1):35-7. PubMed ID: 20923871
    [TBL] [Abstract][Full Text] [Related]  

  • 27. 2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation.
    Lenk A; Lichte H; Muehle U
    J Electron Microsc (Tokyo); 2005 Aug; 54(4):351-9. PubMed ID: 16123059
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Specimen preparation for electron holography of semiconductor devices.
    Formanek P; Bugiel E
    Ultramicroscopy; 2006 Mar; 106(4-5):365-75. PubMed ID: 16384647
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam.
    Wang ZG; Kato N; Sasaki K; Hirayama T; Saka H
    J Electron Microsc (Tokyo); 2004; 53(2):115-9. PubMed ID: 15180205
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics.
    Zinkle SJ; Haltom CP; Jenkins LC; DuBose CK
    J Electron Microsc Tech; 1991 Dec; 19(4):452-60. PubMed ID: 1797990
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments.
    Vijayan S; Jinschek JR; Kujawa S; Greiser J; Aindow M
    Microsc Microanal; 2017 Aug; 23(4):708-716. PubMed ID: 28578727
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient.
    Hata S; Shiraishi K; Itakura M; Kuwano N; Nakano T; Umakoshi Y
    J Electron Microsc (Tokyo); 2004; 53(5):537-40. PubMed ID: 15582962
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Location specific in situ TEM straining specimens made using FIB.
    Field RD; Papin PA
    Ultramicroscopy; 2004 Dec; 102(1):23-6. PubMed ID: 15556697
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate.
    Kuwano N; Jia-Yu ; Tajima R; Koga S; Tsukamoto S; Ohno Y
    J Electron Microsc (Tokyo); 2004; 53(5):541-4. PubMed ID: 15585469
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Applications of scanning electron microscopy and focused ion beam milling in dental research.
    House KL; Pan L; O'Carroll DM; Xu S
    Eur J Oral Sci; 2022 Apr; 130(2):e12853. PubMed ID: 35288994
    [TBL] [Abstract][Full Text] [Related]  

  • 36. A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs.
    Yabuuchi Y; Tametou S; Okano T; Inazato S; Sadayama S; Yamamoto Y; Iwasaki K; Sugiyama Y
    J Electron Microsc (Tokyo); 2004; 53(5):471-7. PubMed ID: 15582949
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Preventing damage and redeposition during focused ion beam milling: The "umbrella" method.
    Vermeij T; Plancher E; Tasan CC
    Ultramicroscopy; 2018 Mar; 186():35-41. PubMed ID: 29248870
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Direct observation of dopant distribution in GaAs compound semiconductors using phase-shifting electron holography and Lorentz microscopy.
    Sasaki H; Otomo S; Minato R; Yamamoto K; Hirayama T
    Microscopy (Oxf); 2014 Jun; 63(3):235-42. PubMed ID: 24706942
    [TBL] [Abstract][Full Text] [Related]  

  • 39. Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell.
    Kamino T; Yaguchi T; Ohnishi T; Ishitani T; Osumi M
    J Electron Microsc (Tokyo); 2004; 53(5):563-6. PubMed ID: 15582966
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Focused ion beam for microscopy and in situ sample preparation: application on a crustacean digestive system.
    Drobne D; Milani M; Ballerini M; Zrimec A; Zrimec MB; Tatti F; Draslar K
    J Biomed Opt; 2004; 9(6):1238-43. PubMed ID: 15568945
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 7.