These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
188 related articles for article (PubMed ID: 17303619)
41. Direct measurement of cantilever spring constants and correction for cantilever irregularities using an instrumented indenter. Ying ZC; Reitsma MG; Gates RS Rev Sci Instrum; 2007 Jun; 78(6):063708. PubMed ID: 17614617 [TBL] [Abstract][Full Text] [Related]
42. Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties. Boudaoud M; Haddab Y; Le Gorrec Y; Lutz P Rev Sci Instrum; 2012 Jan; 83(1):013704. PubMed ID: 22299959 [TBL] [Abstract][Full Text] [Related]
43. Atomic force microscopy: loading position dependence of cantilever spring constants and detector sensitivity. Vakarelski IU; Edwards SA; Dagastine RR; Chan DY; Stevens GW; Grieser F Rev Sci Instrum; 2007 Nov; 78(11):116102. PubMed ID: 18052510 [TBL] [Abstract][Full Text] [Related]
44. Experimental determination of mode correction factors for thermal method spring constant calibration of AFM cantilevers using laser Doppler vibrometry. Gates RS; Osborn WA; Pratt JR Nanotechnology; 2013 Jun; 24(25):255706. PubMed ID: 23723188 [TBL] [Abstract][Full Text] [Related]
45. Effect of cantilevers' dimensions on phase contrast in multifrequency atomic force microscopy. Ehsanipour M; Damircheli M; Eslami B Microsc Res Tech; 2019 Sep; 82(9):1438-1447. PubMed ID: 31106947 [TBL] [Abstract][Full Text] [Related]
46. Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope. Barkley SS; Deng Z; Gates RS; Reitsma MG; Cannara RJ Rev Sci Instrum; 2012 Feb; 83(2):023707. PubMed ID: 22380099 [TBL] [Abstract][Full Text] [Related]
48. Application of triangular atomic force microscopy cantilevers to friction measurement with the improved parallel scan method. Wang YL; Zhao XZ Rev Sci Instrum; 2009 Feb; 80(2):023704. PubMed ID: 19256650 [TBL] [Abstract][Full Text] [Related]
49. Design of V-shaped cantilevers for enhanced multifrequency AFM measurements. Damircheli M; Eslami B Beilstein J Nanotechnol; 2020; 11():1525-1541. PubMed ID: 33094086 [TBL] [Abstract][Full Text] [Related]
50. Variations in properties of atomic force microscope cantilevers fashioned from the same wafer. Webber GB; Stevens GW; Grieser F; Dagastine RR; Chan DY Nanotechnology; 2008 Mar; 19(10):105709. PubMed ID: 21817717 [TBL] [Abstract][Full Text] [Related]
51. Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy. Tran Khac BC; Chung KH Ultramicroscopy; 2016 Feb; 161():41-50. PubMed ID: 26624514 [TBL] [Abstract][Full Text] [Related]
52. Calibration of the torsional and lateral spring constants of cantilever sensors. Parkin JD; Hähner G Nanotechnology; 2014 Jun; 25(22):225701. PubMed ID: 24807706 [TBL] [Abstract][Full Text] [Related]
53. Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire. Zhang G; Li P; Wei D; Hu K; Qiu X Nanotechnology; 2020 Nov; 31(47):475703. PubMed ID: 32885790 [TBL] [Abstract][Full Text] [Related]
54. Dimensions and spring constants of rectangular AFM cantilevers determined from resonance measurements. Flores-Ruiz FJ; Garcia-Vazquez V Rev Sci Instrum; 2019 Feb; 90(2):023703. PubMed ID: 30831765 [TBL] [Abstract][Full Text] [Related]
55. Calibration of silicon atomic force microscope cantilevers. Gibson CT; Alastair Smith D; Roberts CJ Nanotechnology; 2005 Feb; 16(2):234-8. PubMed ID: 21727428 [TBL] [Abstract][Full Text] [Related]
56. Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope. Sader JE; Lu J; Mulvaney P Rev Sci Instrum; 2014 Nov; 85(11):113702. PubMed ID: 25430115 [TBL] [Abstract][Full Text] [Related]
57. Finite-element vibration analysis of tapping-mode atomic force microscopy in liquid. Song Y; Bhushan B Ultramicroscopy; 2007 Oct; 107(10-11):1095-104. PubMed ID: 17566661 [TBL] [Abstract][Full Text] [Related]
58. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI. Cumpson PJ; Hedley J Nanotechnology; 2003 Dec; 14(12):1279-88. PubMed ID: 21444981 [TBL] [Abstract][Full Text] [Related]
59. Note: Determination of torsional spring constant of atomic force microscopy cantilevers: combining normal spring constant and classical beam theory. Álvarez-Asencio R; Thormann E; Rutland MW Rev Sci Instrum; 2013 Sep; 84(9):096102. PubMed ID: 24089877 [TBL] [Abstract][Full Text] [Related]