These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

133 related articles for article (PubMed ID: 18083975)

  • 1. Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis.
    Okuno H; Takeguchi M; Mitsuishi K; Guo XJ; Furuya K
    J Electron Microsc (Tokyo); 2008 Jan; 57(1):1-5. PubMed ID: 18083975
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Evaluation of top, angle, and side cleaned FIB samples for TEM analysis.
    Montoya E; Bals S; Rossell MD; Schryvers D; Van Tendeloo G
    Microsc Res Tech; 2007 Dec; 70(12):1060-71. PubMed ID: 17722055
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Technique for preparation and characterization in cross-section of oral titanium implant surfaces using focused ion beam and transmission electron microscopy.
    Jarmar T; Palmquist A; Brånemark R; Hermansson L; Engqvist H; Thomsen P
    J Biomed Mater Res A; 2008 Dec; 87(4):1003-9. PubMed ID: 18257067
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Synthesis of NiGa layered double hydroxides. A combined EXAFS, SAXS, and TEM study. 3. Synthesis at constant pH.
    Defontaine G; Michot LJ; Bihannic I; Ghanbaja J; Briois V
    Langmuir; 2004 Dec; 20(25):11213-22. PubMed ID: 15568878
    [TBL] [Abstract][Full Text] [Related]  

  • 5. A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs.
    Yabuuchi Y; Tametou S; Okano T; Inazato S; Sadayama S; Yamamoto Y; Iwasaki K; Sugiyama Y
    J Electron Microsc (Tokyo); 2004; 53(5):471-7. PubMed ID: 15582949
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Molecular structures of chloro(phthalocyaninato)-aluminum(III) and -gallium(III) as determined by gas electron diffraction and quantum chemical calculations: quantum chemical calculations on fluoro(phthalocyaninato)-aluminum(III) and -gallium(III), chloro(tetrakis(1,2,5-thiadiazole)porphyrazinato)-aluminum(III) and -gallium(III) and comparison with their X-ray structures.
    Strenalyuk T; Samdal S; Volden HV
    J Phys Chem A; 2008 Sep; 112(38):9075-82. PubMed ID: 18754601
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Compositional modulation in In(x)Ga(1-x)N: TEM and X-ray studies.
    Liliental-Weber Z; Zakharov DN; Yu KM; Ager JW; Walukiewicz W; Haller EE; Lu H; Schaff WJ
    J Electron Microsc (Tokyo); 2005 Jun; 54(3):243-50. PubMed ID: 16123056
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.
    Rosenauer A; Gries K; Müller K; Pretorius A; Schowalter M; Avramescu A; Engl K; Lutgen S
    Ultramicroscopy; 2009 Aug; 109(9):1171-82. PubMed ID: 19497670
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Selected area polishing for precision TEM sample preparation.
    Liu JB; Tracy BM; Gronsky R
    Microsc Res Tech; 1993 Oct; 26(2):162-6. PubMed ID: 8241552
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Damage in III-V compounds during focused ion beam milling.
    Rubanov S; Munroe PR
    Microsc Microanal; 2005 Oct; 11(5):446-55. PubMed ID: 17481325
    [TBL] [Abstract][Full Text] [Related]  

  • 11. On the structured imperfections of bulk GaSb using high resolution transmission electron microscopy.
    Lioutas ChB; Zoulis G; Konidaris S; Polychroniadis EK; Stróz D
    Micron; 2009 Jan; 40(1):6-10. PubMed ID: 18343674
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Plastic bag method for active sample loading into transmission electron microscope.
    Yao H; Isobe S; Wang Y; Hashimoto N; Ohnuki S
    J Electron Microsc (Tokyo); 2011 Dec; 60(6):375-8. PubMed ID: 21969338
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Lattice distortions in GaN on sapphire using the CBED-HOLZ technique.
    Sridhara Rao DV; McLaughlin K; Kappers MJ; Humphreys CJ
    Ultramicroscopy; 2009 Sep; 109(10):1250-5. PubMed ID: 19573990
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing.
    Chen J; Ivey DG
    Micron; 2002; 33(5):489-92. PubMed ID: 11976037
    [TBL] [Abstract][Full Text] [Related]  

  • 15. A specimen preparation technique for plane-view studies of surfaces using transmission electron microscopy.
    Foss S; Taftø J; Haakenaasen R
    J Electron Microsc (Tokyo); 2010; 59(1):27-31. PubMed ID: 19749200
    [TBL] [Abstract][Full Text] [Related]  

  • 16. An appraisal of ultramicrotomy, FIBSEM and cryogenic FIBSEM techniques for the sectioning of biological cells on titanium substrates for TEM investigation.
    Edwards HK; Fay MW; Anderson SI; Scotchford CA; Grant DM; Brown PD
    J Microsc; 2009 Apr; 234(1):16-25. PubMed ID: 19335453
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Self-assembled monolayers of alkylphosphonic acid on GaN substrates.
    Ito T; Forman SM; Cao C; Li F; Eddy CR; Mastro MA; Holm RT; Henry RL; Hohn KL; Edgar JH
    Langmuir; 2008 Jun; 24(13):6630-5. PubMed ID: 18522438
    [TBL] [Abstract][Full Text] [Related]  

  • 18. The preparation of cross-sectional transmission electron microscopy specimens of Nb/Al multilayer thin films on sapphire substrates.
    Barmak K; Rudman DA; Foner S
    J Electron Microsc Tech; 1990 Nov; 16(3):249-53. PubMed ID: 2243281
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Back-etch method for plan view transmission electron microscopy sample preparation of optically opaque films.
    Yao B; Coffey KR
    J Electron Microsc (Tokyo); 2008 Apr; 57(2):47-52. PubMed ID: 18227137
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Sample preparation for atomic-resolution STEM at low voltages by FIB.
    Schaffer M; Schaffer B; Ramasse Q
    Ultramicroscopy; 2012 Mar; 114():62-71. PubMed ID: 22356790
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.