These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

112 related articles for article (PubMed ID: 17411228)

  • 1. High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method.
    Keckes J; Eiper E; Martinschitz KJ; Köstenbauer H; Daniel R; Mitterer C
    Rev Sci Instrum; 2007 Mar; 78(3):036103. PubMed ID: 17411228
    [TBL] [Abstract][Full Text] [Related]  

  • 2. High-throughput analysis of thin-film stresses using arrays of micromachined cantilever beams.
    Kim HJ; Han JH; Kaiser R; Oh KH; Vlassak JJ
    Rev Sci Instrum; 2008 Apr; 79(4):045112. PubMed ID: 18447557
    [TBL] [Abstract][Full Text] [Related]  

  • 3. In situ investigation of thermally influenced phase transformations in (Pb 0.92 Sr 0.08)(Zr 0.65 Ti 0.35)O3 thin films using micro-Raman spectroscopy and X-ray diffraction.
    Sriram S; Bhaskaran M; Perova TS; Melnikov VA; Holland AS
    IEEE Trans Ultrason Ferroelectr Freq Control; 2009 Feb; 56(2):241-5. PubMed ID: 19251510
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Thermal expansion coefficient and thermomechanical properties of SiN(x) thin films prepared by plasma-enhanced chemical vapor deposition.
    Tien CL; Lin TW
    Appl Opt; 2012 Oct; 51(30):7229-35. PubMed ID: 23089776
    [TBL] [Abstract][Full Text] [Related]  

  • 5. High-throughput characterization of stresses in thin film materials libraries using Si cantilever array wafers and digital holographic microscopy.
    Lai YW; Hamann S; Ehmann M; Ludwig A
    Rev Sci Instrum; 2011 Jun; 82(6):063903. PubMed ID: 21721705
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Structural evolution of nanocrystalline silicon thin films synthesized in high-density, low-temperature reactive plasmas.
    Cheng Q; Xu S; Ostrikov KK
    Nanotechnology; 2009 May; 20(21):215606. PubMed ID: 19423937
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Nano-polycrystalline vanadium oxide thin films prepared by pulsed laser deposition.
    Wang YL; Li MC; Chen XK; Wu G; Yang JP; Wang R; Zhao LC
    J Nanosci Nanotechnol; 2008 May; 8(5):2604-8. PubMed ID: 18572691
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Influence of substrate orientation on the morphology and orientation of LaNiO3 thin films.
    Pocuca M; Branković Z; Branković G; Vasiljević-Radović D
    J Microsc; 2008 Dec; 232(3):585-8. PubMed ID: 19094043
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Nanomechanical characterization of multilayered thin film structures for digital micromirror devices.
    Wei G; Bhushan B; Joshua Jacobs S
    Ultramicroscopy; 2004 Aug; 100(3-4):375-89. PubMed ID: 15231331
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Quantifying residual stress in nanoscale thin polymer films via surface wrinkling.
    Chung JY; Chastek TQ; Fasolka MJ; Ro HW; Stafford CM
    ACS Nano; 2009 Apr; 3(4):844-52. PubMed ID: 19298053
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Residual stresses of sputtering titanium thin films at various substrate temperatures.
    Chang RC; Chen FY; Chuang CT; Tung YC
    J Nanosci Nanotechnol; 2010 Jul; 10(7):4562-7. PubMed ID: 21128457
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Full-field measurement of nonuniform stresses of thin films at high temperature.
    Dong X; Feng X; Hwang KC; Ma S; Ma Q
    Opt Express; 2011 Jul; 19(14):13201-8. PubMed ID: 21747475
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Thermal conductivity measurement of thin films by a dc method.
    Yang J; Zhang J; Zhang H; Zhu Y
    Rev Sci Instrum; 2010 Nov; 81(11):114902. PubMed ID: 21133491
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Structural and ferromagnetic properties of epitaxial SrRuO3 thin films obtained by polymer-assisted deposition.
    Luo HM; Jain M; Baily SA; McCleskey TM; Burrell AK; Bauer E; DePaula RF; Dowden PC; Civale L; Jia QX
    J Phys Chem B; 2007 Jul; 111(26):7497-500. PubMed ID: 17571878
    [TBL] [Abstract][Full Text] [Related]  

  • 15. In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon.
    Bhaskaran M; Sriram S; Perova TS; Ermakov V; Thorogood GJ; Short KT; Holland AS
    Micron; 2009 Jan; 40(1):89-93. PubMed ID: 18467110
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Cathodoluminescence investigation of residual stress in Er3+:YAlO3 thin films grown on (110) SrTiO3 substrate by metal-organic chemical vapor deposition.
    Toro RG; Malandrino G; Fragalà IL; Keshu W; Leto A; Pezzotti G
    J Phys Chem B; 2006 Nov; 110(47):23977-81. PubMed ID: 17125366
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction.
    Bürgi J; Neuenschwander R; Kellermann G; García Molleja J; Craievich AF; Feugeas J
    Rev Sci Instrum; 2013 Jan; 84(1):015102. PubMed ID: 23387690
    [TBL] [Abstract][Full Text] [Related]  

  • 18. The coherent gradient sensor for film curvature measurements at cryogenic temperature.
    Liu C; Zhang X; Zhou J; Zhou Y; Feng X
    Opt Express; 2013 Nov; 21(22):26352-62. PubMed ID: 24216858
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Anodization of Ti thin film deposited on ITO.
    Sadek AZ; Zheng H; Latham K; Wlodarski W; Kalantar-Zadeh K
    Langmuir; 2009 Jan; 25(1):509-14. PubMed ID: 19053619
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Absolute measurement of lattice parameter in single crystals and epitaxic layers on a double-crystal X-ray diffractometer.
    Fatemi M
    Acta Crystallogr A; 2005 May; 61(Pt 3):301-13. PubMed ID: 15846033
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 6.