These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
113 related articles for article (PubMed ID: 17207934)
1. Prospects for aberration corrected electron precession. Own CS; Sinkler W; Marks LD Ultramicroscopy; 2007; 107(6-7):534-42. PubMed ID: 17207934 [TBL] [Abstract][Full Text] [Related]
2. High-resolution TEM and the application of direct and indirect aberration correction. Hetherington CJ; Chang LY; Haigh S; Nellist PD; Gontard LC; Dunin-Borkowski RE; Kirkland AI Microsc Microanal; 2008 Feb; 14(1):60-7. PubMed ID: 18171500 [TBL] [Abstract][Full Text] [Related]
3. Progress and perspectives for atomic-resolution electron microscopy. Smith DJ Ultramicroscopy; 2008 Feb; 108(3):159-66. PubMed ID: 18054169 [TBL] [Abstract][Full Text] [Related]
4. Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction. Lentzen M Microsc Microanal; 2006 Jun; 12(3):191-205. PubMed ID: 17481356 [TBL] [Abstract][Full Text] [Related]
5. Development of aberration-corrected electron microscopy. Smith DJ Microsc Microanal; 2008 Feb; 14(1):2-15. PubMed ID: 18171498 [TBL] [Abstract][Full Text] [Related]
6. Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination. Avilov A; Kuligin K; Nicolopoulos S; Nickolskiy M; Boulahya K; Portillo J; Lepeshov G; Sobolev B; Collette JP; Martin N; Robins AC; Fischione P Ultramicroscopy; 2007; 107(6-7):431-44. PubMed ID: 17258859 [TBL] [Abstract][Full Text] [Related]
7. Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS. Klie RF; Johnson C; Zhu Y Microsc Microanal; 2008 Feb; 14(1):104-12. PubMed ID: 18171499 [TBL] [Abstract][Full Text] [Related]
8. Advances in atomic resolution in situ environmental transmission electron microscopy and 1A aberration corrected in situ electron microscopy. Gai PL; Boyes ED Microsc Res Tech; 2009 Mar; 72(3):153-64. PubMed ID: 19140163 [TBL] [Abstract][Full Text] [Related]
9. Electron crystallography: imaging and single-crystal diffraction from powders. Zou X; Hovmöller S Acta Crystallogr A; 2008 Jan; 64(Pt 1):149-60. PubMed ID: 18156680 [TBL] [Abstract][Full Text] [Related]
11. Electron holography with a Cs-corrected transmission electron microscope. Geiger D; Lichte H; Linck M; Lehmann M Microsc Microanal; 2008 Feb; 14(1):68-81. PubMed ID: 18096096 [TBL] [Abstract][Full Text] [Related]
12. Historical aspects of aberration correction. Rose HH J Electron Microsc (Tokyo); 2009 Jun; 58(3):77-85. PubMed ID: 19254915 [TBL] [Abstract][Full Text] [Related]
13. Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM. Haider M; Müller H; Uhlemann S; Zach J; Loebau U; Hoeschen R Ultramicroscopy; 2008 Feb; 108(3):167-78. PubMed ID: 18060700 [TBL] [Abstract][Full Text] [Related]
14. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit. Kisielowski C; Freitag B; Bischoff M; van Lin H; Lazar S; Knippels G; Tiemeijer P; van der Stam M; von Harrach S; Stekelenburg M; Haider M; Uhlemann S; Müller H; Hartel P; Kabius B; Miller D; Petrov I; Olson EA; Donchev T; Kenik EA; Lupini AR; Bentley J; Pennycook SJ; Anderson IM; Minor AM; Schmid AK; Duden T; Radmilovic V; Ramasse QM; Watanabe M; Erni R; Stach EA; Denes P; Dahmen U Microsc Microanal; 2008 Oct; 14(5):469-77. PubMed ID: 18793491 [TBL] [Abstract][Full Text] [Related]
15. High-resolution noncontact atomic force microscopy. Pérez R; García R; Schwarz U Nanotechnology; 2009 Jul; 20(26):260201. PubMed ID: 19531843 [TBL] [Abstract][Full Text] [Related]
16. Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM. Xin HL; Muller DA J Electron Microsc (Tokyo); 2009 Jun; 58(3):157-65. PubMed ID: 19164489 [TBL] [Abstract][Full Text] [Related]
18. First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM. Yamasaki J; Sawada H; Tanaka N J Electron Microsc (Tokyo); 2005 Apr; 54(2):123-6. PubMed ID: 15961407 [TBL] [Abstract][Full Text] [Related]
19. Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) images. Robb PD; Craven AJ Ultramicroscopy; 2008 Dec; 109(1):61-9. PubMed ID: 18814971 [TBL] [Abstract][Full Text] [Related]
20. Atomic-precision determination of the reconstruction of a 90 degree tilt boundary in YBa2Cu3O7-delta by aberration corrected HRTEM. Houben L; Thust A; Urban K Ultramicroscopy; 2006 Feb; 106(3):200-14. PubMed ID: 16226377 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]