These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

144 related articles for article (PubMed ID: 16875782)

  • 1. Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy.
    van Benthem K; Lupini AR; Oxley MP; Findlay SD; Allen LJ; Pennycook SJ
    Ultramicroscopy; 2006; 106(11-12):1062-8. PubMed ID: 16875782
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Depth-dependent imaging of individual dopant atoms in silicon.
    Voyles PM; Muller DA; Kirkland EJ
    Microsc Microanal; 2004 Apr; 10(2):291-300. PubMed ID: 15306055
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
    D'Alfonso AJ; Cosgriff EC; Findlay SD; Behan G; Kirkland AI; Nellist PD; Allen LJ
    Ultramicroscopy; 2008 Nov; 108(12):1567-78. PubMed ID: 18617330
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Three-dimensional optical sectioning by scanning confocal electron microscopy with a stage-scanning system.
    Hashimoto A; Shimojo M; Mitsuishi K; Takeguchi M
    Microsc Microanal; 2010 Jun; 16(3):233-8. PubMed ID: 20350339
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy.
    D'Alfonso AJ; Findlay SD; Oxley MP; Pennycook SJ; van Benthem K; Allen LJ
    Ultramicroscopy; 2007 Dec; 108(1):17-28. PubMed ID: 17395376
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM.
    Xin HL; Muller DA
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):157-65. PubMed ID: 19164489
    [TBL] [Abstract][Full Text] [Related]  

  • 7. High-resolution transmission electron microscopy: the ultimate nanoanalytical technique.
    Thomas JM; Midgley PA
    Chem Commun (Camb); 2004 Jun; (11):1253-67. PubMed ID: 15154029
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
    Nellist PD; Cosgriff EC; Behan G; Kirkland AI
    Microsc Microanal; 2008 Feb; 14(1):82-8. PubMed ID: 18096098
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Imaging individual atoms inside crystals with ADF-STEM.
    Voyles PM; Grazul JL; Muller DA
    Ultramicroscopy; 2003 Sep; 96(3-4):251-73. PubMed ID: 12871793
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Seeing atoms with aberration-corrected sub-Angström electron microscopy.
    O'Keefe MA
    Ultramicroscopy; 2008 Feb; 108(3):196-209. PubMed ID: 18054170
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Electron microscopy at a sub-50 pm resolution.
    Takayanagi K; Kim S; Lee S; Oshima Y; Tanaka T; Tanishiro Y; Sawada H; Hosokawa F; Tomita T; Kaneyama T; Kondo Y
    J Electron Microsc (Tokyo); 2011; 60 Suppl 1():S239-44. PubMed ID: 21844593
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si.
    Voyles PM; Muller DA; Grazul JL; Citrin PH; Gossmann HJ
    Nature; 2002 Apr; 416(6883):826-9. PubMed ID: 11976677
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Three-dimensional atomic-scale structure of size-selected gold nanoclusters.
    Li ZY; Young NP; Di Vece M; Palomba S; Palmer RE; Bleloch AL; Curley BC; Johnston RL; Jiang J; Yuan J
    Nature; 2008 Jan; 451(7174):46-8. PubMed ID: 18066049
    [TBL] [Abstract][Full Text] [Related]  

  • 14. HRTEM imaging of atoms at sub-Angström resolution.
    O'Keefe MA; Allard LF; Blom DA
    J Electron Microsc (Tokyo); 2005 Jun; 54(3):169-80. PubMed ID: 16123071
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications.
    Kübel C; Voigt A; Schoenmakers R; Otten M; Su D; Lee TC; Carlsson A; Bradley J
    Microsc Microanal; 2005 Oct; 11(5):378-400. PubMed ID: 17481320
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Breaking the Crowther limit: combining depth-sectioning and tilt tomography for high-resolution, wide-field 3D reconstructions.
    Hovden R; Ercius P; Jiang Y; Wang D; Yu Y; Abruña HD; Elser V; Muller DA
    Ultramicroscopy; 2014 May; 140():26-31. PubMed ID: 24636875
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Characterizing the two- and three-dimensional resolution of an improved aberration-corrected STEM.
    Lupini AR; Borisevich AY; Idrobo JC; Christen HM; Biegalski M; Pennycook SJ
    Microsc Microanal; 2009 Oct; 15(5):441-53. PubMed ID: 19754980
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Sub-ångstrom resolution using aberration corrected electron optics.
    Batson PE; Dellby N; Krivanek OL
    Nature; 2002 Aug; 418(6898):617-20. PubMed ID: 12167855
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Limits in detecting an individual dopant atom embedded in a crystal.
    Mittal A; Mkhoyan KA
    Ultramicroscopy; 2011 Jul; 111(8):1101-10. PubMed ID: 21741341
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Three-dimensional characterization of drug-encapsulating particles using STEM detector in FEG-SEM.
    Barkay Z; Rivkin I; Margalit R
    Micron; 2009 Jun; 40(4):480-5. PubMed ID: 19167897
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.