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8. Optical restriction of plasma emission light for nanometric sampling depth and depth profiling of multilayered metal samples. Ctvrtnícková T; Fortes FJ; Cabalín LM; Laserna JJ Appl Spectrosc; 2007 Jul; 61(7):719-24. PubMed ID: 17697466 [TBL] [Abstract][Full Text] [Related]
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