555 related articles for article (PubMed ID: 17330040)
1. Chemical identification of individual surface atoms by atomic force microscopy.
Sugimoto Y; Pou P; Abe M; Jelinek P; Pérez R; Morita S; Custance O
Nature; 2007 Mar; 446(7131):64-7. PubMed ID: 17330040
[TBL] [Abstract][Full Text] [Related]
2. High-resolution noncontact atomic force microscopy.
Pérez R; García R; Schwarz U
Nanotechnology; 2009 Jul; 20(26):260201. PubMed ID: 19531843
[TBL] [Abstract][Full Text] [Related]
3. Structure and stability of semiconductor tip apexes for atomic force microscopy.
Pou P; Ghasemi SA; Jelinek P; Lenosky T; Goedecker S; Perez R
Nanotechnology; 2009 Jul; 20(26):264015. PubMed ID: 19509446
[TBL] [Abstract][Full Text] [Related]
4. Manipulation of atoms across a surface at room temperature.
Fishlock TW; Oral A; Egdell RG; Pethica JB
Nature; 2000 Apr; 404(6779):743-5. PubMed ID: 10783883
[TBL] [Abstract][Full Text] [Related]
5. Magnetic exchange force microscopy with atomic resolution.
Kaiser U; Schwarz A; Wiesendanger R
Nature; 2007 Mar; 446(7135):522-5. PubMed ID: 17392782
[TBL] [Abstract][Full Text] [Related]
6. The chemical structure of a molecule resolved by atomic force microscopy.
Gross L; Mohn F; Moll N; Liljeroth P; Meyer G
Science; 2009 Aug; 325(5944):1110-4. PubMed ID: 19713523
[TBL] [Abstract][Full Text] [Related]
7. Nanoscale quantitative measurement of the potential of charged nanostructures by electrostatic and Kelvin probe force microscopy: unraveling electronic processes in complex materials.
Liscio A; Palermo V; Samorì P
Acc Chem Res; 2010 Apr; 43(4):541-50. PubMed ID: 20058907
[TBL] [Abstract][Full Text] [Related]
8. Two-electron dissociation of single molecules by atomic manipulation at room temperature.
Sloan PA; Palmer RE
Nature; 2005 Mar; 434(7031):367-71. PubMed ID: 15772657
[TBL] [Abstract][Full Text] [Related]
9. Atom inlays performed at room temperature using atomic force microscopy.
Sugimoto Y; Abe M; Hirayama S; Oyabu N; Custance O; Morita S
Nat Mater; 2005 Feb; 4(2):156-9. PubMed ID: 15654346
[TBL] [Abstract][Full Text] [Related]
10. Measuring site-specific cluster-surface bond formation.
Hoffmann R; Barth C; Foster AS; Shluger AL; Hug HJ; Güntherodt HJ; Nieminen RM; Reichling M
J Am Chem Soc; 2005 Dec; 127(50):17863-6. PubMed ID: 16351117
[TBL] [Abstract][Full Text] [Related]
11. The force needed to move an atom on a surface.
Ternes M; Lutz CP; Hirjibehedin CF; Giessibl FJ; Heinrich AJ
Science; 2008 Feb; 319(5866):1066-9. PubMed ID: 18292336
[TBL] [Abstract][Full Text] [Related]
12. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy.
Albers BJ; Liebmann M; Schwendemann TC; Baykara MZ; Heyde M; Salmeron M; Altman EI; Schwarz UD
Rev Sci Instrum; 2008 Mar; 79(3):033704. PubMed ID: 18377012
[TBL] [Abstract][Full Text] [Related]
13. Imaging and dynamics of light atoms and molecules on graphene.
Meyer JC; Girit CO; Crommie MF; Zettl A
Nature; 2008 Jul; 454(7202):319-22. PubMed ID: 18633414
[TBL] [Abstract][Full Text] [Related]
14. Reversal of atomic contrast in scanning probe microscopy on (111) metal surfaces.
Ondráček M; González C; Jelínek P
J Phys Condens Matter; 2012 Feb; 24(8):084003. PubMed ID: 22310019
[TBL] [Abstract][Full Text] [Related]
15. Quantitative measurement of short-range chemical bonding forces.
Lantz MA; Hug HJ; Hoffmann R; van Schendel PJ; Kappenberger P; Martin S; Baratoff A; Güntherodt HJ
Science; 2001 Mar; 291(5513):2580-3. PubMed ID: 11283365
[TBL] [Abstract][Full Text] [Related]
16. Application of atomic force microscopy to the study of natural and model soil particles.
Cheng S; Bryant R; Doerr SH; Rhodri Williams P; Wright CJ
J Microsc; 2008 Sep; 231(3):384-94. PubMed ID: 18754993
[TBL] [Abstract][Full Text] [Related]
17. Complex patterning by vertical interchange atom manipulation using atomic force microscopy.
Sugimoto Y; Pou P; Custance O; Jelinek P; Abe M; Perez R; Morita S
Science; 2008 Oct; 322(5900):413-7. PubMed ID: 18927388
[TBL] [Abstract][Full Text] [Related]
18. Electrostatic force spectroscopy on insulating surfaces: the effect of capacitive interaction.
Takagi A; Yamada F; Matsumoto T; Kawai T
Nanotechnology; 2009 Sep; 20(36):365501. PubMed ID: 19687559
[TBL] [Abstract][Full Text] [Related]
19. An atomic force microscope tip designed to measure time-varying nanomechanical forces.
Sahin O; Magonov S; Su C; Quate CF; Solgaard O
Nat Nanotechnol; 2007 Aug; 2(8):507-14. PubMed ID: 18654349
[TBL] [Abstract][Full Text] [Related]
20. Atomic-resolution three-dimensional force and damping maps of carbon nanotube peapods.
Ashino M; Obergfell D; Haluska M; Yang S; Khlobystov AN; Roth S; Wiesendanger R
Nanotechnology; 2009 Jul; 20(26):264001. PubMed ID: 19509450
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
