280 related articles for article (PubMed ID: 17764326)
1. Iterative image-based modeling and control for higher scanning probe microscope performance.
Clayton GM; Devasia S
Rev Sci Instrum; 2007 Aug; 78(8):083704. PubMed ID: 17764326
[TBL] [Abstract][Full Text] [Related]
2. Fast nonlinear image reconstruction for scanning impedance imaging.
Liu H; Hawkins AR; Schultz SM; Oliphant TE
IEEE Trans Biomed Eng; 2008 Mar; 55(3):970-7. PubMed ID: 18334388
[TBL] [Abstract][Full Text] [Related]
3. Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations.
Shen Y; Barnett DM; Pinsky PM
Rev Sci Instrum; 2008 Feb; 79(2 Pt 1):023711. PubMed ID: 18315309
[TBL] [Abstract][Full Text] [Related]
4. Shear force control for a terahertz near field microscope.
Buersgens F; Acuna G; Lang CH; Potrebic SI; Manus S; Kersting R
Rev Sci Instrum; 2007 Nov; 78(11):113701. PubMed ID: 18052474
[TBL] [Abstract][Full Text] [Related]
5. Variable-temperature independently driven four-tip scanning tunneling microscope.
Hobara R; Nagamura N; Hasegawa S; Matsuda I; Yamamoto Y; Miyatake Y; Nagamura T
Rev Sci Instrum; 2007 May; 78(5):053705. PubMed ID: 17552823
[TBL] [Abstract][Full Text] [Related]
6. MEMS-based high speed scanning probe microscopy.
Disseldorp EC; Tabak FC; Katan AJ; Hesselberth MB; Oosterkamp TH; Frenken JW; van Spengen WM
Rev Sci Instrum; 2010 Apr; 81(4):043702. PubMed ID: 20441340
[TBL] [Abstract][Full Text] [Related]
7. Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape.
Kuljanishvili I; Chakraborty S; Maasilta IJ; Tessmer SH; Melloch MR
Ultramicroscopy; 2004 Dec; 102(1):7-12. PubMed ID: 15556695
[TBL] [Abstract][Full Text] [Related]
8. Enhancing dynamic scanning force microscopy in air: as close as possible.
Palacios-Lidón E; Pérez-García B; Colchero J
Nanotechnology; 2009 Feb; 20(8):085707. PubMed ID: 19417468
[TBL] [Abstract][Full Text] [Related]
9. Automatization of nanotomography.
Dietz C; Röper S; Scherdel S; Bernstein A; Rehse N; Magerle R
Rev Sci Instrum; 2007 May; 78(5):053703. PubMed ID: 17552821
[TBL] [Abstract][Full Text] [Related]
10. Model-based 2.5-d deconvolution for extended depth of field in brightfield microscopy.
Aguet F; Van De Ville D; Unser M
IEEE Trans Image Process; 2008 Jul; 17(7):1144-53. PubMed ID: 18586622
[TBL] [Abstract][Full Text] [Related]
11. Practical Poissonian-Gaussian noise modeling and fitting for single-image raw-data.
Foi A; Trimeche M; Katkovnik V; Egiazarian K
IEEE Trans Image Process; 2008 Oct; 17(10):1737-54. PubMed ID: 18784024
[TBL] [Abstract][Full Text] [Related]
12. Super-resolution and reconstruction of sparse sub-wavelength images.
Gazit S; Szameit A; Eldar YC; Segev M
Opt Express; 2009 Dec; 17(26):23920-46. PubMed ID: 20052103
[TBL] [Abstract][Full Text] [Related]
13. Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications.
Li M; Tang HX; Roukes ML
Nat Nanotechnol; 2007 Feb; 2(2):114-20. PubMed ID: 18654230
[TBL] [Abstract][Full Text] [Related]
14. Scanning probe microscopy based on magnetoresistive sensing.
Sahoo DR; Sebastian A; Häberle W; Pozidis H; Eleftheriou E
Nanotechnology; 2011 Apr; 22(14):145501. PubMed ID: 21346303
[TBL] [Abstract][Full Text] [Related]
15. Impact of image-space resolution modeling for studies with the high-resolution research tomograph.
Sureau FC; Reader AJ; Comtat C; Leroy C; Ribeiro MJ; Buvat I; Trébossen R
J Nucl Med; 2008 Jun; 49(6):1000-8. PubMed ID: 18511844
[TBL] [Abstract][Full Text] [Related]
16. Analysis of scanning probe microscope images using wavelets.
Gackenheimer C; Cayon L; Reifenberger R
Ultramicroscopy; 2006 Mar; 106(4-5):389-97. PubMed ID: 16439061
[TBL] [Abstract][Full Text] [Related]
17. Image denoising using derotated complex wavelet coefficients.
Miller M; Kingsbury N
IEEE Trans Image Process; 2008 Sep; 17(9):1500-11. PubMed ID: 18701390
[TBL] [Abstract][Full Text] [Related]
18. Noniterative interpolation-based super-resolution minimizing aliasing in the reconstructed image.
Sánchez-Beato A; Pajares G
IEEE Trans Image Process; 2008 Oct; 17(10):1817-26. PubMed ID: 18784030
[TBL] [Abstract][Full Text] [Related]
19. High-resolution microscope for tip-enhanced optical processes in ultrahigh vacuum.
Steidtner J; Pettinger B
Rev Sci Instrum; 2007 Oct; 78(10):103104. PubMed ID: 17979403
[TBL] [Abstract][Full Text] [Related]
20. Noise and signal estimation in magnitude MRI and Rician distributed images: a LMMSE approach.
Aja-Fernandez S; Alberola-Lopez C; Westin CF
IEEE Trans Image Process; 2008 Aug; 17(8):1383-98. PubMed ID: 18632347
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
