These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
182 related articles for article (PubMed ID: 17578111)
1. Unstable amplitude and noisy image induced by tip contamination in dynamic force mode atomic force microscopy. Nie HY; McIntyre NS Rev Sci Instrum; 2007 Feb; 78(2):023701. PubMed ID: 17578111 [TBL] [Abstract][Full Text] [Related]
2. Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe. Sweetman A; Jarvis S; Danza R; Moriarty P Beilstein J Nanotechnol; 2012; 3():25-32. PubMed ID: 22428093 [TBL] [Abstract][Full Text] [Related]
3. Structure and stability of semiconductor tip apexes for atomic force microscopy. Pou P; Ghasemi SA; Jelinek P; Lenosky T; Goedecker S; Perez R Nanotechnology; 2009 Jul; 20(26):264015. PubMed ID: 19509446 [TBL] [Abstract][Full Text] [Related]
4. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope. Lange M; van Vörden D; Möller R Beilstein J Nanotechnol; 2012; 3():207-12. PubMed ID: 22496993 [TBL] [Abstract][Full Text] [Related]
5. Inverting amplitude and phase to reconstruct tip-sample interaction forces in tapping mode atomic force microscopy. Hu S; Raman A Nanotechnology; 2008 Sep; 19(37):375704. PubMed ID: 21832558 [TBL] [Abstract][Full Text] [Related]
6. Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition. Kinoshita Y; Naitoh Y; Li YJ; Sugawara Y Rev Sci Instrum; 2011 Nov; 82(11):113707. PubMed ID: 22128984 [TBL] [Abstract][Full Text] [Related]
7. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface. Naitoh Y; Kinoshita Y; Jun Li Y; Kageshima M; Sugawara Y Nanotechnology; 2009 Jul; 20(26):264011. PubMed ID: 19509444 [TBL] [Abstract][Full Text] [Related]
8. The qPlus sensor, a powerful core for the atomic force microscope. Giessibl FJ Rev Sci Instrum; 2019 Jan; 90(1):011101. PubMed ID: 30709191 [TBL] [Abstract][Full Text] [Related]
9. Mapping and control of atomic force on Si(1 1 1)square root(3) x square root(3)-Ag surface using noncontact atomic force microscope. Morita S; Sugawara Y Ultramicroscopy; 2002 May; 91(1-4):89-96. PubMed ID: 12211488 [TBL] [Abstract][Full Text] [Related]
10. Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment. Nahavandi A; Korayem MH Microsc Microanal; 2015 Oct; 21(5):1195-206. PubMed ID: 26324257 [TBL] [Abstract][Full Text] [Related]
11. Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography. Xu M; Fujita D; Onishi K Rev Sci Instrum; 2009 Apr; 80(4):043703. PubMed ID: 19405662 [TBL] [Abstract][Full Text] [Related]
12. Mechanics of interaction and atomic-scale wear of amplitude modulation atomic force microscopy probes. Vahdat V; Grierson DS; Turner KT; Carpick RW ACS Nano; 2013 Apr; 7(4):3221-35. PubMed ID: 23506316 [TBL] [Abstract][Full Text] [Related]
13. Atomic force microscope: a tool for studying ionophores. Zammaretti P; Fakler A; Zaugg F; Spichiger-Keller UE Anal Chem; 2000 Aug; 72(16):3689-95. PubMed ID: 10959951 [TBL] [Abstract][Full Text] [Related]
14. Optical imaging beyond the diffraction limit by SNEM: effects of AFM tip modifications with thiol monolayers on imaging quality. Cumurcu A; Diaz J; Lindsay ID; de Beer S; Duvigneau J; Schön P; Julius Vancso G Ultramicroscopy; 2015 Mar; 150():79-87. PubMed ID: 25544678 [TBL] [Abstract][Full Text] [Related]
15. Probed adhesion force of living lung cells with a tip-modified atomic force microscope. Fu WE; Sivashanmugan K; Liao JD; Lin YY; Cheng KH; Liu BH; Yan JJ; Yeh MH Biointerphases; 2016 Dec; 11(4):04B311. PubMed ID: 27998155 [TBL] [Abstract][Full Text] [Related]
16. Tuning the instability in static mode atomic force spectroscopy as obtained in an AFM by applying an electric field between the tip and the substrate. Biswas S; Raychaudhuri AK; Sreeram PA; Dietzel D Ultramicroscopy; 2012 Nov; 122():19-25. PubMed ID: 22960002 [TBL] [Abstract][Full Text] [Related]
17. High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method. Park YM; Park JS; Chung CH; Lee S Data Brief; 2020 Apr; 29():105177. PubMed ID: 32055662 [TBL] [Abstract][Full Text] [Related]
18. Force-distance curves on lubricant films: An approach to the characterization of the shape of the AFM tip. Cappella B Micron; 2017 Feb; 93():20-28. PubMed ID: 27883990 [TBL] [Abstract][Full Text] [Related]
19. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study. Campbellová A; Ondráček M; Pou P; Pérez R; Klapetek P; Jelínek P Nanotechnology; 2011 Jul; 22(29):295710. PubMed ID: 21685559 [TBL] [Abstract][Full Text] [Related]
20. Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy. Deng W; Zhang GM; Murphy MF; Lilley F; Harvey DM; Burton DR Microsc Res Tech; 2015 Oct; 78(10):935-46. PubMed ID: 26303510 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]