987 related articles for article (PubMed ID: 15679361)
1. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry.
Wagner MS
Anal Chem; 2005 Feb; 77(3):911-22. PubMed ID: 15679361
[TBL] [Abstract][Full Text] [Related]
2. Impact energy dependence of SF5+-induced damage in poly(methyl methacrylate) studied using time-of-flight secondary ion mass spectrometry.
Wagner MS
Anal Chem; 2004 Mar; 76(5):1264-72. PubMed ID: 14987080
[TBL] [Abstract][Full Text] [Related]
3. Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry.
Harton SE; Stevie FA; Zhu Z; Ade H
Anal Chem; 2006 May; 78(10):3452-60. PubMed ID: 16689549
[TBL] [Abstract][Full Text] [Related]
4. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams.
Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J
Rapid Commun Mass Spectrom; 2009 Jun; 23(11):1601-6. PubMed ID: 19399762
[TBL] [Abstract][Full Text] [Related]
5. Molecular depth profiling of sucrose films: a comparative study of C60(n+) ions and traditional Cs(+) and O2(+) ions.
Zhu Z; Nachimuthu P; Lea AS
Anal Chem; 2009 Oct; 81(20):8272-9. PubMed ID: 19769372
[TBL] [Abstract][Full Text] [Related]
6. Analysis of structural distribution of nitrogen-incorporated species at the interface of silicon oxide films on silicon using time-of-flight secondary ion mass spectrometry and poisson approximation.
Chiba K
Anal Chem; 2008 Aug; 80(16):6286-92. PubMed ID: 18642880
[TBL] [Abstract][Full Text] [Related]
7. Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry.
Gillen G; Roberson S
Rapid Commun Mass Spectrom; 1998; 12(19):1303-12. PubMed ID: 9773521
[TBL] [Abstract][Full Text] [Related]
8. Depth profiling of poly(L-lactic acid)/triblock copolymer blends with time-of-flight secondary ion mass spectrometry.
Mahoney CM; Yu J; Gardella JA
Anal Chem; 2005 Jun; 77(11):3570-8. PubMed ID: 15924391
[TBL] [Abstract][Full Text] [Related]
9. Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.
Naderi-Gohar S; Huang KM; Wu Y; Lau WM; Nie HY
Rapid Commun Mass Spectrom; 2017 Feb; 31(4):381-388. PubMed ID: 27933719
[TBL] [Abstract][Full Text] [Related]
10. Cluster secondary ion mass spectrometry of polymers and related materials.
Mahoney CM
Mass Spectrom Rev; 2010; 29(2):247-93. PubMed ID: 19449334
[TBL] [Abstract][Full Text] [Related]
11. TOF-SIMS with argon gas cluster ion beams: a comparison with C60+.
Rabbani S; Barber AM; Fletcher JS; Lockyer NP; Vickerman JC
Anal Chem; 2011 May; 83(10):3793-800. PubMed ID: 21462969
[TBL] [Abstract][Full Text] [Related]
12. 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.
Bailey J; Havelund R; Shard AG; Gilmore IS; Alexander MR; Sharp JS; Scurr DJ
ACS Appl Mater Interfaces; 2015 Feb; 7(4):2654-9. PubMed ID: 25562665
[TBL] [Abstract][Full Text] [Related]
13. TOF-SIMS analysis using C60. Effect of impact energy on yield and damage.
Fletcher JS; Conlan XA; Jones EA; Biddulph G; Lockyer NP; Vickerman JC
Anal Chem; 2006 Mar; 78(6):1827-31. PubMed ID: 16536417
[TBL] [Abstract][Full Text] [Related]
14. Protocols for three-dimensional molecular imaging using mass spectrometry.
Wucher A; Cheng J; Winograd N
Anal Chem; 2007 Aug; 79(15):5529-39. PubMed ID: 17583913
[TBL] [Abstract][Full Text] [Related]
15. Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.
Ninomiya S; Ichiki K; Yamada H; Nakata Y; Seki T; Aoki T; Matsuo J
Rapid Commun Mass Spectrom; 2009 Oct; 23(20):3264-8. PubMed ID: 19757450
[TBL] [Abstract][Full Text] [Related]
16. Three-dimensional compositional analysis of drug eluting stent coatings using cluster secondary ion mass spectrometry.
Mahoney CM; Fahey AJ; Belu AM
Anal Chem; 2008 Feb; 80(3):624-32. PubMed ID: 18179243
[TBL] [Abstract][Full Text] [Related]
17. Depth profiling of peptide films with TOF-SIMS and a C60 probe.
Cheng J; Winograd N
Anal Chem; 2005 Jun; 77(11):3651-9. PubMed ID: 15924401
[TBL] [Abstract][Full Text] [Related]
18. Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry.
Lenaerts J; Van Vaeck L; Gijbels R; Van Luppen J
Rapid Commun Mass Spectrom; 2004; 18(3):257-64. PubMed ID: 14755609
[TBL] [Abstract][Full Text] [Related]
19. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions.
Lee JL; Ninomiya S; Matsuo J; Gilmore IS; Seah MP; Shard AG
Anal Chem; 2010 Jan; 82(1):98-105. PubMed ID: 19957960
[TBL] [Abstract][Full Text] [Related]
20. Characterization of poly(L-lysine)-graft-poly(ethylene glycol) assembled monolayers on niobium pentoxide substrates using time-of-flight secondary ion mass spectrometry and multivariate analysis.
Wagner MS; Pasche S; Castner DG; Textor M
Anal Chem; 2004 Mar; 76(5):1483-92. PubMed ID: 14987107
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
