123 related articles for article (PubMed ID: 17267131)
1. Automated three-dimensional X-ray analysis using a dual-beam FIB.
Schaffer M; Wagner J; Schaffer B; Schmied M; Mulders H
Ultramicroscopy; 2007 Aug; 107(8):587-97. PubMed ID: 17267131
[TBL] [Abstract][Full Text] [Related]
2. Two-dimensional and 3-dimensional analysis of bone/dental implant interfaces with the use of focused ion beam and electron microscopy.
Giannuzzi LA; Phifer D; Giannuzzi NJ; Capuano MJ
J Oral Maxillofac Surg; 2007 Apr; 65(4):737-47. PubMed ID: 17368372
[TBL] [Abstract][Full Text] [Related]
3. Tomographic Spectral Imaging with Multivariate Statistical Analysis: Comprehensive 3D Microanalysis.
Kotula PG; Keenan MR; Michael JR
Microsc Microanal; 2006 Feb; 12(1):36-48. PubMed ID: 17481340
[TBL] [Abstract][Full Text] [Related]
4. Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEM.
West GD; Thomson RC
J Microsc; 2009 Mar; 233(3):442-50. PubMed ID: 19250465
[TBL] [Abstract][Full Text] [Related]
5. Three-dimensional analysis of porous BaTiO3 ceramics using FIB nanotomography.
Holzer L; Indutnyi F; Gasser PH; Münch B; Wegmann M
J Microsc; 2004 Oct; 216(Pt 1):84-95. PubMed ID: 15369488
[TBL] [Abstract][Full Text] [Related]
6. Analysis of 3D elemental mapping artefacts in biological specimens using Monte Carlo simulation.
Scott K; Ritchie NW
J Microsc; 2009 Feb; 233(2):331-9. PubMed ID: 19220700
[TBL] [Abstract][Full Text] [Related]
7. Application of the dual-beam FIB/SEM to metals research.
Sivel VG; Van den Brand J; Wang WR; Mohdadi H; Tichelaar FD; Alkemade PF; Zandbergen HW
J Microsc; 2004 Jun; 214(Pt 3):237-45. PubMed ID: 15157191
[TBL] [Abstract][Full Text] [Related]
8. Quantification of subsurface damage in a brittle insulating ceramic by three-dimensional focused ion beam tomography.
Payraudeau N; McGrouther D; O'Kelly KU
Microsc Microanal; 2011 Apr; 17(2):240-5. PubMed ID: 21371371
[TBL] [Abstract][Full Text] [Related]
9. Observation of three-dimensional elemental distributions of a Si device using a 360 degrees -tilt FIB and the cold field-emission STEM system.
Yaguchi T; Konno M; Kamino T; Watanabe M
Ultramicroscopy; 2008 Nov; 108(12):1603-15. PubMed ID: 18715717
[TBL] [Abstract][Full Text] [Related]
10. Applications of the FIB lift-out technique for TEM specimen preparation.
Giannuzzi LA; Drown JL; Brown SR; Irwin RB; Stevie FA
Microsc Res Tech; 1998 May; 41(4):285-90. PubMed ID: 9633946
[TBL] [Abstract][Full Text] [Related]
11. 3D elemental and structural analysis of biological specimens using electrons and ions.
Scott K
J Microsc; 2011 Apr; 242(1):86-93. PubMed ID: 21118236
[TBL] [Abstract][Full Text] [Related]
12. Toward reproducible three-dimensional microstructure analysis of granular materials and complex suspensions.
Holzer L; Münch B
Microsc Microanal; 2009 Apr; 15(2):130-46. PubMed ID: 19284895
[TBL] [Abstract][Full Text] [Related]
13. Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture.
Schroeder-Reiter E; Pérez-Willard F; Zeile U; Wanner G
J Struct Biol; 2009 Feb; 165(2):97-106. PubMed ID: 19059341
[TBL] [Abstract][Full Text] [Related]
14. Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging.
De Winter DA; Schneijdenberg CT; Lebbink MN; Lich B; Verkleij AJ; Drury MR; Humbel BM
J Microsc; 2009 Mar; 233(3):372-83. PubMed ID: 19250458
[TBL] [Abstract][Full Text] [Related]
15. Quantitative energy dispersive X-ray microanalysis of electron beam-sensitive alloyed nanoparticles.
Braidy N; Jakubek ZJ; Simard B; Botton GA
Microsc Microanal; 2008 Apr; 14(2):166-75. PubMed ID: 18312719
[TBL] [Abstract][Full Text] [Related]
16. Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging.
Vincze L; Vekemans B; Brenker FE; Falkenberg G; Rickers K; Somogyi A; Kersten M; Adams F
Anal Chem; 2004 Nov; 76(22):6786-91. PubMed ID: 15538804
[TBL] [Abstract][Full Text] [Related]
17. Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel.
Yaguchi T; Matsumoto H; Kamino T; Ishitani T; Urao R
Microsc Microanal; 2001 May; 7(3):287-291. PubMed ID: 12597819
[TBL] [Abstract][Full Text] [Related]
18. Microstructural tomography of a Ni(70)Cr(20)Al(10) superalloy using focused ion beam microscopy.
Uchic MD; De Graef M; Wheeler R; Dimiduk DM
Ultramicroscopy; 2009 Sep; 109(10):1229-35. PubMed ID: 19523769
[TBL] [Abstract][Full Text] [Related]
19. Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors.
Dunin-Borkowski RE; Newcomb SB; Kasama T; McCartney MR; Weyland M; Midgley PA
Ultramicroscopy; 2005 Apr; 103(1):67-81. PubMed ID: 15777601
[TBL] [Abstract][Full Text] [Related]
20. Three-dimensional characterization of pigment dispersion in dried paint films using focused ion beam-scanning electron microscopy.
Lin JC; Heeschen W; Reffner J; Hook J
Microsc Microanal; 2012 Apr; 18(2):266-71. PubMed ID: 22293467
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]