397 related articles for article (PubMed ID: 16872747)
1. Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmission electron microscopy.
Hirata A; Hirotsu Y; Nieh TG; Ohkubo T; Tanaka N
Ultramicroscopy; 2007; 107(2-3):116-23. PubMed ID: 16872747
[TBL] [Abstract][Full Text] [Related]
2. Study of amorphous alloy structures with medium range atomic ordering.
Hirotsu Y; Ohkubo T; Matsushita M
Microsc Res Tech; 1998 Feb; 40(4):284-312. PubMed ID: 9523762
[TBL] [Abstract][Full Text] [Related]
3. Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS.
Klie RF; Johnson C; Zhu Y
Microsc Microanal; 2008 Feb; 14(1):104-12. PubMed ID: 18171499
[TBL] [Abstract][Full Text] [Related]
4. The tuning of a Zernike phase plate with defocus and variable spherical aberration and its use in HRTEM imaging.
Lentzen M
Ultramicroscopy; 2004 Jun; 99(4):211-20. PubMed ID: 15149715
[TBL] [Abstract][Full Text] [Related]
5. Effect of a physical phase plate on contrast transfer in an aberration-corrected transmission electron microscope.
Gamm B; Schultheiss K; Gerthsen D; Schröder RR
Ultramicroscopy; 2008 Aug; 108(9):878-84. PubMed ID: 18456408
[TBL] [Abstract][Full Text] [Related]
6. Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.
Sasaki T; Sawada H; Hosokawa F; Kohno Y; Tomita T; Kaneyama T; Kondo Y; Kimoto K; Sato Y; Suenaga K
J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S7-13. PubMed ID: 20581425
[TBL] [Abstract][Full Text] [Related]
7. The structure of a metallic glass system using EXELFS and EXAFS as complementary probes.
Alamgir FM; Jain H; Williams DB; Schwarz RB
Micron; 2003; 34(8):433-9. PubMed ID: 14680930
[TBL] [Abstract][Full Text] [Related]
8. Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEM.
Linck M
Ultramicroscopy; 2013 Jan; 124():77-87. PubMed ID: 23142748
[TBL] [Abstract][Full Text] [Related]
9. Contrast transfer and resolution limits for sub-angstrom high-resolution transmission electron microscopy.
Lentzen M
Microsc Microanal; 2008 Feb; 14(1):16-26. PubMed ID: 18096097
[TBL] [Abstract][Full Text] [Related]
10. Atomic imaging in aberration-corrected high-resolution transmission electron microscopy.
Chen JH; Zandbergen HW; Dyck DV
Ultramicroscopy; 2004 Jan; 98(2-4):81-97. PubMed ID: 15046789
[TBL] [Abstract][Full Text] [Related]
11. Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction.
Lentzen M
Microsc Microanal; 2006 Jun; 12(3):191-205. PubMed ID: 17481356
[TBL] [Abstract][Full Text] [Related]
12. Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM.
Haider M; Müller H; Uhlemann S; Zach J; Loebau U; Hoeschen R
Ultramicroscopy; 2008 Feb; 108(3):167-78. PubMed ID: 18060700
[TBL] [Abstract][Full Text] [Related]
13. Direct UHV-TEM observation of palladium clusters on a silicon surface.
Takeguchi M; Mitsuishi K; Tanaka M; Furuya K
Microsc Microanal; 2004 Feb; 10(1):134-8. PubMed ID: 15306077
[TBL] [Abstract][Full Text] [Related]
14. Cs-corrected HAADF-STEM imaging of silicate minerals.
Kogure T; Okunishi E
J Electron Microsc (Tokyo); 2010; 59(4):263-71. PubMed ID: 20167574
[TBL] [Abstract][Full Text] [Related]
15. High-resolution transmission electron microscopy using negative spherical aberration.
Jia CL; Lentzen M; Urban K
Microsc Microanal; 2004 Apr; 10(2):174-84. PubMed ID: 15306044
[TBL] [Abstract][Full Text] [Related]
16. Optimized HREM imaging of objects supported by amorphous substrates using spherical aberration adjustment.
Allsop NA; Dobson PJ; Hutchison JL
J Microsc; 2006 Jul; 223(Pt 1):1-8. PubMed ID: 16872425
[TBL] [Abstract][Full Text] [Related]
17. Advantages of aberration correction for HRTEM investigation of complex layer compounds.
Spiecker E; Garbrecht M; Jäger W; Tillmann K
J Microsc; 2010 Mar; 237(3):341-6. PubMed ID: 20500393
[TBL] [Abstract][Full Text] [Related]
18. Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM.
Yamasaki J; Mori M; Hirata A; Hirotsu Y; Tanaka N
Ultramicroscopy; 2015 Apr; 151():224-231. PubMed ID: 25432326
[TBL] [Abstract][Full Text] [Related]
19. Direct sub-angstrom imaging of a crystal lattice.
Nellist PD; Chisholm MF; Dellby N; Krivanek OL; Murfitt MF; Szilagyi ZS; Lupini AR; Borisevich A; Sides WH; Pennycook SJ
Science; 2004 Sep; 305(5691):1741. PubMed ID: 15375260
[TBL] [Abstract][Full Text] [Related]
20. Effects of amorphous layers on ADF-STEM imaging.
Mkhoyan KA; Maccagnano-Zacher SE; Kirkland EJ; Silcox J
Ultramicroscopy; 2008 Jul; 108(8):791-803. PubMed ID: 18374489
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]