These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

142 related articles for article (PubMed ID: 18259489)

  • 1. Ellipsometric study of thermally evaporated germanium thin film.
    Rafla-Yuan H; Rancourt JD; Cumbo MJ
    Appl Opt; 1997 Sep; 36(25):6360-3. PubMed ID: 18259489
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Atomic vapor deposition approach to In2O3 thin films.
    Hellwig M; Parala H; Cybinksa J; Barreca D; Gasparotto A; Niermann B; Becker HW; Rogalla D; Feydt J; Irsen S; Mudring AV; Winter J; Fischer RA; Devi A
    J Nanosci Nanotechnol; 2011 Sep; 11(9):8094-100. PubMed ID: 22097536
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Characterisation of nickel silicide thin films by spectroscopy and microscopy techniques.
    Bhaskaran M; Sriram S; Holland AS; Evans PJ
    Micron; 2009 Jan; 40(1):99-103. PubMed ID: 18276146
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometry.
    Lehmann D; Seidel F; Zahn DR
    Springerplus; 2014; 3():82. PubMed ID: 24570853
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Determination of optical constants including surface characteristics of optically thick nanostructured Ti films: analyzed by spectroscopic ellipsometry.
    Jaiswal J; Mourya S; Malik G; Chauhan S; Sanger A; Daipuriya R; Singh M; Chandra R
    Appl Opt; 2016 Oct; 55(29):8368-8375. PubMed ID: 27828089
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Ge wetting layer increases ohmic plasmon losses in Ag film due to segregation.
    Wróbel P; Stefaniuk T; Trzcinski M; Wronkowska AA; Wronkowski A; Szoplik T
    ACS Appl Mater Interfaces; 2015 May; 7(17):8999-9005. PubMed ID: 25871505
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Comparison of Structural, Electrical and Thermoelectric Properties of Vacuum Evaporated SnTe Films of Varied Thickness.
    Tanwar P; Panwar AK; Singh S; Srivastava AK
    J Nanosci Nanotechnol; 2020 Jun; 20(6):3879-3887. PubMed ID: 31748090
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Ellipsometric investigation of rough zinc arsenide epilayers.
    Brink DJ; Engelbrecht JA
    Appl Opt; 2002 Apr; 41(10):1894-8. PubMed ID: 11936787
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Effect of oxygen partial pressure in deposition ambient on the properties of RF magnetron sputter deposited Gd
    Maidul Haque S; De R; Tripathi S; Mukherjee C; Yadav AK; Bhattacharyya D; Jha SN; Sahoo NK
    Appl Opt; 2017 Aug; 56(22):6114-6125. PubMed ID: 29047804
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Relationships among growth mechanism, structure and morphology of PEALD TiO2 films: the influence of O2 plasma power, precursor chemistry and plasma exposure mode.
    Chiappim W; Testoni GE; Doria AC; Pessoa RS; Fraga MA; Galvão NK; Grigorov KG; Vieira L; Maciel HS
    Nanotechnology; 2016 Jul; 27(30):305701. PubMed ID: 27302656
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Crystal phase transition of HfO2 films evaporated by plasma-ion-assisted deposition.
    Wang J; Maier RL; Schreiber H
    Appl Opt; 2008 May; 47(13):C189-92. PubMed ID: 18449245
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Influence of Mg doping on the morphology and optical properties of ZnO films for enhanced H₂ sensing.
    Vijayalakshmi K; Karthick K
    Microsc Res Tech; 2013 Nov; 76(11):1118-24. PubMed ID: 23934625
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Combined atomic force microscopy and spectroscopic ellipsometry applied to the analysis of lipid-protein thin films.
    Finot E; Markey L; Hane F; Amrein M; Leonenko Z
    Colloids Surf B Biointerfaces; 2013 Apr; 104():289-93. PubMed ID: 23334183
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Influence of the Microstructure and Optical Constants on Plasmonic Properties of Copper Nanolayers.
    Rerek T; Derkowska-Zielinska B; Trzcinski M; Szczesny R; Naparty MK; Skowronski L
    Materials (Basel); 2021 Nov; 14(23):. PubMed ID: 34885447
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Spectroscopic ellipsometry of Zn(1-x)Cu(x)O thin films based on a modified sol-gel dip-coating technique.
    Al-Khanbashi HA; Shirbeeny W; Al-Ghamdi AA; Bronstein LM; Mahmoud WE
    Spectrochim Acta A Mol Biomol Spectrosc; 2014 Jan; 118():800-5. PubMed ID: 24157332
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Influence of annealing temperature on Raman and photoluminescence spectra of electron beam evaporated TiO₂ thin films.
    Vishwas M; Narasimha Rao K; Chakradhar RP
    Spectrochim Acta A Mol Biomol Spectrosc; 2012 Dec; 99():33-6. PubMed ID: 23041919
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.
    Nečas D; Ohlídal I; Franta D; Ohlídal M; Čudek V; Vodák J
    Appl Opt; 2014 Sep; 53(25):5606-14. PubMed ID: 25321353
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Exploring the Influence of P3HT on PTCA Crystallization and Phase Behavior in Thin Films.
    Kumari P; Hajduk B; Bednarski H; Jarka P; Janeczek H; Łapkowski M
    Nanomaterials (Basel); 2023 Nov; 13(22):. PubMed ID: 37999272
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Ellipsometric and Rutherford Back scattering Spectrometry studies of SiO(X)N(Y) films elaborated by plasma-enhanced chemical vapour deposition technique.
    Mahamdi R; Boulesbaa M; Saci L; Mansour F; Molliet C; Collet M; Temple-Boyer P
    J Nanosci Nanotechnol; 2011 Oct; 11(10):9118-22. PubMed ID: 22400311
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Optical characterization of inhomogeneous thin films with randomly rough boundaries.
    Vohánka J; Ohlídal I; Buršíková V; Klapetek P; Kaur NJ
    Opt Express; 2022 Jan; 30(2):2033-2047. PubMed ID: 35209352
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 8.