These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
126 related articles for article (PubMed ID: 18163754)
1. Transient of scanning electron microscopic images for a buried microstructure in insulators. Zhang HB; Li DY; Li WQ Rev Sci Instrum; 2007 Dec; 78(12):126105. PubMed ID: 18163754 [TBL] [Abstract][Full Text] [Related]
2. Contrast mechanism due to interface trapped charges for a buried SiO2 microstructure in scanning electron microscopy. Zhang HB; Li WQ; Wu DW J Electron Microsc (Tokyo); 2009 Jan; 58(1):15-9. PubMed ID: 19029106 [TBL] [Abstract][Full Text] [Related]
3. Transient analysis of gaseous electron-ion recombination in the environmental scanning electron microscope. Morgan SW; Phillips MR J Microsc; 2006 Mar; 221(Pt 3):183-202. PubMed ID: 16551280 [TBL] [Abstract][Full Text] [Related]
4. Mechanism of electron multiplication due to charging for a SiO Wang F; Feng G; Zhang X; Cao M Micron; 2016 Nov; 90():64-70. PubMed ID: 27595903 [TBL] [Abstract][Full Text] [Related]
5. The use of surface charging in the SEM for lithium niobate domain structure investigation. Kokhanchik LS Micron; 2009 Jan; 40(1):41-5. PubMed ID: 18448344 [TBL] [Abstract][Full Text] [Related]
6. Electron and ion imaging of gland cells using the FIB/SEM system. Drobne D; Milani M; Zrimec A; Leser V; Berden Zrimec M J Microsc; 2005 Jul; 219(Pt 1):29-35. PubMed ID: 15998363 [TBL] [Abstract][Full Text] [Related]
7. Self-consistent charging in dielectric films under defocused electron beam irradiation. Li WQ; Mu K; Xia RH Micron; 2011 Jul; 42(5):443-8. PubMed ID: 21239177 [TBL] [Abstract][Full Text] [Related]
8. Charge compensation by in-situ heating for insulating ceramics in scanning electron microscope. Wang L; Ji Y; Wei B; Zhang Y; Fu J; Xu X; Han X Ultramicroscopy; 2009 Oct; 109(11):1326-32. PubMed ID: 19577845 [TBL] [Abstract][Full Text] [Related]
9. On some contrast reversals in SEM: application to metal/insulator systems. Cazaux J Ultramicroscopy; 2008 Nov; 108(12):1645-52. PubMed ID: 18692317 [TBL] [Abstract][Full Text] [Related]
10. Separation of image-distortion sources and magnetic-field measurement in scanning electron microscope (SEM). PÅ‚uska M; Czerwinski A; Ratajczak J; Katcki J; Oskwarek L; Rak R Micron; 2009 Jan; 40(1):46-50. PubMed ID: 18321720 [TBL] [Abstract][Full Text] [Related]
11. Observation of the ion-mirror effect during microscopy of insulating materials. Croccolo F; Riccardi C J Microsc; 2008 Jan; 229(Pt 1):39-43. PubMed ID: 18173643 [TBL] [Abstract][Full Text] [Related]
12. Interpretation of secondary electron images obtained using a low vacuum SEM. Toth M; Thiel BL; Donald AM Ultramicroscopy; 2003; 94(2):71-87. PubMed ID: 12505757 [TBL] [Abstract][Full Text] [Related]
13. The effect of beam diameter on the electron skirt in a high pressure scanning electron microscope. Belkorissat R; Kadoun A; Khelifa B; Mathieu C Micron; 2004; 35(7):543-7. PubMed ID: 15219900 [TBL] [Abstract][Full Text] [Related]
14. Analyzing indirect secondary electron contrast of unstained bacteriophage T4 based on SEM images and Monte Carlo simulations. Ogura T Biochem Biophys Res Commun; 2009 Mar; 380(2):254-9. PubMed ID: 19166816 [TBL] [Abstract][Full Text] [Related]
15. Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures. Srinivasan A; Han W; Khursheed A Microsc Microanal; 2018 Oct; 24(5):453-460. PubMed ID: 30277195 [TBL] [Abstract][Full Text] [Related]
16. Characterization of trapped charges distribution in terms of mirror plot curve. Al-Obaidi HN; Mahdi AS; Khaleel IH Ultramicroscopy; 2018 Jan; 184(Pt A):12-16. PubMed ID: 28837891 [TBL] [Abstract][Full Text] [Related]
17. Modelling and observations of electron beam charging of an insulator/metal bilayer and its impact on secondary electron images in defect inspection equipment. Ohya K; Inai K; Kawasaki R; Saito M; Hayashi T; Jau J; Kanai K J Electron Microsc (Tokyo); 2010 Aug; 59 Suppl 1():S189-93. PubMed ID: 20554754 [TBL] [Abstract][Full Text] [Related]
18. Sharing of secondary electrons by in-lens and out-lens detector in low-voltage scanning electron microscope equipped with immersion lens. Kumagai K; Sekiguchi T Ultramicroscopy; 2009 Mar; 109(4):368-72. PubMed ID: 19246156 [TBL] [Abstract][Full Text] [Related]
19. Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy. Kirk TL; De Pietro LG; Pescia D; Ramsperger U Ultramicroscopy; 2009 Apr; 109(5):463-6. PubMed ID: 19124202 [TBL] [Abstract][Full Text] [Related]
20. Quantitative secondary electron energy filtering in a scanning electron microscope and its applications. Kazemian P; Mentink SA; Rodenburg C; Humphreys CJ Ultramicroscopy; 2007; 107(2-3):140-50. PubMed ID: 16872746 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]