These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

127 related articles for article (PubMed ID: 18239713)

  • 1. Modified channeled spectrum for fast measurement of thin films.
    Dyankov G
    Appl Opt; 2008 Feb; 47(4):536-40. PubMed ID: 18239713
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Correlation between optical path modulations and transmittance spectra of a-Si:H thin films.
    Akaoğlu B; Atílgan S; Katírcíoğlu B
    Appl Opt; 2000 Apr; 39(10):1611-6. PubMed ID: 18345059
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Optical characterization of dielectric and semiconductor thin films by use of transmission data.
    Cisneros JI
    Appl Opt; 1998 Aug; 37(22):5262-70. PubMed ID: 18286005
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Measurement of the thickness and refractive index of a thin film by analyzing reflected interference fringes.
    Kim DW; Kwon M; Park S; Kim BJ; Cha M
    Appl Opt; 2023 Oct; 62(30):8018-8024. PubMed ID: 38038096
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Treasure of the Past VII: Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry.
    McCrackin FL; Passaglia E; Stromberg RR; Steinberg HL
    J Res Natl Inst Stand Technol; 2001; 106(3):589-603. PubMed ID: 27500037
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Determination of the fundamental absorption and optical bandgap of dielectric thin films from single optical transmittance measurements.
    Tejada A; Montañez L; Torres C; Llontop P; Flores L; De Zela F; Winnacker A; Guerra JA
    Appl Opt; 2019 Dec; 58(35):9585-9594. PubMed ID: 31873557
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Simultaneous film thickness and refractive index measurement using a constrained fitting method in a white light spectral interferometer.
    Yuan L; Guo T; Tang D; Liu H; Guo X
    Opt Express; 2022 Jan; 30(1):349-363. PubMed ID: 35201213
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry.
    McCrackin FL; Passaglia E; Stromberg RR; Steinberg HL
    J Res Natl Bur Stand A Phys Chem; 1963; 67A(4):363-377. PubMed ID: 31580576
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Accurate computation of the Briot-Sellmeier and Briot-Cauchy chromatic dispersion coefficients from the transmittance spectrum of thin films of arbitrary absorptance.
    Gauvin S
    J Opt Soc Am A Opt Image Sci Vis; 2002 Aug; 19(8):1712-20. PubMed ID: 12152713
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Measuring the refractive index and thickness of thin transparent films: method.
    Daneu V; Sanchez A
    Appl Opt; 1974 Jan; 13(1):122-8. PubMed ID: 20125932
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Determination of refractive index and film thickness from interference fringes.
    Harrick NJ
    Appl Opt; 1971 Oct; 10(10):2344-9. PubMed ID: 20111327
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Measurement of thickness of thin film by fitting to the intensity profile of Fresnel diffraction from a nanophase step.
    Motazedifard A; Dehbod S; Salehpour A
    J Opt Soc Am A Opt Image Sci Vis; 2018 Dec; 35(12):2010-2019. PubMed ID: 30645290
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Determination of layer thickness and optical constants of thin films by using a modified pattern search method.
    Miloua R; Kebbab Z; Chiker F; Sahraoui K; Khadraoui M; Benramdane N
    Opt Lett; 2012 Feb; 37(4):449-51. PubMed ID: 22344069
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Optical analysis of absorbing thin films: application to ternary chalcopyrite semiconductors.
    Hernández-Rojas JL; Lucĺa ML; Mátil I; González-Díaz G; Santamaría J; Sánchez-Quesada F
    Appl Opt; 1992 Apr; 31(10):1606-11. PubMed ID: 20720795
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement.
    Lunácek J; Hlubina P; Lunácková M
    Appl Opt; 2009 Feb; 48(5):985-9. PubMed ID: 19209215
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Determination of thickness, refractive index, and thickness irregularity for semiconductor thin films from transmission spectra.
    Aqili AK; Maqsood A
    Appl Opt; 2002 Jan; 41(1):218-24. PubMed ID: 11902146
    [TBL] [Abstract][Full Text] [Related]  

  • 17. [Study of in-situ measurement system for porous alumina film based on AFM and reflectometric interference spectroscopy].
    Liu C; Zhang DX; Zhang HJ
    Guang Pu Xue Yu Guang Pu Fen Xi; 2008 Jul; 28(7):1679-83. PubMed ID: 18844188
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Application of Fresnel diffraction from a phase step to the measurement of film thickness.
    Taghi Tavassoly M; Moaddel Haghighi I; Hassani K
    Appl Opt; 2009 Oct; 48(29):5497-501. PubMed ID: 19823232
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry.
    Ghim YS; Kim SW
    Opt Express; 2006 Nov; 14(24):11885-91. PubMed ID: 19529611
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Measurement of the refractive index and thickness for infrared optical films deposited on rough substrates.
    Saito M; Nakamura S; Miyagi M
    Appl Opt; 1992 Oct; 31(28):6139-44. PubMed ID: 20733820
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 7.