These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

237 related articles for article (PubMed ID: 18067334)

  • 1. 3D force and displacement sensor for SFA and AFM measurements.
    Kristiansen K; McGuiggan P; Carver G; Meinhart C; Israelachvili J
    Langmuir; 2008 Feb; 24(4):1541-9. PubMed ID: 18067334
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Lateral force microscope calibration using a modified atomic force microscope cantilever.
    Reitsma MG
    Rev Sci Instrum; 2007 Oct; 78(10):106102. PubMed ID: 17979458
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Prototype cantilevers for quantitative lateral force microscopy.
    Reitsma MG; Gates RS; Friedman LH; Cook RF
    Rev Sci Instrum; 2011 Sep; 82(9):093706. PubMed ID: 21974593
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Lateral force calibration: accurate procedures for colloidal probe friction measurements in atomic force microscopy.
    Chung KH; Pratt JR; Reitsma MG
    Langmuir; 2010 Jan; 26(2):1386-94. PubMed ID: 19827782
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Effects of anisotropic material property on the spring constant and the resonant frequency of atomic force microscope cantilever.
    Yeh MK; Tai NH; Chen BY
    Rev Sci Instrum; 2009 Apr; 80(4):043705. PubMed ID: 19405664
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Influence of Poisson's ratio variation on lateral spring constant of atomic force microscopy cantilevers.
    Yeh MK; Tai NH; Chen BY
    Ultramicroscopy; 2008 Sep; 108(10):1025-9. PubMed ID: 18547729
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array.
    Gates RS; Reitsma MG
    Rev Sci Instrum; 2007 Aug; 78(8):086101. PubMed ID: 17764361
    [TBL] [Abstract][Full Text] [Related]  

  • 8. A uniaxial bioMEMS device for quantitative force-displacement measurements.
    Serrell DB; Oreskovic TL; Slifka AJ; Mahajan RL; Finch DS
    Biomed Microdevices; 2007 Apr; 9(2):267-75. PubMed ID: 17187300
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs.
    Cumpson PJ; Zhdan P; Hedley J
    Ultramicroscopy; 2004 Aug; 100(3-4):241-51. PubMed ID: 15231316
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy.
    Chung KH; Shaw GA; Pratt JR
    Rev Sci Instrum; 2009 Jun; 80(6):065107. PubMed ID: 19566226
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.
    Yazdanpanah MM; Hosseini M; Pabba S; Berry SM; Dobrokhotov VV; Safir A; Keynton RS; Cohn RW
    Langmuir; 2008 Dec; 24(23):13753-64. PubMed ID: 18986184
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Simulation of atomic force microscopy operation via three-dimensional finite element modelling.
    Choi JL; Gethin DT
    Nanotechnology; 2009 Feb; 20(6):065702. PubMed ID: 19417396
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force.
    Lin SM
    Ultramicroscopy; 2007; 107(2-3):245-53. PubMed ID: 16982149
    [TBL] [Abstract][Full Text] [Related]  

  • 14. A metrological large range atomic force microscope with improved performance.
    Dai G; Wolff H; Pohlenz F; Danzebrink HU
    Rev Sci Instrum; 2009 Apr; 80(4):043702. PubMed ID: 19405661
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Coupled lateral bending-torsional vibration sensitivity of atomic force microscope cantilever.
    Lee HL; Chang WJ
    Ultramicroscopy; 2008 Jul; 108(8):707-11. PubMed ID: 18054438
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Atomic force microscopy colloid-probe measurements with explicit measurement of particle-solid separation.
    Clark SC; Walz JY; Ducker WA
    Langmuir; 2004 Aug; 20(18):7616-22. PubMed ID: 15323510
    [TBL] [Abstract][Full Text] [Related]  

  • 17. New SFA techniques for studying surface forces and thin film patterns induced by electric fields.
    Zeng H; Tian Y; Anderson TH; Tirrell M; Israelachvili JN
    Langmuir; 2008 Feb; 24(4):1173-82. PubMed ID: 17939692
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Development of a microlateral force sensor and its evaluation using lateral force microscopy.
    Ando Y; Shiraishi N
    Rev Sci Instrum; 2007 Mar; 78(3):033701. PubMed ID: 17411185
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulation.
    Korayem MH; Saraie MB; Saraee MB
    Ultramicroscopy; 2017 Apr; 175():9-24. PubMed ID: 28110179
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Bubble colloidal AFM probes formed from ultrasonically generated bubbles.
    Vakarelski IU; Lee J; Dagastine RR; Chan DY; Stevens GW; Grieser F
    Langmuir; 2008 Feb; 24(3):603-5. PubMed ID: 18163660
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 12.