These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

130 related articles for article (PubMed ID: 16237923)

  • 1. Measurement system to determine the total and angle-resolved light scattering of optical components in the deep-ultraviolet and vacuum-ultraviolet spectral regions.
    Schröder S; Gliech S; Duparré A
    Appl Opt; 2005 Oct; 44(29):6093-107. PubMed ID: 16237923
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Light-scattering measurements of optical thin-film components at 157 and 193 nm.
    Gliech S; Steinert J; Duparré A
    Appl Opt; 2002 Jun; 41(16):3224-35. PubMed ID: 12064406
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Angle-resolved scattering and reflectance of extreme-ultraviolet multilayer coatings: measurement and analysis.
    Schröder S; Herffurth T; Trost M; Duparré A
    Appl Opt; 2010 Mar; 49(9):1503-12. PubMed ID: 20300144
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Instrument for close-to-process light scatter measurements of thin film coatings and substrates.
    von Finck A; Hauptvogel M; Duparré A
    Appl Opt; 2011 Mar; 50(9):C321-8. PubMed ID: 21460959
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayers.
    Trost M; Schröder S; Feigl T; Duparré A; Tünnermann A
    Appl Opt; 2011 Mar; 50(9):C148-53. PubMed ID: 21460930
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Nanoporous structure of a GdF(3) thin film evaluated by variable angle spectroscopic ellipsometry.
    Wang J; Maier R; Dewa PG; Schreiber H; Bellman RA; Elli DD
    Appl Opt; 2007 Jun; 46(16):3221-6. PubMed ID: 17514279
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Spectral angle resolved scattering of thin film coatings.
    Schröder S; Unglaub D; Trost M; Cheng X; Zhang J; Duparré A
    Appl Opt; 2014 Feb; 53(4):A35-41. PubMed ID: 24514238
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Bulk scattering properties of synthetic fused silica at 193 nm.
    Schröder S; Kamprath M; Duparré A; Tünnermann A; Kühn B; Klett U
    Opt Express; 2006 Oct; 14(22):10537-49. PubMed ID: 19529455
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Measurements and predictions of light scattering by clear coatings.
    McKnight ME; Vorburger TV; Marx E; Nadal ME; Barnes PY; Galler MA
    Appl Opt; 2001 May; 40(13):2159-68. PubMed ID: 18357223
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Light scattering characterization of single-layer nanoporous SiO
    Sekman Y; Felde N; Ghazaryan L; Szeghalmi A; Schröder S
    Appl Opt; 2020 Feb; 59(5):A143-A149. PubMed ID: 32225366
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Surface assessment of CaF2 deep-ultraviolet and vacuum-ultraviolet optical components by the quasi-Brewster angle technique.
    Wang J; Maier RL
    Appl Opt; 2006 Aug; 45(22):5621-8. PubMed ID: 16855659
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Scattering reduction through oblique multilayer deposition.
    Trost M; Herffurth T; Schröder S; Duparré A; Tünnermann A
    Appl Opt; 2014 Feb; 53(4):A197-204. PubMed ID: 24514215
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment.
    Elson JM; Bennett JM; Stover JC
    Appl Opt; 1993 Jul; 32(19):3362-76. PubMed ID: 20829955
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Wavelength dependence of angle-resolved scattering in the extreme-ultraviolet-visible region.
    Mattsson L; Ingers J; Bennett JM
    Appl Opt; 1994 Jun; 33(16):3523-32. PubMed ID: 20885738
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Spin-on-glass coatings for the generation of superpolished substrates for use in the extreme-ultraviolet region.
    Salmassi F; Naulleau PP; Gullikson EM
    Appl Opt; 2006 Apr; 45(11):2404-8. PubMed ID: 16623236
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Roughness evolution and scatter losses of multilayers for 193 nm optics.
    Schröder S; Duparré A; Tünnermann A
    Appl Opt; 2008 May; 47(13):C88-97. PubMed ID: 18449277
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Light scattering from glossy coatings on paper.
    Lettieri TR; Marx E; Song JF; Vorburger TV
    Appl Opt; 1991 Oct; 30(30):4439-47. PubMed ID: 20717222
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Angle-resolved scattering: an effective method for characterizing thin-film coatings.
    Schröder S; Herffurth T; Blaschke H; Duparré A
    Appl Opt; 2011 Mar; 50(9):C164-71. PubMed ID: 21460933
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Characterization of optical coatings using a multisource table-top scatterometer.
    von Finck A; Herffurth T; Schröder S; Duparré A; Sinzinger S
    Appl Opt; 2014 Feb; 53(4):A259-69. PubMed ID: 24514224
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Broadband wavelength and angle-resolved scattering characterization for nanophotonics investigations.
    Payne DN; Charlton MD; Bagnall DM
    Appl Opt; 2015 Aug; 54(24):7224-9. PubMed ID: 26368756
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.