These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

207 related articles for article (PubMed ID: 16756697)

  • 1. Stress characterization of Si by near-field Raman microscope using resonant scattering.
    Yoshikawa M; Murakami M
    Appl Spectrosc; 2006 May; 60(5):479-82. PubMed ID: 16756697
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy.
    Gigler AM; Huber AJ; Bauer M; Ziegler A; Hillenbrand R; Stark RW
    Opt Express; 2009 Dec; 17(25):22351-7. PubMed ID: 20052158
    [TBL] [Abstract][Full Text] [Related]  

  • 3. [Influence of strain in the Si cap layer of Si/SiGe heterostructure on its Raman spectra].
    Xiao QH; Tu HL
    Guang Pu Xue Yu Guang Pu Fen Xi; 2005 May; 25(5):719-22. PubMed ID: 16128072
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Enhanced first-order Raman scattering from arrays of vertical silicon nanowires.
    Khorasaninejad M; Walia J; Saini SS
    Nanotechnology; 2012 Jul; 23(27):275706. PubMed ID: 22710724
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Tip-enhanced near-field Raman spectroscopy with a scanning tunneling microscope and side-illumination optics.
    Yi KJ; He XN; Zhou YS; Xiong W; Lu YF
    Rev Sci Instrum; 2008 Jul; 79(7):073706. PubMed ID: 18681707
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Raman scattering by confined optical phonons in Si and Ge nanostructures.
    Alfaro P; Cisneros R; Bizarro M; Cruz-Irisson M; Wang C
    Nanoscale; 2011 Mar; 3(3):1246-51. PubMed ID: 21270988
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Uniaxial strain on graphene: Raman spectroscopy study and band-gap opening.
    Ni ZH; Yu T; Lu YH; Wang YY; Feng YP; Shen ZX
    ACS Nano; 2008 Nov; 2(11):2301-5. PubMed ID: 19206396
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Si nanorod length dependent surface Raman scattering linewidth broadening and peak shift.
    Lin GR; Lin YH; Pai YH; Meng FS
    Opt Express; 2011 Jan; 19(2):597-605. PubMed ID: 21263599
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Nanometer resolution stress measurement of the Si gate using illumination-collection-type scanning near-field Raman spectroscopy with a completely metal-inside-coated pyramidal probe.
    Hosaka S; Aramomi Y; Sone H; Yin Y; Sato E; Tochigi K
    Nanotechnology; 2011 Jan; 22(2):025206. PubMed ID: 21139190
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Confocal Raman microscopy to probe content uniformity of a lipid based powder for inhalation: a quality by design approach.
    Schoenherr C; Haefele T; Paulus K; Francese G
    Eur J Pharm Sci; 2009 Aug; 38(1):47-54. PubMed ID: 19501161
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Strain analysis of Si by FEM and energy-filtering CBED.
    Okuyama T; Nakayama M; Tomokiyo Y; Van Der Biest O
    Microsc Microanal; 2002 Feb; 8(1):11-5. PubMed ID: 12533199
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Stress microscopy and confocal Raman imaging of load-bearing surfaces in artificial hip joints.
    Pezzotti G
    Expert Rev Med Devices; 2007 Mar; 4(2):165-89. PubMed ID: 17359223
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Unique laser-scanning optical microscope for low-temperature imaging and spectroscopy.
    Zhang L; Aite S; Yu Z
    Rev Sci Instrum; 2007 Aug; 78(8):083701. PubMed ID: 17764323
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Highly efficient tip-enhanced Raman spectroscopy and microscopy of strained silicon.
    Tarun A; Hayazawa N; Motohashi M; Kawata S
    Rev Sci Instrum; 2008 Jan; 79(1):013706. PubMed ID: 18248038
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Lowest limit for detection of impurity concentration in semiconductors by fluorescence XAFS: resonant Raman scattering and angle dependence.
    Takeda Y; Ofuchi H; Kyouzu H; Takahashi R; Tabuchi M
    J Synchrotron Radiat; 2005 Jul; 12(Pt 4):494-8. PubMed ID: 15968128
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Efficient characterization for protein crystals using confocal Raman spectroscopy.
    Noda K; Sato H; Watanabe S; Yokoyama S; Tashiro H
    Appl Spectrosc; 2007 Jan; 61(1):11-8. PubMed ID: 17311710
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Determination of mechanical strength properties of hemp fibers using near-infrared fourier transform Raman microspectroscopy.
    Peetla P; Schenzel KC; Diepenbrock W
    Appl Spectrosc; 2006 Jun; 60(6):682-91. PubMed ID: 16808870
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Control of out-of-focus light intensity in confocal raman microscopy using optical preprocessing.
    Pelletier MJ
    Appl Spectrosc; 2009 Jun; 63(6):591-6. PubMed ID: 19531285
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Raman spectroscopy of Xenopus laevis oocytes.
    Rusciano G; Pesce G; Salemme M; Selvaggi L; Vaccaro C; Sasso A; Carotenuto R
    Methods; 2010 May; 51(1):27-36. PubMed ID: 20035873
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Silver nanocrystal-modified silicon nanowires as substrates for surface-enhanced Raman and hyper-Raman scattering.
    Leng W; Yasseri AA; Sharma S; Li Z; Woo HY; Vak D; Bazan GC; Kelley AM
    Anal Chem; 2006 Sep; 78(17):6279-82. PubMed ID: 16944914
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 11.