These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

253 related articles for article (PubMed ID: 17477664)

  • 1. Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy.
    Wang F; Zhao X
    Rev Sci Instrum; 2007 Apr; 78(4):043701. PubMed ID: 17477664
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Lateral force microscope calibration using a modified atomic force microscope cantilever.
    Reitsma MG
    Rev Sci Instrum; 2007 Oct; 78(10):106102. PubMed ID: 17979458
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Application of triangular atomic force microscopy cantilevers to friction measurement with the improved parallel scan method.
    Wang YL; Zhao XZ
    Rev Sci Instrum; 2009 Feb; 80(2):023704. PubMed ID: 19256650
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Corrected direct force balance method for atomic force microscopy lateral force calibration.
    Asay DB; Hsiao E; Kim SH
    Rev Sci Instrum; 2009 Jun; 80(6):066101. PubMed ID: 19566229
    [TBL] [Abstract][Full Text] [Related]  

  • 5. A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films.
    Brunner R; Etsion I; Talke FE
    Rev Sci Instrum; 2009 May; 80(5):055109. PubMed ID: 19485536
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Calibration of atomic force microscope cantilevers using piezolevers.
    Aksu SB; Turner JA
    Rev Sci Instrum; 2007 Apr; 78(4):043704. PubMed ID: 17477667
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Improved parallel scan method for nanofriction force measurement with atomic force microscopy.
    Wang YL; Zhao XZ; Zhou FQ
    Rev Sci Instrum; 2007 Mar; 78(3):036107. PubMed ID: 17411232
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Lateral force calibration: accurate procedures for colloidal probe friction measurements in atomic force microscopy.
    Chung KH; Pratt JR; Reitsma MG
    Langmuir; 2010 Jan; 26(2):1386-94. PubMed ID: 19827782
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Liquid microdroplet sliding on hydrophobic surfaces in the presence of an electric field.
    Wang Y; Bhushan B
    Langmuir; 2010 Mar; 26(6):4013-7. PubMed ID: 20214393
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Improved lateral force calibration based on the angle conversion factor in atomic force microscopy.
    Choi D; Hwang W; Yoon E
    J Microsc; 2007 Nov; 228(Pt 2):190-9. PubMed ID: 17970919
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy.
    Chung KH; Shaw GA; Pratt JR
    Rev Sci Instrum; 2009 Jun; 80(6):065107. PubMed ID: 19566226
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Calibration of friction force signals in atomic force microscopy in liquid media.
    Tocha E; Song J; Schönherr H; Vancso GJ
    Langmuir; 2007 Jun; 23(13):7078-82. PubMed ID: 17530787
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.
    Xie H; Vitard J; Haliyo S; Régnier S; Boukallel M
    Rev Sci Instrum; 2008 Mar; 79(3):033708. PubMed ID: 18377016
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Prototype cantilevers for quantitative lateral force microscopy.
    Reitsma MG; Gates RS; Friedman LH; Cook RF
    Rev Sci Instrum; 2011 Sep; 82(9):093706. PubMed ID: 21974593
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.
    Sahin O
    Rev Sci Instrum; 2007 Oct; 78(10):103707. PubMed ID: 17979428
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Quantitative nanotribology by AFM: a novel universal calibration platform.
    Tocha E; Schönherr H; Vancso GJ
    Langmuir; 2006 Feb; 22(5):2340-50. PubMed ID: 16489827
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Shape-independent lateral force calibration.
    Anderson EV; Chakraborty S; Esformes T; Eggiman D; Degraf C; Stevens KM; Liu D; Burnham NA
    ACS Appl Mater Interfaces; 2011 Sep; 3(9):3256-60. PubMed ID: 21854001
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.
    Gates RS; Reitsma MG
    Rev Sci Instrum; 2007 Aug; 78(8):086101. PubMed ID: 17764361
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Velocity dependent friction laws in contact mode atomic force microscopy.
    Stark RW; Schitter G; Stemmer A
    Ultramicroscopy; 2004 Aug; 100(3-4):309-17. PubMed ID: 15231324
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Topography imaging with a heated atomic force microscope cantilever in tapping mode.
    Park K; Lee J; Zhang ZM; King WP
    Rev Sci Instrum; 2007 Apr; 78(4):043709. PubMed ID: 17477672
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 13.