141 related articles for article (PubMed ID: 16028835)
1. Utilizing the charging effect in scanning electron microscopy.
Zhang HB; Feng RJ; Ura K
Sci Prog; 2004; 87(Pt 4):249-68. PubMed ID: 16028835
[TBL] [Abstract][Full Text] [Related]
2. From the physics of secondary electron emission to image contrasts in scanning electron microscopy.
Cazaux J
J Electron Microsc (Tokyo); 2012; 61(5):261-84. PubMed ID: 22872280
[TBL] [Abstract][Full Text] [Related]
3. Scanning electron microscopy.
Fischer ER; Hansen BT; Nair V; Hoyt FH; Dorward DW
Curr Protoc Microbiol; 2012 May; Chapter 2():Unit 2B.2.. PubMed ID: 22549162
[TBL] [Abstract][Full Text] [Related]
4. Reducing scanning electron microscope charging by using exponential contrast stretching technique on post-processing images.
Sim KS; Tan YY; Lai MA; Tso CP; Lim WK
J Microsc; 2010 Apr; 238(1):44-56. PubMed ID: 20384837
[TBL] [Abstract][Full Text] [Related]
5. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics.
Stevens-Kalceff MA; Levick KJ
Microsc Res Tech; 2007 Mar; 70(3):195-204. PubMed ID: 17279517
[TBL] [Abstract][Full Text] [Related]
6. Recent developments and new strategies in scanning electron microscopy.
Cazaux J
J Microsc; 2005 Jan; 217(Pt 1):16-35. PubMed ID: 15655059
[TBL] [Abstract][Full Text] [Related]
7. Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST).
Gholinia A; Curd ME; Bousser E; Taylor K; Hosman T; Coyle S; Shearer MH; Hunt J; Withers PJ
Ultramicroscopy; 2020 Jul; 214():112989. PubMed ID: 32416435
[TBL] [Abstract][Full Text] [Related]
8. An anomalous contrast in scanning electron microscopy of insulators: the pseudo-mirror effect.
Belhaj M; Jbara O; Odof S; Msellak K; Rau EI; Andrianov MV
Scanning; 2000; 22(6):352-6. PubMed ID: 11145260
[TBL] [Abstract][Full Text] [Related]
9. Scanning electron microscopy at macromolecular resolution in low energy mode on biological specimens coated with ultra thin metal films.
Peters KR
Scan Electron Microsc; 1979; (2):133-48. PubMed ID: 392703
[TBL] [Abstract][Full Text] [Related]
10. A novel method for "Wet" SEM.
Barshack I; Kopolovic J; Chowers Y; Gileadi O; Vainshtein A; Zik O; Behar V
Ultrastruct Pathol; 2004; 28(1):29-31. PubMed ID: 14967596
[TBL] [Abstract][Full Text] [Related]
11. Quantitative analysis of static capacitance contrast in scanning electron microscopy.
Feng RJ; Zhang HB; Ura K
J Electron Microsc (Tokyo); 2003; 52(5):455-8. PubMed ID: 14700076
[TBL] [Abstract][Full Text] [Related]
12. Immunolabeling for scanning electron microscopy (SEM) and field emission SEM.
Goldberg MW
Methods Cell Biol; 2008; 88():109-30. PubMed ID: 18617031
[TBL] [Abstract][Full Text] [Related]
13. Natural color scanning electron microscopy based on the frequency characteristics of the human visual system.
Oho E; Watanabe M
Scanning; 2001; 23(1):24-31. PubMed ID: 11272333
[TBL] [Abstract][Full Text] [Related]
14. Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy.
Jóźwik I; Jagielski J; Dumiszewska E; Kamiński M; Kentsch U
Ultramicroscopy; 2021 Sep; 228():113333. PubMed ID: 34134066
[TBL] [Abstract][Full Text] [Related]
15. Serial block-face scanning electron microscopy to reconstruct three-dimensional tissue nanostructure.
Denk W; Horstmann H
PLoS Biol; 2004 Nov; 2(11):e329. PubMed ID: 15514700
[TBL] [Abstract][Full Text] [Related]
16. The use of environmental scanning electron microscopy for imaging wet and insulating materials.
Donald AM
Nat Mater; 2003 Aug; 2(8):511-6. PubMed ID: 12894259
[TBL] [Abstract][Full Text] [Related]
17. Characterization of the charging effect in a ZrO2 sintered body by Ga ion beam irradiation.
Kim KH; Kim JJ; Suzuki T; Shindo D
J Electron Microsc (Tokyo); 2008 Apr; 57(2):53-7. PubMed ID: 18322297
[TBL] [Abstract][Full Text] [Related]
18. Volume microscopy in biology: FIB-SEM tomography.
Kizilyaprak C; Stierhof YD; Humbel BM
Tissue Cell; 2019 Apr; 57():123-128. PubMed ID: 30385054
[TBL] [Abstract][Full Text] [Related]
19. Reducing charging effects in scanning electron microscope images by Rayleigh contrast stretching method (RCS).
Wan Ismail WZ; Sim KS; Tso CP; Ting HY
Scanning; 2011; 33(4):233-51. PubMed ID: 21611953
[TBL] [Abstract][Full Text] [Related]
20. Dynamic secondary electron contrast effects in liquid systems studied by environmental scanning electron microscopy.
Stokes DJ; Thiel BL; Donald AM
Scanning; 2000; 22(6):357-65. PubMed ID: 11145261
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]