These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

123 related articles for article (PubMed ID: 17267131)

  • 21. Quantitative electron holographic tomography for the 3D characterisation of semiconductor device structures.
    Twitchett-Harrison AC; Yates TJ; Dunin-Borkowski RE; Midgley PA
    Ultramicroscopy; 2008 Oct; 108(11):1401-7. PubMed ID: 18703284
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Methodology toward 3D micro X-ray fluorescence imaging using an energy dispersive charge-coupled device detector.
    Garrevoet J; Vekemans B; Tack P; De Samber B; Schmitz S; Brenker FE; Falkenberg G; Vincze L
    Anal Chem; 2014 Dec; 86(23):11826-32. PubMed ID: 25346101
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts.
    Ke X; Bals S; Cott D; Hantschel T; Bender H; Van Tendeloo G
    Microsc Microanal; 2010 Apr; 16(2):210-7. PubMed ID: 20187989
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Atom probe specimen preparation with a dual beam SEM/FIB miller.
    Miller MK; Russell KF
    Ultramicroscopy; 2007 Sep; 107(9):761-6. PubMed ID: 17403581
    [TBL] [Abstract][Full Text] [Related]  

  • 25. Location specific in situ TEM straining specimens made using FIB.
    Field RD; Papin PA
    Ultramicroscopy; 2004 Dec; 102(1):23-6. PubMed ID: 15556697
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Searching ultimate nanometrology for AlOx thickness in magnetic tunnel junction by analytical electron microscopy and X-ray reflectometry.
    Song SA; Hirano T; Park JB; Kaji K; Kim KH; Terada S
    Microsc Microanal; 2005 Oct; 11(5):431-45. PubMed ID: 17481324
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Quantitative HRTEM analysis of FIB prepared specimens.
    Baram M; Kaplan WD
    J Microsc; 2008 Dec; 232(3):395-405. PubMed ID: 19094016
    [TBL] [Abstract][Full Text] [Related]  

  • 28. Infrared spectroscopic and electron microscopic characterization of gold nanogap structure fabricated by focused ion beam.
    Han G; Weber D; Neubrech F; Yamada I; Mitome M; Bando Y; Pucci A; Nagao T
    Nanotechnology; 2011 Jul; 22(27):275202. PubMed ID: 21597137
    [TBL] [Abstract][Full Text] [Related]  

  • 29. New insight into the solid electrolyte interphase with use of a focused ion beam.
    Zhang HL; Li F; Liu C; Tan J; Cheng HM
    J Phys Chem B; 2005 Dec; 109(47):22205-11. PubMed ID: 16853890
    [TBL] [Abstract][Full Text] [Related]  

  • 30. Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique.
    Lomness JK; Giannuzzi LA; Hampton MD
    Microsc Microanal; 2001 Sep; 7(5):418-423. PubMed ID: 12597804
    [TBL] [Abstract][Full Text] [Related]  

  • 31. Three-dimensional characterization of ODS ferritic steel using by FIB-SEM serial sectioning method.
    Endo T; Sugino Y; Ohono N; Ukai S; Miyazaki N; Wang Y; Ohnuki S
    Microscopy (Oxf); 2014 Nov; 63 Suppl 1():i23. PubMed ID: 25359819
    [TBL] [Abstract][Full Text] [Related]  

  • 32. Three-dimensional electron microscopy of individual nanoparticles.
    Jarausch K; Leonard DN
    J Electron Microsc (Tokyo); 2009 Jun; 58(3):175-83. PubMed ID: 19109568
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Three-dimensional surface topography acquisition and analysis for firearm identification.
    Senin N; Groppetti R; Garofano L; Fratini P; Pierni M
    J Forensic Sci; 2006 Mar; 51(2):282-95. PubMed ID: 16566761
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Automated high-resolution three-dimensional fluorescence imaging of large biological specimens.
    Kazakia GJ; Lee JJ; Singh M; Bigley RF; Martin RB; Keaveny TM
    J Microsc; 2007 Feb; 225(Pt 2):109-17. PubMed ID: 17359245
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Diffraction-based automated crystal centering.
    Song J; Mathew D; Jacob SA; Corbett L; Moorhead P; Soltis SM
    J Synchrotron Radiat; 2007 Mar; 14(Pt 2):191-5. PubMed ID: 17317920
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Confocal full-field X-ray microscope for novel three-dimensional X-ray imaging.
    Takeuchi A; Terada Y; Suzuki Y; Uesugi K; Aoki S
    J Synchrotron Radiat; 2009 Sep; 16(Pt 5):616-21. PubMed ID: 19713634
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary.
    Pérez-Willard F; Wolde-Giorgis D; Al-Kassab T; López GA; Mittemeijer EJ; Kirchheim R; Gerthsen D
    Micron; 2008; 39(1):45-52. PubMed ID: 17331735
    [TBL] [Abstract][Full Text] [Related]  

  • 38. Three-dimensional microscopic elemental analysis using an automated high-precision serial sectioning system.
    Fujisaki K; Yokota H; Furushiro N; Komatani S; Ohzawa S; Sato Y; Matsunaga D; Himeno R; Higuchi T; Makinouchi A
    Microsc Microanal; 2011 Apr; 17(2):246-51. PubMed ID: 21362208
    [TBL] [Abstract][Full Text] [Related]  

  • 39. STEM image simulation by Bloch-wave method with layer-by-layer representation.
    Morimura T
    J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S23-8. PubMed ID: 20573745
    [TBL] [Abstract][Full Text] [Related]  

  • 40. Imaging thin films of nanoporous low-k dielectrics: comparison between ultramicrotomy and focused ion beam preparations for transmission electron microscopy.
    Thompson LE; Rice PM; Delenia E; Lee VY; Brock PJ; Magbitang TP; Dubois G; Volksen W; Miller RD; Kim HC
    Microsc Microanal; 2006 Apr; 12(2):156-9. PubMed ID: 17481352
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 7.