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30. Combined apertureless near-field optical second-harmonic generation/atomic force microscopy imaging and nanoscale limit of detection. Meyer KA; Ng KC; Gu Z; Pan Z; Whitten WB; Shaw RW Appl Spectrosc; 2010 Jan; 64(1):1-7. PubMed ID: 20132588 [TBL] [Abstract][Full Text] [Related]
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