These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

207 related articles for article (PubMed ID: 18173643)

  • 1. Observation of the ion-mirror effect during microscopy of insulating materials.
    Croccolo F; Riccardi C
    J Microsc; 2008 Jan; 229(Pt 1):39-43. PubMed ID: 18173643
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging.
    De Winter DA; Schneijdenberg CT; Lebbink MN; Lich B; Verkleij AJ; Drury MR; Humbel BM
    J Microsc; 2009 Mar; 233(3):372-83. PubMed ID: 19250458
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Electron and ion imaging of gland cells using the FIB/SEM system.
    Drobne D; Milani M; Zrimec A; Leser V; Berden Zrimec M
    J Microsc; 2005 Jul; 219(Pt 1):29-35. PubMed ID: 15998363
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Surface damage induced by FIB milling and imaging of biological samples is controllable.
    Drobne D; Milani M; Leser V; Tatti F
    Microsc Res Tech; 2007 Oct; 70(10):895-903. PubMed ID: 17661360
    [TBL] [Abstract][Full Text] [Related]  

  • 5. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics.
    Stevens-Kalceff MA; Levick KJ
    Microsc Res Tech; 2007 Mar; 70(3):195-204. PubMed ID: 17279517
    [TBL] [Abstract][Full Text] [Related]  

  • 6. The use of environmental scanning electron microscopy for imaging wet and insulating materials.
    Donald AM
    Nat Mater; 2003 Aug; 2(8):511-6. PubMed ID: 12894259
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Cross-sectional sample preparation by focused ion beam: a review of ion-sample interaction.
    Ishitani T; Yaguchi T
    Microsc Res Tech; 1996 Nov; 35(4):320-33. PubMed ID: 8987026
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Development of low energy ion beam system for space charge compensation experiments.
    Takeuchi M; Gotoh Y; Tsuji H; Ishikawa J; Sakai S
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 2):02B712. PubMed ID: 18315203
    [TBL] [Abstract][Full Text] [Related]  

  • 9. FIB-SEM cathodoluminescence tomography: practical and theoretical considerations.
    De Winter DA; Lebbink MN; Wiggers De Vries DF; Post JA; Drury MR
    J Microsc; 2011 Sep; 243(3):315-26. PubMed ID: 21692799
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Imaging of intracellular spherical lamellar structures and tissue gross morphology by a focused ion beam/scanning electron microscope (FIB/SEM).
    Drobne D; Milani M; Leser V; Tatti F; Zrimec A; Znidarsic N; Kostanjsek R; Strus J
    Ultramicroscopy; 2008 Jun; 108(7):663-70. PubMed ID: 18068303
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture.
    Schroeder-Reiter E; PĂ©rez-Willard F; Zeile U; Wanner G
    J Struct Biol; 2009 Feb; 165(2):97-106. PubMed ID: 19059341
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Model simulations of continuous ion injection into electron-beam ion source trap with slanted electrostatic mirror.
    Pikin A; Kponou A; Alessi JG; Beebe EN; Prelec K; Raparia D
    Rev Sci Instrum; 2008 Feb; 79(2 Pt 2):02B908. PubMed ID: 18315223
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Effective removal of Ga residue from focused ion beam using a plasma cleaner.
    Ko DS; Park YM; Kim SD; Kim YW
    Ultramicroscopy; 2007; 107(4-5):368-73. PubMed ID: 17088021
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Characterization of the charging effect in a ZrO2 sintered body by Ga ion beam irradiation.
    Kim KH; Kim JJ; Suzuki T; Shindo D
    J Electron Microsc (Tokyo); 2008 Apr; 57(2):53-7. PubMed ID: 18322297
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Uncoated observation and etching of non-conductive materials by ion beam bombardment in scanning electron microscopy.
    Kanaya K; Muranaka Y; Fujita H
    Scan Electron Microsc; 1982; (Pt 4):1379-94. PubMed ID: 7184137
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Imaging thin films of nanoporous low-k dielectrics: comparison between ultramicrotomy and focused ion beam preparations for transmission electron microscopy.
    Thompson LE; Rice PM; Delenia E; Lee VY; Brock PJ; Magbitang TP; Dubois G; Volksen W; Miller RD; Kim HC
    Microsc Microanal; 2006 Apr; 12(2):156-9. PubMed ID: 17481352
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Comparison of different preparation methods of biological samples for FIB milling and SEM investigation.
    Leser V; Drobne D; Pipan Z; Milani M; Tatti F
    J Microsc; 2009 Feb; 233(2):309-19. PubMed ID: 19220697
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Space charge characteristics of an insulating thin film negatively charged by a low-energy electron beam.
    Zhang HB; Li WQ; Cao M
    J Electron Microsc (Tokyo); 2012 Apr; 61(2):85-97. PubMed ID: 22215798
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Quantitative HRTEM analysis of FIB prepared specimens.
    Baram M; Kaplan WD
    J Microsc; 2008 Dec; 232(3):395-405. PubMed ID: 19094016
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Simulation study on image contrast and spatial resolution in helium ion microscope.
    Inai K; Ohya K; Ishitani T
    J Electron Microsc (Tokyo); 2007 Oct; 56(5):163-9. PubMed ID: 17989086
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 11.