These tools will no longer be maintained as of December 31, 2024. Archived website can be found here. PubMed4Hh GitHub repository can be found here. Contact NLM Customer Service if you have questions.


BIOMARKERS

Molecular Biopsy of Human Tumors

- a resource for Precision Medicine *

93 related articles for article (PubMed ID: 18268702)

  • 1. Numerical algorithm for spectroscopic ellipsometry of thick transparent films.
    Bosch S; Pérez J; Canillas A
    Appl Opt; 1998 Mar; 37(7):1177-9. PubMed ID: 18268702
    [TBL] [Abstract][Full Text] [Related]  

  • 2. Determination of refractive index and thickness of thick transparent films by variable-angle spectroscopic ellipsometry: application to benzocyclobutene films.
    Guo S; Gustafsson G; Hagel OJ; Arwin H
    Appl Opt; 1996 Apr; 35(10):1693-9. PubMed ID: 21085291
    [TBL] [Abstract][Full Text] [Related]  

  • 3. Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometry.
    Larivière GP; Frigerio JM; Rivory J; Abelès F
    Appl Opt; 1992 Oct; 31(28):6056-61. PubMed ID: 20733808
    [TBL] [Abstract][Full Text] [Related]  

  • 4. Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry.
    Gustin KM
    Appl Opt; 1987 Sep; 26(18):3796-802. PubMed ID: 20490143
    [TBL] [Abstract][Full Text] [Related]  

  • 5. Determination of the optical constants of an inhomogeneous transparent LaF(3) thin film on a transparent substrate by spectroscopic ellipsometry.
    Chindaudom P; Vedam K
    Opt Lett; 1992 Apr; 17(7):538-40. PubMed ID: 19794551
    [TBL] [Abstract][Full Text] [Related]  

  • 6. Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.
    Jellison GE; Boatner LA; Lowndes DH; McKee RA; Godbole M
    Appl Opt; 1994 Sep; 33(25):6053-8. PubMed ID: 20936019
    [TBL] [Abstract][Full Text] [Related]  

  • 7. Method for determination of the parameters of transparent ultrathin films deposited on transparent substrates under conditions of low optical contrast.
    Kostruba A; Stetsyshyn Y; Vlokh R
    Appl Opt; 2015 Jul; 54(20):6208-16. PubMed ID: 26193395
    [TBL] [Abstract][Full Text] [Related]  

  • 8. Direct numerical inversion method for kinetic ellipsometric data. I. Presentation of the method and numerical evaluation.
    Kouznetsov D; Hofrichter A; Drévillon B
    Appl Opt; 2002 Aug; 41(22):4510-8. PubMed ID: 12153079
    [TBL] [Abstract][Full Text] [Related]  

  • 9. Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials.
    Chindaudom P; Vedam K
    Appl Opt; 1994 May; 33(13):2664-71. PubMed ID: 20885622
    [TBL] [Abstract][Full Text] [Related]  

  • 10. Bayesian inference analysis of ellipsometry data.
    Barradas NP; Keddie JL; Sackin R
    Phys Rev E Stat Phys Plasmas Fluids Relat Interdiscip Topics; 1999 May; 59(5 Pt B):6138-51. PubMed ID: 11969599
    [TBL] [Abstract][Full Text] [Related]  

  • 11. Spectral fitting method for obtaining the refractive index and thickness of chalcogenide films.
    Mao N; Song B; Pan L; Liu X; Lin C; Zhang P; Shen X; Dai S
    Opt Express; 2021 Aug; 29(18):29329-29340. PubMed ID: 34615044
    [TBL] [Abstract][Full Text] [Related]  

  • 12. Determination of refractive index and layer thickness of nm-thin films via ellipsometry.
    Nestler P; Helm CA
    Opt Express; 2017 Oct; 25(22):27077-27085. PubMed ID: 29092189
    [TBL] [Abstract][Full Text] [Related]  

  • 13. Determination of properties of wedged, nonuniformly thick, and absorbing thin films by using a new numerical method.
    Baek J; Kovar D; Keto JW; Becker MF
    Appl Opt; 2006 Mar; 45(7):1627-39. PubMed ID: 16539272
    [TBL] [Abstract][Full Text] [Related]  

  • 14. Complex Refractive Index Spectra of CH3NH3PbI3 Perovskite Thin Films Determined by Spectroscopic Ellipsometry and Spectrophotometry.
    Löper P; Stuckelberger M; Niesen B; Werner J; Filipič M; Moon SJ; Yum JH; Topič M; De Wolf S; Ballif C
    J Phys Chem Lett; 2015 Jan; 6(1):66-71. PubMed ID: 26263093
    [TBL] [Abstract][Full Text] [Related]  

  • 15. Characterization of a multilayer highly reflecting mirror by spectroscopic phase-modulated ellipsometry.
    Bhattacharyya D; Sahoo NK; Thakur S; Das NC
    Appl Opt; 2001 Apr; 40(10):1707-14. PubMed ID: 18357168
    [TBL] [Abstract][Full Text] [Related]  

  • 16. Studies on the Biotin-Avidin Multilayer Adsorption by Spectroscopic Ellipsometry.
    Spaeth K; Brecht A; Gauglitz G
    J Colloid Interface Sci; 1997 Dec; 196(2):128-135. PubMed ID: 9792738
    [TBL] [Abstract][Full Text] [Related]  

  • 17. Ellipsometry on sputter-deposited tin oxide films: optical constants versus stoichiometry, hydrogen content, and amount of electrochemically intercalated lithium.
    Isidorsson J; Granqvist CG; von Rottkay K; Rubin M
    Appl Opt; 1998 Nov; 37(31):7334-41. PubMed ID: 18301567
    [TBL] [Abstract][Full Text] [Related]  

  • 18. Optical functions of (x)GeO2:(1-x)SiO2 films determined by multi-sample and multi-angle spectroscopic ellipsometry.
    Ho C; Pita K; Ngo NQ; Kam CH
    Opt Express; 2005 Feb; 13(3):1049-54. PubMed ID: 19494969
    [TBL] [Abstract][Full Text] [Related]  

  • 19. Determination of Optical Constants of Solgel-Derived Inhomogeneous TiO(2) Thin Films by Spectroscopic Ellipsometry and Transmission Spectroscopy.
    Mosaddeq-Ur-Rahman M; Yu G; Krishna KM; Soga T; Watanabe J; Jimbo T; Umeno M
    Appl Opt; 1998 Feb; 37(4):691-7. PubMed ID: 18268642
    [TBL] [Abstract][Full Text] [Related]  

  • 20. Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range.
    Diao J; Hess DW
    J Phys Chem B; 2005 Jul; 109(26):12819-25. PubMed ID: 16852589
    [TBL] [Abstract][Full Text] [Related]  

    [Next]    [New Search]
    of 5.