678 related articles for article (PubMed ID: 17481356)
21. Effect of a physical phase plate on contrast transfer in an aberration-corrected transmission electron microscope.
Gamm B; Schultheiss K; Gerthsen D; Schröder RR
Ultramicroscopy; 2008 Aug; 108(9):878-84. PubMed ID: 18456408
[TBL] [Abstract][Full Text] [Related]
22. Contrast mechanisms and image formation in helium ion microscopy.
Bell DC
Microsc Microanal; 2009 Apr; 15(2):147-53. PubMed ID: 19284896
[TBL] [Abstract][Full Text] [Related]
23. Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.
Inada H; Wu L; Wall J; Su D; Zhu Y
J Electron Microsc (Tokyo); 2009 Jun; 58(3):111-22. PubMed ID: 19254916
[TBL] [Abstract][Full Text] [Related]
24. Aberration-corrected multipole Wien filter for energy-filtered x-ray photoemission electron microscopy.
Niimi H; Chun WJ; Suzuki S; Asakura K; Kato M
Rev Sci Instrum; 2007 Jun; 78(6):063710. PubMed ID: 17614619
[TBL] [Abstract][Full Text] [Related]
25. Electron holography with a Cs-corrected transmission electron microscope.
Geiger D; Lichte H; Linck M; Lehmann M
Microsc Microanal; 2008 Feb; 14(1):68-81. PubMed ID: 18096096
[TBL] [Abstract][Full Text] [Related]
26. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit.
Kisielowski C; Freitag B; Bischoff M; van Lin H; Lazar S; Knippels G; Tiemeijer P; van der Stam M; von Harrach S; Stekelenburg M; Haider M; Uhlemann S; Müller H; Hartel P; Kabius B; Miller D; Petrov I; Olson EA; Donchev T; Kenik EA; Lupini AR; Bentley J; Pennycook SJ; Anderson IM; Minor AM; Schmid AK; Duden T; Radmilovic V; Ramasse QM; Watanabe M; Erni R; Stach EA; Denes P; Dahmen U
Microsc Microanal; 2008 Oct; 14(5):469-77. PubMed ID: 18793491
[TBL] [Abstract][Full Text] [Related]
27. Direct imaging of local atomic ordering in a Pd-Ni-P bulk metallic glass using Cs-corrected transmission electron microscopy.
Hirata A; Hirotsu Y; Nieh TG; Ohkubo T; Tanaka N
Ultramicroscopy; 2007; 107(2-3):116-23. PubMed ID: 16872747
[TBL] [Abstract][Full Text] [Related]
28. Atomic-precision determination of the reconstruction of a 90 degree tilt boundary in YBa2Cu3O7-delta by aberration corrected HRTEM.
Houben L; Thust A; Urban K
Ultramicroscopy; 2006 Feb; 106(3):200-14. PubMed ID: 16226377
[TBL] [Abstract][Full Text] [Related]
29. Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
Cosgriff EC; D'Alfonso AJ; Allen LJ; Findlay SD; Kirkland AI; Nellist PD
Ultramicroscopy; 2008 Nov; 108(12):1558-66. PubMed ID: 18639381
[TBL] [Abstract][Full Text] [Related]
30. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.
Sawada H; Tanishiro Y; Ohashi N; Tomita T; Hosokawa F; Kaneyama T; Kondo Y; Takayanagi K
J Electron Microsc (Tokyo); 2009 Dec; 58(6):357-61. PubMed ID: 19546144
[TBL] [Abstract][Full Text] [Related]
31. Characterizing the two- and three-dimensional resolution of an improved aberration-corrected STEM.
Lupini AR; Borisevich AY; Idrobo JC; Christen HM; Biegalski M; Pennycook SJ
Microsc Microanal; 2009 Oct; 15(5):441-53. PubMed ID: 19754980
[TBL] [Abstract][Full Text] [Related]
32. A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM.
Yamasaki J; Kawai T; Tanaka N
J Electron Microsc (Tokyo); 2005 Jun; 54(3):209-14. PubMed ID: 16123057
[TBL] [Abstract][Full Text] [Related]
33. Physical limits on atomic resolution.
Van Dyck D; Van Aert S; den Dekker AJ
Microsc Microanal; 2004 Feb; 10(1):153-7. PubMed ID: 15306080
[TBL] [Abstract][Full Text] [Related]
34. Atomic resolution imaging of oxygen atoms close to heavy atoms by HRTEM and ED, using the superconductor SmFeAsO0.85F0.15 as an example.
Wang Y; Ge B; Che G
Micron; 2015 Apr; 71():32-8. PubMed ID: 25635603
[TBL] [Abstract][Full Text] [Related]
35. Current and future aberration correctors for the improvement of resolution in electron microscopy.
Haider M; Hartel P; Müller H; Uhlemann S; Zach J
Philos Trans A Math Phys Eng Sci; 2009 Sep; 367(1903):3665-82. PubMed ID: 19687059
[TBL] [Abstract][Full Text] [Related]
36. Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
D'Alfonso AJ; Cosgriff EC; Findlay SD; Behan G; Kirkland AI; Nellist PD; Allen LJ
Ultramicroscopy; 2008 Nov; 108(12):1567-78. PubMed ID: 18617330
[TBL] [Abstract][Full Text] [Related]
37. Development of aberration-corrected electron microscopy.
Smith DJ
Microsc Microanal; 2008 Feb; 14(1):2-15. PubMed ID: 18171498
[TBL] [Abstract][Full Text] [Related]
38. On the importance of fifth-order spherical aberration for a fully corrected electron microscope.
Chang LY; Kirkland AI; Titchmarsh JM
Ultramicroscopy; 2006 Mar; 106(4-5):301-6. PubMed ID: 16309838
[TBL] [Abstract][Full Text] [Related]
39. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.
Tromp RM; Hannon JB; Ellis AW; Wan W; Berghaus A; Schaff O
Ultramicroscopy; 2010 Jun; 110(7):852-61. PubMed ID: 20395048
[TBL] [Abstract][Full Text] [Related]
40. First experimental test of a new monochromated and aberration-corrected 200 kV field-emission scanning transmission electron microscope.
Walther T; Quandt E; Stegmann H; Thesen A; Benner G
Ultramicroscopy; 2006; 106(11-12):963-9. PubMed ID: 16870338
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]
