264 related articles for article (PubMed ID: 18077094)
1. Volcano structure in atomic resolution core-loss images.
D'Alfonso AJ; Findlay SD; Oxley MP; Allen LJ
Ultramicroscopy; 2008 Jun; 108(7):677-87. PubMed ID: 18077094
[TBL] [Abstract][Full Text] [Related]
2. Image simulation for electron energy loss spectroscopy.
Oxley MP; Pennycook SJ
Micron; 2008 Aug; 39(6):676-84. PubMed ID: 18060796
[TBL] [Abstract][Full Text] [Related]
3. Simulation of probe position-dependent electron energy-loss fine structure.
Oxley MP; Kapetanakis MD; Prange MP; Varela M; Pennycook SJ; Pantelides ST
Microsc Microanal; 2014 Jun; 20(3):784-97. PubMed ID: 24685384
[TBL] [Abstract][Full Text] [Related]
4. Modeling atomic-resolution scanning transmission electron microscopy images.
Findlay SD; Oxley MP; Allen LJ
Microsc Microanal; 2008 Feb; 14(1):48-59. PubMed ID: 18096101
[TBL] [Abstract][Full Text] [Related]
5. Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy.
Shah AB; Ramasse QM; Wen JG; Bhattacharya A; Zuo JM
Micron; 2011 Aug; 42(6):539-46. PubMed ID: 21376607
[TBL] [Abstract][Full Text] [Related]
6. Atomic imaging and spectroscopy of low-dimensional materials with interrupted periodicities.
Suenaga K; Akiyama-Hasegawa K; Niimi Y; Kobayashi H; Nakamura M; Liu Z; Sato Y; Koshino M; Iijima S
J Electron Microsc (Tokyo); 2012; 61(5):285-91. PubMed ID: 22811432
[TBL] [Abstract][Full Text] [Related]
7. Modelling high-resolution electron microscopy based on core-loss spectroscopy.
Allen LJ; Findlay SD; Oxley MP; Witte C; Zaluzec NJ
Ultramicroscopy; 2006; 106(11-12):1001-11. PubMed ID: 16843600
[TBL] [Abstract][Full Text] [Related]
8. The spatial resolution of imaging using core-loss spectroscopy in the scanning transmission electron microscope.
Cosgriff EC; Oxley MP; Allen LJ; Pennycook SJ
Ultramicroscopy; 2005 Mar; 102(4):317-26. PubMed ID: 15694678
[TBL] [Abstract][Full Text] [Related]
9. Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.
Inada H; Su D; Egerton RF; Konno M; Wu L; Ciston J; Wall J; Zhu Y
Ultramicroscopy; 2011 Jun; 111(7):865-76. PubMed ID: 21185651
[TBL] [Abstract][Full Text] [Related]
10. Applying an information transmission approach to extract valence electron information from reconstructed exit waves.
Xu Q; Zandbergen HW; Van Dyck D
Ultramicroscopy; 2011 Jun; 111(7):912-9. PubMed ID: 21664552
[TBL] [Abstract][Full Text] [Related]
11. Dose-limited spectroscopic imaging of soft materials by low-loss EELS in the scanning transmission electron microscope.
Yakovlev S; Libera M
Micron; 2008 Aug; 39(6):734-40. PubMed ID: 18096395
[TBL] [Abstract][Full Text] [Related]
12. The development and characteristics of a high-speed EELS mapping system for a dedicated STEM.
Isakozawa S; Kaji K; Jarausch K; Terada S; Baba N
J Electron Microsc (Tokyo); 2008 Apr; 57(2):41-5. PubMed ID: 18322296
[TBL] [Abstract][Full Text] [Related]
13. Evaluation and optimization of the performance of elastic and inelastic scanning transmission electron microscope imaging by correlation analysis.
Mory C; Bonnet N; Colliex C; Kohl H; Tencé M
Scanning Microsc Suppl; 1988; 2():329-42. PubMed ID: 3244971
[TBL] [Abstract][Full Text] [Related]
14. Cs corrected STEM EELS: Analysing beam sensitive carbon nanomaterials in cellular structures.
Gass MH; Porter AE; Bendall JS; Muller K; Skepper JN; Midgley PA; Welland M
Ultramicroscopy; 2010 Jul; 110(8):946-51. PubMed ID: 20022179
[TBL] [Abstract][Full Text] [Related]
15. Effect of crystal and beam tilt on simulated high-resolution TEM images of interfaces.
Howe JM; Rozeveld SJ
Microsc Res Tech; 1992 Nov; 23(3):230-8. PubMed ID: 1472750
[TBL] [Abstract][Full Text] [Related]
16. Seeing the atoms more clearly: STEM imaging from the Crewe era to today.
Pennycook SJ
Ultramicroscopy; 2012 Dec; 123():28-37. PubMed ID: 22727567
[TBL] [Abstract][Full Text] [Related]
17. Atomic resolution elemental mapping using energy-filtered imaging scanning transmission electron microscopy with chromatic aberration correction.
Krause FF; Rosenauer A; Barthel J; Mayer J; Urban K; Dunin-Borkowski RE; Brown HG; Forbes BD; Allen LJ
Ultramicroscopy; 2017 Oct; 181():173-177. PubMed ID: 28601013
[TBL] [Abstract][Full Text] [Related]
18. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
Morgan DG; Ramasse QM; Browning ND
J Electron Microsc (Tokyo); 2009 Jun; 58(3):223-44. PubMed ID: 19297343
[TBL] [Abstract][Full Text] [Related]
19. Thin dielectric film thickness determination by advanced transmission electron microscopy.
Diebold AC; Foran B; Kisielowski C; Muller DA; Pennycook SJ; Principe E; Stemmer S
Microsc Microanal; 2003 Dec; 9(6):493-508. PubMed ID: 14750984
[TBL] [Abstract][Full Text] [Related]
20. Contributions to the contrast in experimental high-angle annular dark-field images.
Klenov DO; Stemmer S
Ultramicroscopy; 2006; 106(10):889-901. PubMed ID: 16713091
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]
