These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.
185 related articles for article (PubMed ID: 18188213)
1. Scanning moiré and phase shifting with time delay and integration imaging. Sajan MR; Tay CJ; Shang HM; Asundi A Opt Lett; 1997 Sep; 22(17):1281-3. PubMed ID: 18188213 [TBL] [Abstract][Full Text] [Related]
2. Profiling of objects with height steps by wavelet analysis of shadow moiré fringes. Quan C; Fu Y; Tay CJ; Tan JM Appl Opt; 2005 Jun; 44(16):3284-90. PubMed ID: 15943265 [TBL] [Abstract][Full Text] [Related]
3. Wide-view and accurate deformation measurement at microscales by phase extraction of scanning moiré pattern with a spatial phase-shifting technique. Wang Q; Ri S; Xia P Appl Opt; 2021 Feb; 60(6):1637-1645. PubMed ID: 33690500 [TBL] [Abstract][Full Text] [Related]
4. High precision computer-generated moiré profilometry. Li C; Cao Y; Wang L; Wan Y; Fu G; Wang Y; Chen C Sci Rep; 2019 May; 9(1):7804. PubMed ID: 31127160 [TBL] [Abstract][Full Text] [Related]
5. Scanning moiré method and automatic measurement of 3-D shapes. Idesawa M; Yatagai T; Soma T Appl Opt; 1977 Aug; 16(8):2152-62. PubMed ID: 20168889 [TBL] [Abstract][Full Text] [Related]
6. Intensity-modulated moiré topography. Lu C; Inokuchi S Appl Opt; 1999 Jul; 38(19):4019-29. PubMed ID: 18323878 [TBL] [Abstract][Full Text] [Related]
7. 2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysis. Pofelski A; Woo SY; Le BH; Liu X; Zhao S; Mi Z; Löffler S; Botton GA Ultramicroscopy; 2018 Apr; 187():1-12. PubMed ID: 29413406 [TBL] [Abstract][Full Text] [Related]
8. Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes. Wang Q; Ri S; Tsuda H J Vis Exp; 2017 May; (123):. PubMed ID: 28570517 [TBL] [Abstract][Full Text] [Related]
9. Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopy. Pofelski A; Ghanad-Tavakoli S; Thompson DA; Botton GA Ultramicroscopy; 2020 Feb; 209():112858. PubMed ID: 31884380 [TBL] [Abstract][Full Text] [Related]
11. Theory of Electron Beam Moiré. Read DT; Dally JW J Res Natl Inst Stand Technol; 1996; 101(1):47-67. PubMed ID: 27805092 [TBL] [Abstract][Full Text] [Related]
12. Development of a wafer warpage measurement technique using Moiré-based method. Hsieh HL; Huang YG; Tsai YH; Huang YH Appl Opt; 2016 Jun; 55(16):4370-7. PubMed ID: 27411189 [TBL] [Abstract][Full Text] [Related]
13. Two-wavelength phase-shifting interferometry with a superimposed grating displayed on an electrically addressed spatial light modulator. Bitou Y Appl Opt; 2005 Mar; 44(9):1577-81. PubMed ID: 15813258 [TBL] [Abstract][Full Text] [Related]
14. Color-encoded single-shot computer-generated Moiré profilometry. Zhang H; Cao Y; Li C; Wang L; Li H; Xu C; Wan Y Sci Rep; 2021 May; 11(1):11020. PubMed ID: 34040120 [TBL] [Abstract][Full Text] [Related]
16. Computer-generated Moiré profilometry. Li C; Cao Y; Chen C; Wan Y; Fu G; Wang Y Opt Express; 2017 Oct; 25(22):26815-26824. PubMed ID: 29092166 [TBL] [Abstract][Full Text] [Related]
17. Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy. Pofelski A; Bicket I; Botton GA Ultramicroscopy; 2022 Mar; 233():113426. PubMed ID: 34847447 [TBL] [Abstract][Full Text] [Related]
18. Representation of image distortion by Moiré fringes at phase singularity state. Samavati K; Taghi Tavassoly M; Ghomi H Appl Opt; 2017 Jan; 56(2):324-329. PubMed ID: 28085870 [TBL] [Abstract][Full Text] [Related]
19. Computer-generated moiré profilometry based on fringe-superposition. Li C; Cao Y; Wang L; Wan Y; Li H; Xu C; Zhang H Sci Rep; 2020 Oct; 10(1):17202. PubMed ID: 33057102 [TBL] [Abstract][Full Text] [Related]
20. Measurements of the small tilt-angle variation of an object surface using moire interferometry and digital image processing. Nakano Y Appl Opt; 1987 Sep; 26(18):3911-4. PubMed ID: 20490162 [TBL] [Abstract][Full Text] [Related] [Next] [New Search]