146 related articles for article (PubMed ID: 18324116)
1. Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry.
Kim SW; Kim GH
Appl Opt; 1999 Oct; 38(28):5968-73. PubMed ID: 18324116
[TBL] [Abstract][Full Text] [Related]
2. Surface and thickness measurement of a transparent film using wavelength scanning interferometry.
Gao F; Muhamedsalih H; Jiang X
Opt Express; 2012 Sep; 20(19):21450-6. PubMed ID: 23037266
[TBL] [Abstract][Full Text] [Related]
3. Sensitivity analysis of thin-film thickness measurement by vertical scanning white-light interferometry.
Dong JT; Lu RS
Appl Opt; 2012 Aug; 51(23):5668-75. PubMed ID: 22885580
[TBL] [Abstract][Full Text] [Related]
4. Methods To Determine the Silicone Oil Layer Thickness in Sprayed-On Siliconized Syringes.
Loosli V; Germershaus O; Steinberg H; Dreher S; Grauschopf U; Funke S
PDA J Pharm Sci Technol; 2018; 72(3):278-297. PubMed ID: 29343617
[TBL] [Abstract][Full Text] [Related]
5. Simultaneous film thickness and refractive index measurement using a constrained fitting method in a white light spectral interferometer.
Yuan L; Guo T; Tang D; Liu H; Guo X
Opt Express; 2022 Jan; 30(1):349-363. PubMed ID: 35201213
[TBL] [Abstract][Full Text] [Related]
6. Spectrally resolved phase-shifting interferometry of transparent thin films: sensitivity of thickness measurements.
Debnath SK; Kothiyal MP; Schmit J; Hariharan P
Appl Opt; 2006 Dec; 45(34):8636-40. PubMed ID: 17119559
[TBL] [Abstract][Full Text] [Related]
7. Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film.
Hlubina P; Ciprian D; Lunácek J; Lesnák M
Opt Express; 2006 Aug; 14(17):7678-85. PubMed ID: 19529136
[TBL] [Abstract][Full Text] [Related]
8. Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry.
Ghim YS; Kim SW
Opt Express; 2006 Nov; 14(24):11885-91. PubMed ID: 19529611
[TBL] [Abstract][Full Text] [Related]
9. Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer.
Guo T; Chen Z; Li M; Wu J; Fu X; Hu X
Appl Opt; 2018 Apr; 57(12):2955-2961. PubMed ID: 29714327
[TBL] [Abstract][Full Text] [Related]
10. Application of white-light scanning interferometer on transparent thin-film measurement.
Li MC; Wan DS; Lee CC
Appl Opt; 2012 Dec; 51(36):8579-86. PubMed ID: 23262597
[TBL] [Abstract][Full Text] [Related]
11. Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopy.
Xie Z; Tang Y; Zhou Y; Deng Q
Opt Express; 2018 Feb; 26(3):2944-2953. PubMed ID: 29401827
[TBL] [Abstract][Full Text] [Related]
12. Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunablefilter.
Kim D; Kim S; Kong HJ; Lee Y
Opt Lett; 2002 Nov; 27(21):1893-5. PubMed ID: 18033393
[TBL] [Abstract][Full Text] [Related]
13. Thickness of the pre- and post-contact lens tear film measured in vivo by interferometry.
Nichols JJ; King-Smith PE
Invest Ophthalmol Vis Sci; 2003 Jan; 44(1):68-77. PubMed ID: 12506057
[TBL] [Abstract][Full Text] [Related]
14. Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structure.
Ghim YS; Kim SW
Appl Opt; 2009 Feb; 48(4):799-803. PubMed ID: 19183611
[TBL] [Abstract][Full Text] [Related]
15. Scanning white-light interferometer for measurement of the thickness of a transparent oil film on water.
Sun C; Yu L; Sun Y; Yu Q
Appl Opt; 2005 Sep; 44(25):5202-5. PubMed ID: 16149343
[TBL] [Abstract][Full Text] [Related]
16. Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry.
Kitagawa K
Opt Lett; 2014 Jul; 39(14):4172-5. PubMed ID: 25121679
[TBL] [Abstract][Full Text] [Related]
17. Measurement of thickness and profile of a transparent material using fluorescent stereo microscopy.
Hu Z; Xu T; Luo H; Gan RZ; Lu H
Opt Express; 2016 Dec; 24(26):29822-29829. PubMed ID: 28059368
[TBL] [Abstract][Full Text] [Related]
18. The thickness of the human precorneal tear film: evidence from reflection spectra.
King-Smith PE; Fink BA; Fogt N; Nichols KK; Hill RM; Wilson GS
Invest Ophthalmol Vis Sci; 2000 Oct; 41(11):3348-59. PubMed ID: 11006224
[TBL] [Abstract][Full Text] [Related]
19. In situ measurements of thin films in bovine serum lubricated contacts using optical interferometry.
Vrbka M; Křupka I; Hartl M; Návrat T; Gallo J; Galandáková A
Proc Inst Mech Eng H; 2014 Feb; 228(2):149-58. PubMed ID: 24398447
[TBL] [Abstract][Full Text] [Related]
20. White light scanning interferometry adapted for large-area optical analysis of thick and rough hydroxyapatite layers.
Pecheva E; Montgomery P; Montaner D; Pramatarova L
Langmuir; 2007 Mar; 23(7):3912-8. PubMed ID: 17295521
[TBL] [Abstract][Full Text] [Related]
[Next] [New Search]