286 related articles for article (PubMed ID: 18171501)
21. STEM tomography in cell biology.
Yakushevska AE; Lebbink MN; Geerts WJ; Spek L; van Donselaar EG; Jansen KA; Humbel BM; Post JA; Verkleij AJ; Koster AJ
J Struct Biol; 2007 Sep; 159(3):381-91. PubMed ID: 17600727
[TBL] [Abstract][Full Text] [Related]
22. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.
Van Aert S; Verbeeck J; Erni R; Bals S; Luysberg M; Van Dyck D; Van Tendeloo G
Ultramicroscopy; 2009 Sep; 109(10):1236-44. PubMed ID: 19525069
[TBL] [Abstract][Full Text] [Related]
23. Contributions to the contrast in experimental high-angle annular dark-field images.
Klenov DO; Stemmer S
Ultramicroscopy; 2006; 106(10):889-901. PubMed ID: 16713091
[TBL] [Abstract][Full Text] [Related]
24. The spatial resolution of imaging using core-loss spectroscopy in the scanning transmission electron microscope.
Cosgriff EC; Oxley MP; Allen LJ; Pennycook SJ
Ultramicroscopy; 2005 Mar; 102(4):317-26. PubMed ID: 15694678
[TBL] [Abstract][Full Text] [Related]
25. Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
E H; Macarthur KE; Pennycook TJ; Okunishi E; D'Alfonso AJ; Lugg NR; Allen LJ; Nellist PD
Ultramicroscopy; 2013 Oct; 133():109-19. PubMed ID: 23969066
[TBL] [Abstract][Full Text] [Related]
26. Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images.
Morgan DG; Ramasse QM; Browning ND
J Electron Microsc (Tokyo); 2009 Jun; 58(3):223-44. PubMed ID: 19297343
[TBL] [Abstract][Full Text] [Related]
27. Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
Pennycook SJ; Rafferty B; Nellist PD
Microsc Microanal; 2000 Jul; 6(4):343-352. PubMed ID: 10898818
[TBL] [Abstract][Full Text] [Related]
28. Effects of electron channeling in HAADF-STEM intensity in La2CuSnO6.
Haruta M; Kurata H; Komatsu H; Shimakawa Y; Isoda S
Ultramicroscopy; 2009 Mar; 109(4):361-7. PubMed ID: 19201539
[TBL] [Abstract][Full Text] [Related]
29. High-resolution detection of Au catalyst atoms in Si nanowires.
Allen JE; Hemesath ER; Perea DE; Lensch-Falk JL; Li ZY; Yin F; Gass MH; Wang P; Bleloch AL; Palmer RE; Lauhon LJ
Nat Nanotechnol; 2008 Mar; 3(3):168-73. PubMed ID: 18654490
[TBL] [Abstract][Full Text] [Related]
30. Quantitative amplitude and phase contrast imaging in a scanning transmission X-ray microscope.
Hornberger B; Feser M; Jacobsen C
Ultramicroscopy; 2007 Aug; 107(8):644-55. PubMed ID: 17291688
[TBL] [Abstract][Full Text] [Related]
31. High-resolution three-dimensional scanning transmission electron microscopy characterization of oxide-nitride-oxide layer interfaces in Si-based semiconductors using computed tomography.
Sadayama S; Sekiguchi H; Bright A; Suzuki N; Yamada K; Kaneko K
J Electron Microsc (Tokyo); 2011; 60(3):243-51. PubMed ID: 21565940
[TBL] [Abstract][Full Text] [Related]
32. Evaluation and optimization of the performance of elastic and inelastic scanning transmission electron microscope imaging by correlation analysis.
Mory C; Bonnet N; Colliex C; Kohl H; Tencé M
Scanning Microsc Suppl; 1988; 2():329-42. PubMed ID: 3244971
[TBL] [Abstract][Full Text] [Related]
33. Volcano structure in atomic resolution core-loss images.
D'Alfonso AJ; Findlay SD; Oxley MP; Allen LJ
Ultramicroscopy; 2008 Jun; 108(7):677-87. PubMed ID: 18077094
[TBL] [Abstract][Full Text] [Related]
34. Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.
Watanabe K; Kikuchi Y; Yamazaki T; Asano E; Nakanishi N; Kotaka Y; Okunishi E; Hashimoto I
Acta Crystallogr A; 2004 Nov; 60(Pt 6):591-7. PubMed ID: 15507742
[TBL] [Abstract][Full Text] [Related]
35. Artifacts in aberration-corrected ADF-STEM imaging.
Yu Z; Batson PE; Silcox J
Ultramicroscopy; 2003 Sep; 96(3-4):275-84. PubMed ID: 12871794
[TBL] [Abstract][Full Text] [Related]
36. Image contrast in X-ray reflection interface microscopy: comparison of data with model calculations and simulations.
Fenter P; Park C; Kohli V; Zhang Z
J Synchrotron Radiat; 2008 Nov; 15(Pt 6):558-71. PubMed ID: 18955761
[TBL] [Abstract][Full Text] [Related]
37. A system for acquiring simultaneous electron energy-loss and X-ray spectrum-images.
Feng J; Somlyo AV; Somlyo AP
J Microsc; 2004 Jul; 215(Pt 1):92-9. PubMed ID: 15230880
[TBL] [Abstract][Full Text] [Related]
38. Recent advances in electron tomography: TEM and HAADF-STEM tomography for materials science and semiconductor applications.
Kübel C; Voigt A; Schoenmakers R; Otten M; Su D; Lee TC; Carlsson A; Bradley J
Microsc Microanal; 2005 Oct; 11(5):378-400. PubMed ID: 17481320
[TBL] [Abstract][Full Text] [Related]
39. Z dependence of electron scattering by single atoms into annular dark-field detectors.
Treacy MM
Microsc Microanal; 2011 Dec; 17(6):847-58. PubMed ID: 22051035
[TBL] [Abstract][Full Text] [Related]
40. IMAGE-WARP: a real-space restoration method for high-resolution STEM images using quantitative HRTEM analysis.
Recnik A; Möbus G; Sturm S
Ultramicroscopy; 2005 Jul; 103(4):285-301. PubMed ID: 15885433
[TBL] [Abstract][Full Text] [Related]
[Previous] [Next] [New Search]
