These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

190 related articles for article (PubMed ID: 18173643)

  • 21. Focussed ion beam milling at grazing incidence angles.
    Hazekamp J; Doherty S; Elsaesser A; Barnes CA; O'Hagan BM; McKerr G; Howard CV
    J Microsc; 2011 Apr; 242(1):104-10. PubMed ID: 21126247
    [TBL] [Abstract][Full Text] [Related]  

  • 22. Redesign of the scanning electron microscope for parallel energy spectral acquisition.
    Khursheed A; Hoang HQ
    Ultramicroscopy; 2008 Jan; 108(2):151-7. PubMed ID: 17499926
    [TBL] [Abstract][Full Text] [Related]  

  • 23. Beam voltage effects in the study of embedded biological materials by secondary electron detectors.
    Scala C; Pasquinelli G; Preda P; Laschi R
    Scan Electron Microsc; 1986; (Pt 3):987-98. PubMed ID: 3541162
    [TBL] [Abstract][Full Text] [Related]  

  • 24. Fast three-dimensional nanoscale metrology in dual-beam FIB-SEM instrumentation.
    Repetto L; Buzio R; Denurchis C; Firpo G; Piano E; Valbusa U
    Ultramicroscopy; 2009 Oct; 109(11):1338-42. PubMed ID: 19608346
    [TBL] [Abstract][Full Text] [Related]  

  • 25. The nanofabrication of polydimethylsiloxane using a focused ion beam.
    Guan L; Peng K; Yang Y; Qiu X; Wang C
    Nanotechnology; 2009 Apr; 20(14):145301. PubMed ID: 19420520
    [TBL] [Abstract][Full Text] [Related]  

  • 26. Simulation of ion imaging: sputtering, contrast, noise.
    Castaldo V; Hagen CW; Kruit P
    Ultramicroscopy; 2011 Jul; 111(8):982-94. PubMed ID: 21740861
    [TBL] [Abstract][Full Text] [Related]  

  • 27. Charge compensation by in-situ heating for insulating ceramics in scanning electron microscope.
    Wang L; Ji Y; Wei B; Zhang Y; Fu J; Xu X; Han X
    Ultramicroscopy; 2009 Oct; 109(11):1326-32. PubMed ID: 19577845
    [TBL] [Abstract][Full Text] [Related]  

  • 28. A systematic investigation of the charging effect in scanning electron microscopy for metal nanostructures on insulating substrates.
    Flatabø R; Coste A; Greve MM
    J Microsc; 2017 Mar; 265(3):287-297. PubMed ID: 27911467
    [TBL] [Abstract][Full Text] [Related]  

  • 29. Technique for preparation and characterization in cross-section of oral titanium implant surfaces using focused ion beam and transmission electron microscopy.
    Jarmar T; Palmquist A; Brånemark R; Hermansson L; Engqvist H; Thomsen P
    J Biomed Mater Res A; 2008 Dec; 87(4):1003-9. PubMed ID: 18257067
    [TBL] [Abstract][Full Text] [Related]  

  • 30. The effect of beam diameter on the electron skirt in a high pressure scanning electron microscope.
    Belkorissat R; Kadoun A; Khelifa B; Mathieu C
    Micron; 2004; 35(7):543-7. PubMed ID: 15219900
    [TBL] [Abstract][Full Text] [Related]  

  • 31. The surface potential of insulating thin films negatively charged by a low-energy focused electron beam.
    Li WQ; Zhang HB
    Micron; 2010 Jul; 41(5):416-22. PubMed ID: 20299230
    [TBL] [Abstract][Full Text] [Related]  

  • 32. High-quality sample preparation by low kV FIB thinning for analytical TEM measurements.
    Bals S; Tirry W; Geurts R; Yang Z; Schryvers D
    Microsc Microanal; 2007 Apr; 13(2):80-6. PubMed ID: 17367547
    [TBL] [Abstract][Full Text] [Related]  

  • 33. Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth ore.
    Brodusch N; Waters K; Demers H; Gauvin R
    Microsc Res Tech; 2014 Mar; 77(3):225-35. PubMed ID: 24390705
    [TBL] [Abstract][Full Text] [Related]  

  • 34. Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction.
    Alexandre L; Rousseau K; Alfonso C; Saikaly W; Fares L; Grosjean C; Charaï A
    Micron; 2008; 39(3):294-301. PubMed ID: 17346978
    [TBL] [Abstract][Full Text] [Related]  

  • 35. Transient of scanning electron microscopic images for a buried microstructure in insulators.
    Zhang HB; Li DY; Li WQ
    Rev Sci Instrum; 2007 Dec; 78(12):126105. PubMed ID: 18163754
    [TBL] [Abstract][Full Text] [Related]  

  • 36. Charge and charging compensation on oxides and hydroxides in oxygen environmental SEM.
    Ji Y; Guo HS; Zhong TX; Zhang H; Quan XL; Zhang YQ; Xu XD
    Ultramicroscopy; 2005 Jun; 103(3):191-8. PubMed ID: 15850706
    [TBL] [Abstract][Full Text] [Related]  

  • 37. Absolute calibration of an electron spectrometer using high energy electrons produced by the laser-plasma interaction.
    Masuda S; Miura E; Koyama K; Kato S
    Rev Sci Instrum; 2008 Aug; 79(8):083301. PubMed ID: 19044340
    [TBL] [Abstract][Full Text] [Related]  

  • 38. A high contrast method of unstained biological samples under a thin carbon film by scanning electron microscopy.
    Ogura T
    Biochem Biophys Res Commun; 2008 Dec; 377(1):79-84. PubMed ID: 18834858
    [TBL] [Abstract][Full Text] [Related]  

  • 39. The injected-charge contrast mechanism in scanned imaging of doped semiconductors by very slow electrons.
    Frank L; Müllerová I
    Ultramicroscopy; 2005 Dec; 106(1):28-36. PubMed ID: 16054756
    [TBL] [Abstract][Full Text] [Related]  

  • 40. An angled nano-tunnel fabricated on poly(methyl methacrylate) by a focused ion beam.
    Her EK; Chung HS; Moon MW; Oh KH
    Nanotechnology; 2009 Jul; 20(28):285301. PubMed ID: 19546496
    [TBL] [Abstract][Full Text] [Related]  

    [Previous]   [Next]    [New Search]
    of 10.