These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

133 related articles for article (PubMed ID: 17230242)

  • 1. Closed equation for the normal incidence reflectance of thin films on absorbing substrates.
    Vargas WE; Castro D
    Appl Opt; 2007 Feb; 46(4):502-5. PubMed ID: 17230242
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Problem of ambiguity in the determination of optical constants of thin absorbing films from spectroscopic reflectance and transmittance measurements.
    Lamprecht K; Papousek W; Leising G
    Appl Opt; 1997 Sep; 36(25):6364-71. PubMed ID: 18259490
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Determination of optical parameters and thickness of weakly absorbing thin films from reflectance and transmittance spectra.
    Kutavichus VP; Filippov VV; Huzouski VH
    Appl Opt; 2006 Jul; 45(19):4547-53. PubMed ID: 16799663
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Optical method for heterogeneity analysis in thin absorbing films.
    Dolizy P; Groliere F
    Appl Opt; 1987 Jun; 26(12):2401-6. PubMed ID: 20489882
    [TBL] [Abstract][Full Text] [Related]  

  • 5. New approach to optical analysis of absorbing thin solid films.
    Demichelis F; Kaniadakis G; Tagliaferro A; Tresso E
    Appl Opt; 1987 May; 26(9):1737-40. PubMed ID: 20454398
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Determination of the optical constants (n and k) of inhomogeneous thin films with linear index profiles.
    Al-Kuhaili MF; Khawaja EE; Durrani SM
    Appl Opt; 2006 Jul; 45(19):4591-7. PubMed ID: 16799670
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Influence of gamma ray irradiation and annealing temperature on the optical constants and spectral dispersion parameters of metal-free and zinc tetraphenylporphyrin thin films: A comparative study.
    Zeyada HM; Makhlouf MM; El-Nahass MM
    Spectrochim Acta A Mol Biomol Spectrosc; 2015 Sep; 148():338-47. PubMed ID: 25911158
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Analytical method of determining optical constants of a weakly absorbing thin film.
    Zheng Y; Kikuchi K
    Appl Opt; 1997 Sep; 36(25):6325-8. PubMed ID: 18259484
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,R(m)) technique.
    Hjortsberg A
    Appl Opt; 1981 Apr; 20(7):1254-63. PubMed ID: 20309294
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Derivation of optical constants of metals from thin-film measurements at oblique incidence.
    Nestell JE; Christy RW
    Appl Opt; 1972 Mar; 11(3):643-51. PubMed ID: 20111561
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Synthesis, thermal behavior and optical characterizations of thin films of a novel thiazole azo dye and its copper complexes.
    Alotaibi SH; Radwan AS; Abdel-Monem YK; Makhlouf MM
    Spectrochim Acta A Mol Biomol Spectrosc; 2018 Dec; 205():364-375. PubMed ID: 30036804
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Determination of the fundamental absorption and optical bandgap of dielectric thin films from single optical transmittance measurements.
    Tejada A; Montañez L; Torres C; Llontop P; Flores L; De Zela F; Winnacker A; Guerra JA
    Appl Opt; 2019 Dec; 58(35):9585-9594. PubMed ID: 31873557
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Diffuse reflectance and transmittance spectra of an interference layer. 2. Evaluation of tin oxide-coated glass.
    Rönnow D; Roos A
    Appl Opt; 1994 Dec; 33(34):7918-27. PubMed ID: 20963006
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Spectral reflectance and transmittance of stacks of nonscattering films printed with halftone colors.
    Hébert M; Machizaud J
    J Opt Soc Am A Opt Image Sci Vis; 2012 Nov; 29(11):2498-508. PubMed ID: 23201813
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Characterization of thin films based on reflectance and transmittance measurements at oblique angles of incidence.
    Lamminpää A; Nevas S; Manoocheri F; Ikonen E
    Appl Opt; 2006 Mar; 45(7):1392-6. PubMed ID: 16539241
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials.
    Adamson P
    Appl Opt; 2011 Jun; 50(17):2773-83. PubMed ID: 21673783
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements.
    Peng C; Liang R; Erwin JK; Bletscher W; Nagata K; Mansuripur M
    Appl Opt; 2001 Oct; 40(28):5088-99. PubMed ID: 18364789
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Effect of substrate on radiative properties of thin films.
    Armaly BF; Look DC
    Appl Opt; 1973 Aug; 12(8):1904-8. PubMed ID: 20125629
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Optical factors in the photoemission of thin films.
    Ramberg EG
    Appl Opt; 1967 Dec; 6(12):2163-70. PubMed ID: 20062380
    [TBL] [Abstract][Full Text] [Related]  

  • 20. UNIFIED analytical formulation of thin-film radiative properties including partial coherence.
    Fu K; Hsu PF; Zhang ZM
    Appl Opt; 2006 Feb; 45(4):653-61. PubMed ID: 16485676
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.