351 related articles for article (PubMed ID: 16499552)
1. A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy.
Walther T
J Microsc; 2006 Feb; 221(Pt 2):137-44. PubMed ID: 16499552
[TBL] [Abstract][Full Text] [Related]
2. Experimental quantification of annular dark-field images in scanning transmission electron microscopy.
Lebeau JM; Stemmer S
Ultramicroscopy; 2008 Nov; 108(12):1653-8. PubMed ID: 18707809
[TBL] [Abstract][Full Text] [Related]
3. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.
Van Aert S; Verbeeck J; Erni R; Bals S; Luysberg M; Van Dyck D; Van Tendeloo G
Ultramicroscopy; 2009 Sep; 109(10):1236-44. PubMed ID: 19525069
[TBL] [Abstract][Full Text] [Related]
4. Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy.
Gu L; Sigle W; Koch CT; Nelayah J; Srot V; van Aken PA
Ultramicroscopy; 2009 Aug; 109(9):1164-70. PubMed ID: 19525066
[TBL] [Abstract][Full Text] [Related]
5. Contributions to the contrast in experimental high-angle annular dark-field images.
Klenov DO; Stemmer S
Ultramicroscopy; 2006; 106(10):889-901. PubMed ID: 16713091
[TBL] [Abstract][Full Text] [Related]
6. Quantification of sample thickness and in-concentration of InGaAs quantum wells by transmission measurements in a scanning electron microscope.
Volkenandt T; Müller E; Hu DZ; Schaadt DM; Gerthsen D
Microsc Microanal; 2010 Oct; 16(5):604-13. PubMed ID: 20633317
[TBL] [Abstract][Full Text] [Related]
7. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
Morgan DG; Ramasse QM; Browning ND
J Electron Microsc (Tokyo); 2009 Jun; 58(3):223-44. PubMed ID: 19297343
[TBL] [Abstract][Full Text] [Related]
8. Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.
Watanabe K; Kikuchi Y; Yamazaki T; Asano E; Nakanishi N; Kotaka Y; Okunishi E; Hashimoto I
Acta Crystallogr A; 2004 Nov; 60(Pt 6):591-7. PubMed ID: 15507742
[TBL] [Abstract][Full Text] [Related]
9. Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces.
Yu Z; Muller DA; Silcox J
Ultramicroscopy; 2008 Apr; 108(5):494-501. PubMed ID: 17920197
[TBL] [Abstract][Full Text] [Related]
10. Comparison of Si and Ge low-loss spectra to interpret the Ge contrast in EFTEM images of Si(1-x) Ge(x) nanostructures.
Pantel R; Cheynet MC; Tichelaar FD
Micron; 2006; 37(7):657-65. PubMed ID: 16529938
[TBL] [Abstract][Full Text] [Related]
11. Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.
Rosenauer A; Gries K; Müller K; Pretorius A; Schowalter M; Avramescu A; Engl K; Lutgen S
Ultramicroscopy; 2009 Aug; 109(9):1171-82. PubMed ID: 19497670
[TBL] [Abstract][Full Text] [Related]
12. Surface channeling in aberration-corrected scanning transmission electron microscopy of nanostructures.
Liu J; Allard LF
Microsc Microanal; 2010 Aug; 16(4):425-33. PubMed ID: 20598201
[TBL] [Abstract][Full Text] [Related]
13. Imaging, core-loss, and low-loss electron-energy-loss spectroscopy mapping in aberration-corrected STEM.
Lazar S; Shao Y; Gunawan L; Nechache R; Pignolet A; Botton GA
Microsc Microanal; 2010 Aug; 16(4):416-24. PubMed ID: 20598204
[TBL] [Abstract][Full Text] [Related]
14. IMAGE-WARP: a real-space restoration method for high-resolution STEM images using quantitative HRTEM analysis.
Recnik A; Möbus G; Sturm S
Ultramicroscopy; 2005 Jul; 103(4):285-301. PubMed ID: 15885433
[TBL] [Abstract][Full Text] [Related]
15. Nanocrystalline Domain Identification in Gold Films, by Backscattered Electron Imaging and Energy-Filtered Transmission Electron Microscopy.
Leite CA; Galembeck F
J Colloid Interface Sci; 2001 Mar; 235(1):4-8. PubMed ID: 11237437
[TBL] [Abstract][Full Text] [Related]
16. High-angle annular dark-field imaging on a TEM/STEM system.
Otten MT
J Electron Microsc Tech; 1991 Feb; 17(2):221-30. PubMed ID: 2013823
[TBL] [Abstract][Full Text] [Related]
17. Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) images.
Robb PD; Craven AJ
Ultramicroscopy; 2008 Dec; 109(1):61-9. PubMed ID: 18814971
[TBL] [Abstract][Full Text] [Related]
18. Role of surface amorphous film in high-resolution high-angle annular dark field STEM imaging.
Yamazaki T; Watanabe K; Nakanishi N; Hashimoto I
Ultramicroscopy; 2004 May; 99(2-3):125-35. PubMed ID: 15093939
[TBL] [Abstract][Full Text] [Related]
19. Evaluation and optimization of the performance of elastic and inelastic scanning transmission electron microscope imaging by correlation analysis.
Mory C; Bonnet N; Colliex C; Kohl H; Tencé M
Scanning Microsc Suppl; 1988; 2():329-42. PubMed ID: 3244971
[TBL] [Abstract][Full Text] [Related]
20. Composition mapping in InGaN by scanning transmission electron microscopy.
Rosenauer A; Mehrtens T; Müller K; Gries K; Schowalter M; Satyam PV; Bley S; Tessarek C; Hommel D; Sebald K; Seyfried M; Gutowski J; Avramescu A; Engl K; Lutgen S
Ultramicroscopy; 2011 Jul; 111(8):1316-27. PubMed ID: 21864772
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]